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Babak Jamshidi, Ph.D. - Publications

Affiliations: 
2008 University of California, Berkeley, Berkeley, CA, United States 
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7 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2011 Senesky DG, Jamshidi B. MEMS strain sensors for intelligent structural systems Lecture Notes in Electrical Engineering. 96: 63-74. DOI: 10.1007/978-3-642-21099-0_4  0.568
2009 Myers DR, Cheng KB, Jamshidi B, Azevedo RG, Senesky DG, Chen L, Mehregany M, Wijesundara MBJ, Pisano AP. Silicon carbide resonant tuning fork for microsensing applications in high-temperature and high G-shock environments Journal of Micro/Nanolithography, Mems, and Moems. 8. DOI: 10.1117/1.3143192  0.704
2009 Senesky DG, Jamshidi B, Cheng KB, Pisano AP. Harsh Environment Silicon Carbide Sensors for Health and Performance Monitoring of Aerospace Systems: A Review Ieee Sensors Journal. 9: 1472-1478. DOI: 10.1109/Jsen.2009.2026996  0.595
2008 Jamshidi B, Azevedo RG, Jog AV, Pisano AP. Enhanced cross-axis rejection capacitive strain gauge Asme International Mechanical Engineering Congress and Exposition, Proceedings. 11: 535-540. DOI: 10.1115/IMECE2007-43168  0.715
2007 Azevedo RG, Jones DG, Jog AV, Jamshidi B, Myers DR, Chen L, Fu XA, Mehregany M, Wijesundara MBJ, Pisano AP. A SiC MEMS resonant strain sensor for harsh environment applications Ieee Sensors Journal. 7: 568-576. DOI: 10.1109/Jsen.2007.891997  0.707
2007 Jamshidi B, Azevedo RG, Wijesundara MBJ, Pisano AP. Corrosion enhanced capacitive strain gauge at 370°C Proceedings of Ieee Sensors. 804-807. DOI: 10.1109/ICSENS.2007.4388522  0.739
2007 Azevedo RG, Zhang J, Jones DG, Myers DR, Jog AV, Jamshidi B, Wijesundara MBJ, Maboudian R, Pisano AP. Silicon carbide coated mems strain sensor for harsh environment applications Proceedings of the Ieee International Conference On Micro Electro Mechanical Systems (Mems). 643-646.  0.724
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