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Robert D. Geil, Ph.D. - Publications

Affiliations: 
2005 Vanderbilt University, Nashville, TN 
Area:
Chemical Engineering, Materials Science Engineering
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10 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2013 Rinnerbauer V, Ndao S, Yeng YX, Senkevich JJ, Jensen KF, Joannopoulos JD, Solja?i? M, Celanovic I, Geil RD. Large-area fabrication of high aspect ratio tantalum photonic crystals for high-temperature selective emitters Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics. 31. DOI: 10.1116/1.4771901  0.314
2013 Stelmakh V, Rinnerbauer V, Geil RD, Aimone PR, Senkevich JJ, Joannopoulos JD, Solja?i? M, Celanovic I. High-temperature tantalum tungsten alloy photonic crystals: Stability, optical properties, and fabrication Applied Physics Letters. 103. DOI: 10.1063/1.4821586  0.34
2010 Koktysh DS, McBride JR, Geil RD, Schmidt BW, Rogers BR, Rosenthal SJ. Facile route to SnS nanocrystals and their characterization Materials Science and Engineering B: Solid-State Materials For Advanced Technology. 170: 117-122. DOI: 10.1016/J.Mseb.2010.03.035  0.602
2009 Geil RD, Senkevich JJ, Rogers BR. Method for measuring solvent permeation through polymer film on porous dielectric films Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 27: 1825-1828. DOI: 10.1116/1.3154515  0.642
2007 Geil RD, Senkevich JJ, Rogers BR. Penetration of Tagged Organics into Caulked and Un-caulked Porous Dielectrics Measured by Rutherford Backscattering Mrs Proceedings. 990. DOI: 10.1557/Proc-0990-B03-02  0.6
2007 Geil RD, Mendenhall M, Weller RA, Rogers BR. Effects of multiple scattering and surface roughness on medium energy backscattering spectra Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms. 256: 631-637. DOI: 10.1016/J.Nimb.2006.11.120  0.608
2006 Rogers BR, Song Z, Geil RD, Weller RA. Optimization of UHV-CVD Thin Films for Gate Dielectric Applications Advances in Science and Technology. 45: 1351-1354. DOI: 10.4028/Www.Scientific.Net/Ast.45.1351  0.633
2006 Geil RD, Rogers BR, Weller RA, Hilton JL. Evaluation of depth resolution with time-of-flight medium energy backscattering Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms. 243: 377-384. DOI: 10.1016/J.Nimb.2005.08.184  0.589
2006 Senkevich JJ, Woods BW, Carrow BP, Geil RD, Rogers BR. Amorphous highly conjugated chemical-vapor-deposited polymer thin films Chemical Vapor Deposition. 12: 285-289. DOI: 10.1002/Cvde.200506454  0.613
2004 Geil RD, Rogers BR, Song Z, Weller RA. Interfacial analysis using time-of-flight medium energy backscattering Journal of Vacuum Science and Technology. 22: 1129-1133. DOI: 10.1116/1.1738652  0.635
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