| Year |
Citation |
Score |
| 2023 |
Jayswal NK, Adhikari D, Subedi I, Shan A, Podraza NJ. Role of CdTe Interface Structure on CdS/CdTe Photovoltaic Device Performance. Materials (Basel, Switzerland). 16. PMID 37895793 DOI: 10.3390/ma16206812 |
0.738 |
|
| 2022 |
Subedi B, Li C, Chen C, Liu D, Junda MM, Song Z, Yan Y, Podraza NJ. Urbach Energy and Open-Circuit Voltage Deficit for Mixed Anion-Cation Perovskite Solar Cells. Acs Applied Materials & Interfaces. 14: 7796-7804. PMID 35129320 DOI: 10.1021/acsami.1c19122 |
0.305 |
|
| 2021 |
Shan A, Ramanujam B, Podraza NJ, Collins RW. Analysis of non-idealities in rhomb compensators. Optics Express. 29: 36328-36352. PMID 34809046 DOI: 10.1364/OE.440680 |
0.608 |
|
| 2021 |
Alaani MAR, Koirala P, Phillips AB, Liyanage GK, Awni RA, Sapkota DR, Ramanujam B, Heben MJ, O'Leary SK, Podraza NJ, Collins RW. Optical Properties of Magnesium-Zinc Oxide for Thin Film Photovoltaics. Materials (Basel, Switzerland). 14. PMID 34640041 DOI: 10.3390/ma14195649 |
0.71 |
|
| 2021 |
Tumusange MS, Subedi B, Chen C, Junda MM, Song Z, Yan Y, Podraza NJ. Impact of Humidity and Temperature on the Stability of the Optical Properties and Structure of MAPbI, MAFAPbI and (FAPbI)(MAPbBr) Perovskite Thin Films. Materials (Basel, Switzerland). 14. PMID 34300973 DOI: 10.3390/ma14144054 |
0.38 |
|
| 2021 |
Subedi B, Song Z, Chen C, Li C, Ghimire K, Junda MM, Subedi I, Yan Y, Podraza NJ. Optical and Electronic Losses Arising from Physically Mixed Interfacial Layers in Perovskite Solar Cells. Acs Applied Materials & Interfaces. PMID 33470116 DOI: 10.1021/acsami.0c16364 |
0.755 |
|
| 2020 |
Rajan G, Karki S, Collins RW, Podraza NJ, Marsillac S. Real-Time Optimization of Anti-Reflective Coatings for CIGS Solar Cells. Materials (Basel, Switzerland). 13. PMID 32987795 DOI: 10.3390/ma13194259 |
0.638 |
|
| 2020 |
Subedi B, Li C, Junda MM, Song Z, Yan Y, Podraza NJ. Effects of intrinsic and atmospherically induced defects in narrow bandgap (FASnI)(MAPbI) perovskite films and solar cells. The Journal of Chemical Physics. 152: 064705. PMID 32061228 DOI: 10.1063/1.5126867 |
0.492 |
|
| 2020 |
Smith BH, Xie R, Lee W, Adhikari D, Podraza NJ, Gomez ED. Characterization of chain alignment at buried interfaces using Mueller matrix spectroscopy Mrs Communications. 10: 292-297. DOI: 10.1557/Mrc.2020.19 |
0.411 |
|
| 2020 |
Adhikari D, Junda MM, Bastola E, Koirala P, Ellingson RJ, Collins RW, Podraza NJ. Glancing angle deposited CdTe: Nanostructured films and impact on solar cell performance Surface & Coatings Technology. 381: 125127. DOI: 10.1016/J.Surfcoat.2019.125127 |
0.486 |
|
| 2020 |
Subedi KK, Bastola E, Subedi I, Bista SS, Rijal S, Jamarkattel MK, Awni RA, Philips AB, Yan Y, Heben MJ, Podraza NJ, Ellingson RJ. Semi-transparent p-type barium copper sulfide as a back contact interface layer for cadmium telluride solar cells Solar Energy Materials and Solar Cells. 218: 110764. DOI: 10.1016/J.Solmat.2020.110764 |
0.795 |
|
| 2020 |
Subedi I, Silverman TJ, Deceglie MG, Podraza NJ. PERC silicon PV infrared to ultraviolet optical model Solar Energy Materials and Solar Cells. 215: 110655. DOI: 10.1016/J.Solmat.2020.110655 |
0.768 |
|
| 2020 |
Chae I, Ngo D, Chen Z, Kwansa AL, Chen X, Meddeb AB, Podraza NJ, Yingling YG, Ounaies Z, Kim SH. Anisotropic Optical and Frictional Properties of Langmuir–Blodgett Film Consisting of Uniaxially‐Aligned Rod‐Shaped Cellulose Nanocrystals Advanced Materials Interfaces. 7: 1902169. DOI: 10.1002/Admi.201902169 |
0.471 |
|
| 2019 |
Uprety P, Subedi I, Junda MM, Collins RW, Podraza NJ. Photogenerated Carrier Transport Properties in Silicon Photovoltaics. Scientific Reports. 9: 19015. PMID 31831793 DOI: 10.1038/S41598-019-55173-Z |
0.779 |
|
| 2019 |
Adhikari D, Junda MM, Grice CR, Marsillac SX, Collins RW, Podraza NJ. Nanocrystalline Hydrogenated Silicon Solar Cells with RF-Magnetron Sputtered Absorbers. Materials (Basel, Switzerland). 12. PMID 31130599 DOI: 10.3390/Ma12101699 |
0.693 |
|
| 2019 |
Subedi I, Silverman TJ, Deceglie MG, Podraza NJ. Emissivity of solar cell cover glass calculated from infrared reflectance measurements Solar Energy Materials and Solar Cells. 190: 98-102. DOI: 10.1016/J.Solmat.2018.09.027 |
0.731 |
|
| 2019 |
Junda MM, Grice CR, Yan Y, Podraza NJ. Parametric Optical Property Database for CdSe 1−x S x Alloys Electronic Materials Letters. 15: 500-504. DOI: 10.1007/S13391-019-00144-9 |
0.493 |
|
| 2019 |
Kushner DI, Kusoglu A, Podraza NJ, Hickner MA. Substrate‐Dependent Molecular and Nanostructural Orientation of Nafion Thin Films Advanced Functional Materials. 29: 1902699. DOI: 10.1002/Adfm.201902699 |
0.406 |
|
| 2018 |
Pradhan P, Aryal P, Attygalle D, Ibdah AR, Koirala P, Li J, Bhandari KP, Liyanage GK, Ellingson RJ, Heben MJ, Marsillac S, Collins RW, Podraza NJ. Real Time Spectroscopic Ellipsometry Analysis of First Stage CuIn1-xGaxSe₂ Growth: Indium-Gallium Selenide Co-Evaporation. Materials (Basel, Switzerland). 11. PMID 29337931 DOI: 10.3390/Ma11010145 |
0.732 |
|
| 2018 |
Bastola E, Bhandari KP, Subedi I, Podraza NJ, Ellingson RJ. Structural, optical, and hole transport properties of earth-abundant chalcopyrite (CuFeS2) nanocrystals Mrs Communications. 8: 970-978. DOI: 10.1557/Mrc.2018.117 |
0.745 |
|
| 2018 |
Pogrebnyakov AV, Bossard JA, Turpin JP, Musgraves JD, Shin HJ, Rivero-Baleine C, Podraza N, Richardson KA, Werner DH, Mayer TS. Reconfigurable near-IR metasurface based on Ge2Sb2Te5 phase-change material Optical Materials Express. 8: 2264. DOI: 10.1364/Ome.8.002264 |
0.363 |
|
| 2018 |
Junda MM, Podraza NJ. Optical properties of soda lime float glass from 3 mm to 148 nm (0.41 meV to 8.38 eV) by spectroscopic ellipsometry Surface Science Spectra. 25: 16001. DOI: 10.1116/1.5024390 |
0.423 |
|
| 2018 |
Uprety P, Wang C, Koirala P, Sapkota DR, Ghimire K, Junda MM, Yan Y, Collins RW, Podraza NJ. Optical Hall Effect of PV Device Materials Ieee Journal of Photovoltaics. 8: 1793-1799. DOI: 10.1109/Jphotov.2018.2869540 |
0.452 |
|
| 2018 |
Silverman TJ, Deceglie MG, Subedi I, Podraza NJ, Slauch IM, Ferry VE, Repins I. Reducing Operating Temperature in Photovoltaic Modules Ieee Journal of Photovoltaics. 8: 532-540. DOI: 10.1109/Jphotov.2017.2779842 |
0.737 |
|
| 2018 |
Uprety P, Junda MM, Salmon H, Podraza NJ. Understanding near infrared absorption in tin doped indium oxide thin films Journal of Physics D. 51: 295302. DOI: 10.1088/1361-6463/Aac9E8 |
0.445 |
|
| 2018 |
Zhao D, Chen C, Wang C, Junda MM, Song Z, Grice CR, Yu Y, Li C, Subedi B, Podraza NJ, Zhao X, Fang G, Xiong R, Zhu K, Yan Y. Efficient two-terminal all-perovskite tandem solar cells enabled by high-quality low-bandgap absorber layers Nature Energy. 3: 1093-1100. DOI: 10.1038/S41560-018-0278-X |
0.355 |
|
| 2018 |
Subedi B, Guan L, Yu Y, Ghimire K, Uprety P, Yan Y, Podraza NJ. Formamidinium + cesium lead triiodide perovskites: Discrepancies between thin film optical absorption and solar cell efficiency Solar Energy Materials and Solar Cells. 188: 228-233. DOI: 10.1016/J.Solmat.2018.09.002 |
0.45 |
|
| 2018 |
Subedi KK, Bastola E, Subedi I, Song Z, Bhandari KP, Phillips AB, Podraza NJ, Heben MJ, Ellingson RJ. Nanocomposite (CuS) (ZnS)1 thin film back contact for CdTe solar cells: Toward a bifacial device Solar Energy Materials and Solar Cells. 186: 227-235. DOI: 10.1016/J.Solmat.2018.06.025 |
0.778 |
|
| 2018 |
Uprety P, Macco B, Junda MM, Grice CR, Kessels WMM, Podraza NJ. Optical and electrical properties of H2 plasma-treated ZnO films prepared by atomic layer deposition using supercycles Materials Science in Semiconductor Processing. 84: 91-100. DOI: 10.1016/J.Mssp.2018.05.008 |
0.515 |
|
| 2018 |
Ibdah AA, Koirala P, Aryal P, Pradhan P, Heben MJ, Podraza NJ, Marsillac S, Collins RW. Optical simulation of external quantum efficiency spectra of CuIn1−Ga Se2 solar cells from spectroscopic ellipsometry inputs Journal of Energy Chemistry. 27: 1151-1169. DOI: 10.1016/J.Jechem.2017.10.029 |
0.465 |
|
| 2018 |
Junda MM, Phillips AB, Khanal RR, Heben MJ, Podraza NJ. Determination of conductivity anisotropy and the role of doping in single walled carbon nanotube thin films with THz spectroscopic ellipsometry Carbon. 129: 592-597. DOI: 10.1016/J.Carbon.2017.12.022 |
0.39 |
|
| 2018 |
Junda MM, Gautam LK, Collins RW, Podraza NJ. Optical gradients in a-Si:H thin films detected using real-time spectroscopic ellipsometry with virtual interface analysis Applied Surface Science. 436: 779-784. DOI: 10.1016/J.Apsusc.2017.12.039 |
0.514 |
|
| 2017 |
Uprety P, Junda MM, Podraza NJ. Optical properties of borosilicate glass from 3.1 mm to 210 nm (0.4 meV to 5.89 eV) by spectroscopic ellipsometry Surface Science Spectra. 24: 26003. DOI: 10.1116/1.4997898 |
0.384 |
|
| 2017 |
Adhikari D, Junda MM, Marsillac SX, Collins RW, Podraza NJ. Nanostructure evolution of magnetron sputtered hydrogenated silicon thin films Journal of Applied Physics. 122: 75302. DOI: 10.1063/1.4998455 |
0.467 |
|
| 2017 |
Macco B, Melskens J, Podraza NJ, Arts K, Pugh C, Thomas O, Kessels WMM. Correlating the silicon surface passivation to the nanostructure of low-temperature a-Si:H after rapid thermal annealing Journal of Applied Physics. 122: 35302. DOI: 10.1063/1.4994795 |
0.381 |
|
| 2017 |
Ghimire K, Zhao D, Yan Y, Podraza NJ. Optical response of mixed methylammonium lead iodide and formamidinium tin iodide perovskite thin films Aip Advances. 7: 75108. DOI: 10.1063/1.4994211 |
0.479 |
|
| 2017 |
Uprety P, Junda MM, Ghimire K, Adhikari D, Grice CR, Podraza NJ. Spectroscopic ellipsometry determination of optical and electrical properties of aluminum doped zinc oxide Applied Surface Science. 421: 852-858. DOI: 10.1016/J.Apsusc.2017.01.139 |
0.43 |
|
| 2017 |
Subedi I, Slocum MA, Forbes DV, Hubbard SM, Podraza NJ. Optical properties of InP from infrared to vacuum ultraviolet studied by spectroscopic ellipsometry Applied Surface Science. 421: 813-818. DOI: 10.1016/J.Apsusc.2017.01.027 |
0.78 |
|
| 2017 |
Ibdah A, Koirala P, Aryal P, Pradhan P, Marsillac S, Rockett AA, Podraza NJ, Collins RW. Spectroscopic ellipsometry for analysis of polycrystalline thin-film photovoltaic devices and prediction of external quantum efficiency Applied Surface Science. 421: 601-607. DOI: 10.1016/J.Apsusc.2016.12.236 |
0.447 |
|
| 2017 |
Brakstad T, Hope BR, Nematollahi M, Kildemo M, Podraza NJ, Ghimire K, Reenaas TW. Ellipsometric study of the optical response of ZnS:Cr for PV applications Applied Surface Science. 421: 315-319. DOI: 10.1016/J.Apsusc.2016.10.157 |
0.406 |
|
| 2017 |
Uprety P, Lambright KJ, Grice CR, Junda MM, Giolando DM, Podraza NJ. Morphological and optical properties of low temperature processed SnO2 :F Physica Status Solidi B-Basic Solid State Physics. 254: 1700102. DOI: 10.1002/Pssb.201700102 |
0.467 |
|
| 2017 |
Subedi I, Silverman TJ, Deceglie MG, Podraza NJ. Al+Si Interface Optical Properties Obtained in the Si Solar Cell Configuration Physica Status Solidi (a). 214: 1700480. DOI: 10.1002/Pssa.201700480 |
0.752 |
|
| 2017 |
Itapu S, Georgiev DG, Uprety P, Podraza NJ. Modification of reactively sputtered NiOx thin films by pulsed UV laser irradiation Physica Status Solidi (a). 214: 1600414. DOI: 10.1002/Pssa.201600414 |
0.426 |
|
| 2017 |
Wang C, Xiao C, Yu Y, Zhao D, Awni RA, Grice CR, Ghimire K, Constantinou I, Liao W, Cimaroli AJ, Liu P, Chen J, Podraza NJ, Jiang C, Al-Jassim MM, et al. Understanding and Eliminating Hysteresis for Highly Efficient Planar Perovskite Solar Cells Advanced Energy Materials. 7: 1700414. DOI: 10.1002/Aenm.201700414 |
0.376 |
|
| 2016 |
Karki Gautam L, Junda MM, Haneef HF, Collins RW, Podraza NJ. Spectroscopic Ellipsometry Studies of n-i-p Hydrogenated Amorphous Silicon Based Photovoltaic Devices. Materials (Basel, Switzerland). 9. PMID 28773255 DOI: 10.3390/Ma9030128 |
0.718 |
|
| 2016 |
Liao W, Zhao D, Yu Y, Shrestha N, Ghimire K, Grice CR, Wang C, Xiao Y, Cimaroli A, Ellingson RJ, Podraza N, Zhu K, Xiong RG, Yan Y. Fabrication of Efficient Low-Bandgap Perovskite Solar Cells by Combining Formamidinium Tin Iodide with Methylammo-nium Lead Iodide. Journal of the American Chemical Society. PMID 27622903 DOI: 10.1021/Jacs.6B08337 |
0.347 |
|
| 2016 |
Subedi I, Bhandari KP, Ellingson RJ, Podraza NJ. Near infrared to ultraviolet optical properties of bulk single crystal and nanocrystal thin film iron pyrite. Nanotechnology. 27: 295702. PMID 27285310 DOI: 10.1088/0957-4484/27/29/295702 |
0.788 |
|
| 2016 |
Barnes A, Haneef H, Schlom DG, Podraza NJ. Optical band gap and infrared phonon modes of (La0.29Sr0.71)(Al0.65Ta0.36)O3 (LSAT) single crystal from infrared to ultraviolet range spectroscopic ellipsometry Optical Materials Express. 6: 3210-3216. DOI: 10.1364/Ome.6.003210 |
0.412 |
|
| 2016 |
Gautam LK, Ye L, Podraza NJ. LPCVD SiNx thin film on c-Si wafer by spectroscopic ellipsometry Surface Science Spectra. 23: 51-54. DOI: 10.1116/1.4954192 |
0.451 |
|
| 2016 |
Ghimire K, Zhao D, Cimaroli A, Ke W, Yan Y, Podraza NJ. Optical monitoring of CH3NH3PbI3 thin films upon atmospheric exposure Journal of Physics D: Applied Physics. 49. DOI: 10.1088/0022-3727/49/40/405102 |
0.492 |
|
| 2016 |
Junda MM, Grice CR, Subedi I, Yan Y, Podraza NJ. Effects of oxygen partial pressure, deposition temperature, and annealing on the optical response of CdS:O thin films as studied by spectroscopic ellipsometry Journal of Applied Physics. 120: 015306. DOI: 10.1063/1.4955076 |
0.787 |
|
| 2016 |
Bharadwaja SSN, Rajashekhar A, Ko SW, Qu W, Motyka M, Podraza N, Clark T, Randall CA, Trolier-Mckinstry S. Excimer laser assisted re-oxidation of BaTiO3 thin films on Ni metal foils Journal of Applied Physics. 119. DOI: 10.1063/1.4937996 |
0.785 |
|
| 2016 |
Adhikari D, Junda MM, Uprety P, Ghimire K, Subedi I, Podraza NJ. Near infrared to ultraviolet anisotropic optical properties of single crystal SrLaAlO4
from spectroscopic ellipsometry Physica Status Solidi (B). 253: 2066-2072. DOI: 10.1002/Pssb.201600286 |
0.769 |
|
| 2016 |
Aryal P, Ibdah AR, Pradhan P, Attygalle D, Koirala P, Podraza NJ, Marsillac S, Collins RW, Li J. Parameterized complex dielectric functions of CuIn1−xGaxSe2: applications in optical characterization of compositional non-uniformities and depth profiles in materials and solar cells Progress in Photovoltaics: Research and Applications. 24: 1200-1213. DOI: 10.1002/Pip.2774 |
0.497 |
|
| 2016 |
Koirala P, Li J, Yoon HP, Aryal P, Marsillac S, Rockett AA, Podraza NJ, Collins RW. Through-the-glass spectroscopic ellipsometry for analysis of CdTe thin-film solar cells in the superstrate configuration Progress in Photovoltaics: Research and Applications. DOI: 10.1002/Pip.2759 |
0.447 |
|
| 2016 |
Zhang C, Pfeiffer C, Jang T, Ray V, Junda M, Uprety P, Podraza N, Grbic A, Guo LJ. Breaking Malus’ law: Highly efficient, broadband, and angular robust asymmetric light transmitting metasurface Laser and Photonics Reviews. 10: 791-798. DOI: 10.1002/Lpor.201500328 |
0.305 |
|
| 2015 |
Zhang L, Zhou Y, Guo L, Zhao W, Barnes A, Zhang HT, Eaton C, Zheng Y, Brahlek M, Haneef HF, Podraza NJ, Chan MH, Gopalan V, Rabe KM, Engel-Herbert R. Correlated metals as transparent conductors. Nature Materials. PMID 26657329 DOI: 10.1038/Nmat4493 |
0.322 |
|
| 2015 |
Jin YO, John DS, Podraza NJ, Jackson TN, Horn MW. High temperature coefficient of resistance molybdenum oxide and nickel oxide thin films for microbolometer applications Optical Engineering. 54. DOI: 10.1117/1.Oe.54.3.037101 |
0.659 |
|
| 2015 |
Ghimire K, Cimaroli A, Feng H, Shi T, Podraza N, Yan Y. Spectroscopic ellipsometry studies of CH3NH3PbX3 thin films and their growth evolution 2015 Ieee 42nd Photovoltaic Specialist Conference, Pvsc 2015. DOI: 10.1109/PVSC.2015.7356387 |
0.397 |
|
| 2015 |
Junda MM, Shan A, Koirala P, Collins RW, Podraza NJ. Spectroscopic ellipsometry applied in the full p-i-n a-Si:H solar cell device configuration Ieee Journal of Photovoltaics. 5: 307-312. DOI: 10.1109/Jphotov.2014.2362294 |
0.388 |
|
| 2015 |
Choi SG, Kang J, Li J, Haneef H, Podraza NJ, Beall C, Wei SH, Christensen ST, Repins IL. Optical function spectra and bandgap energy of Cu2SnSe3 Applied Physics Letters. 106. DOI: 10.1063/1.4907202 |
0.378 |
|
| 2015 |
Ghimire K, Haneef HF, Collins RW, Podraza NJ. Optical properties of single-crystal Gd3Ga5O12 from the infrared to ultraviolet Physica Status Solidi (B) Basic Research. 252: 2191-2198. DOI: 10.1002/Pssb.201552115 |
0.389 |
|
| 2014 |
Basantani HA, John DBS, Podraza NJ, Jackson TN, Horn MW. Evaluation of 1/f noise in prospective IR imaging thin films Proceedings of Spie. 9070. DOI: 10.1117/12.2054652 |
0.659 |
|
| 2014 |
Shan A, Fried M, Juhász G, Major C, Polgár O, Németh A, Petrik P, Dahal LR, Chen J, Huang Z, Podraza NJ, Collins RW. High-speed imaging/mapping spectroscopic ellipsometry for in-line analysis of roll-to-roll thin-film photovoltaics Ieee Journal of Photovoltaics. 4: 355-361. DOI: 10.1109/Jphotov.2013.2284380 |
0.423 |
|
| 2014 |
Aryal P, Pradhan P, Attygalle D, Ibdah ARA, Aryal K, Ranjan V, Marsillac S, Podraza NJ, Collins RW. Real-time, in-line, and mapping spectroscopic ellipsometry for applications in Cu(In1-xGax)Se2 metrology Ieee Journal of Photovoltaics. 4: 333-339. DOI: 10.1109/Jphotov.2013.2282745 |
0.347 |
|
| 2014 |
Haneef HF, Podraza NJ. Optical properties of single crystal Bi4Ge3O12 from the infrared to ultraviolet Journal of Applied Physics. 116: 163507. DOI: 10.1063/1.4898762 |
0.381 |
|
| 2014 |
Sallis S, Butler KT, Quackenbush NF, Williams DS, Junda M, Fischer DA, Woicik JC, Podraza NJ, White BE, Walsh A, Piper LFJ. Origin of deep subgap states in amorphous indium gallium zinc oxide: Chemically disordered coordination of oxygen Applied Physics Letters. 104. DOI: 10.1063/1.4883257 |
0.305 |
|
| 2014 |
Karki Gautam L, Haneef H, Junda M, Saint John D, Podraza N. Approach for extracting complex dielectric function spectra in weakly-absorbing regions Thin Solid Films. 571: 548-553. DOI: 10.1016/J.Tsf.2014.03.020 |
0.366 |
|
| 2014 |
Koirala P, Attygalle D, Aryal P, Pradhan P, Chen J, Marsillac S, Ferlauto AS, Podraza NJ, Collins RW. Real time spectroscopic ellipsometry for analysis and control of thin film polycrystalline semiconductor deposition in photovoltaics Thin Solid Films. 571: 442-446. DOI: 10.1016/J.Tsf.2013.10.158 |
0.414 |
|
| 2014 |
Dahal LR, Li J, Stoke JA, Huang Z, Shan A, Ferlauto AS, Wronski CR, Collins RW, Podraza NJ. Applications of real-time and mapping spectroscopic ellipsometry for process development and optimization in hydrogenated silicon thin-film photovoltaics technology Solar Energy Materials and Solar Cells. 129: 32-56. DOI: 10.1016/J.Solmat.2014.01.028 |
0.418 |
|
| 2013 |
Banai RE, Lee H, Motyka MA, Chandrasekharan R, Podraza NJ, Brownson JRS, Horn MW. Optical properties of sputtered SnS thin films for photovoltaic absorbers Ieee Journal of Photovoltaics. 3: 1084-1089. DOI: 10.1109/Jphotov.2013.2251758 |
0.826 |
|
| 2013 |
Dahal LR, Huang Z, Attygalle D, Salupo C, Marsillac S, Podraza NJ, Collins RW. Correlations between mapping spectroscopic ellipsometry results and solar cell performance for evaluations of nonuniformity in thin-film silicon photovoltaics Ieee Journal of Photovoltaics. 3: 387-393. DOI: 10.1109/JPHOTOV.2012.2221081 |
0.314 |
|
| 2013 |
Attygalle D, Ranjan V, Aryal P, Pradhan P, Marsillac S, Podraza NJ, Collins RW. Optical monitoring and control of three-stage coevaporated Cu(In 1-x Gax)Se 2 by real-time spectroscopic ellipsometry Ieee Journal of Photovoltaics. 3: 375-380. DOI: 10.1109/Jphotov.2012.2220122 |
0.364 |
|
| 2013 |
Shin H, John DS, Lee M, Podraza NJ, Jackson TN. Electrical properties of plasma enhanced chemical vapor deposition a-Si:H and a-Si1−xCx:H for microbolometer applications Journal of Applied Physics. 114: 183705. DOI: 10.1063/1.4829013 |
0.354 |
|
| 2013 |
Stoughton S, Showak M, Mao Q, Koirala P, Hillsberry DA, Sallis S, Kourkoutis LF, Nguyen K, Piper LFJ, Tenne DA, Podraza NJ, Muller DA, Adamo C, Schlom DG. Adsorption-controlled growth of BiVO4 by molecular-beam epitaxy Apl Materials. 1. DOI: 10.1063/1.4824041 |
0.416 |
|
| 2013 |
Podraza NJ, Qiu W, Hinojosa BB, Xu H, Motyka MA, Phillpot SR, Baciak JE, Trolier-Mckinstry S, Nino JC. Band gap and structure of single crystal BiI3: Resolving discrepancies in literature Journal of Applied Physics. 114. DOI: 10.1063/1.4813486 |
0.774 |
|
| 2013 |
Haislmaier RC, Podraza NJ, Denev S, Melville A, Schlom DG, Gopalan V. Large nonlinear optical coefficients in pseudo-tetragonal BiFeO3 thin films Applied Physics Letters. 103. DOI: 10.1063/1.4812978 |
0.361 |
|
| 2013 |
Lee CH, Podraza NJ, Zhu Y, Berger RF, Shen S, Sestak M, Collins RW, Kourkoutis LF, Mundy JA, Wang H, Mao Q, Xi X, Brillson LJ, Neaton JB, Muller DA, et al. Effect of reduced dimensionality on the optical band gap of SrTiO 3 Applied Physics Letters. 102. DOI: 10.1063/1.4798241 |
0.354 |
|
| 2012 |
Yang JC, He Q, Suresha SJ, Kuo CY, Peng CY, Haislmaier RC, Motyka MA, Sheng G, Adamo C, Lin HJ, Hu Z, Chang L, Tjeng LH, Arenholz E, Podraza NJ, et al. Orthorhombic BiFeO3. Physical Review Letters. 109: 247606. PMID 23368382 DOI: 10.1103/Physrevlett.109.247606 |
0.757 |
|
| 2012 |
Kim S, Motyka MA, Palomino AM, Podraza NJ. Conformational effects of adsorbed polymer on the swelling behavior of engineered clay minerals Clays and Clay Minerals. 60: 363-373. DOI: 10.1346/Ccmn.2012.0600403 |
0.734 |
|
| 2012 |
Ko SW, Schulze HM, Saint John DB, Podraza NJ, Dickey EC, Trolier-Mckinstry SS. Low temperature crystallization of metastable nickel manganite spinel thin films Journal of the American Ceramic Society. 95: 2562-2567. DOI: 10.1111/J.1551-2916.2012.05201.X |
0.453 |
|
| 2012 |
Shay DP, Podraza NJ, Donnelly NJ, Randall CA. High energy density, high temperature capacitors utilizing Mn-doped 0.8CaTiO 3-0.2CaHfO 3 ceramics Journal of the American Ceramic Society. 95: 1348-1355. DOI: 10.1111/J.1551-2916.2011.04962.X |
0.364 |
|
| 2012 |
Motyka MA, Gauntt BD, Horn MW, Dickey EC, Podraza NJ. Microstructural evolution of thin film vanadium oxide prepared by pulsed-direct current magnetron sputtering Journal of Applied Physics. 112. DOI: 10.1063/1.4759255 |
0.806 |
|
| 2012 |
Zurbuchen MA, Podraza NJ, Schubert J, Jia Y, Schlom DG. Synthesis of the superlattice complex oxide Sr5Bi4Ti8O27 and its band gap behavior Applied Physics Letters. 100: 223109. DOI: 10.1063/1.4722942 |
0.4 |
|
| 2012 |
Podraza NJ, Gauntt BD, Motyka MA, Dickey EC, Horn MW. Electrical and optical properties of sputtered amorphous vanadium oxide thin films Journal of Applied Physics. 111. DOI: 10.1063/1.3702451 |
0.813 |
|
| 2011 |
Werner DH, Mayer TS, Rivero-Baleine C, Podraza N, Richardson K, Turpin J, Pogrebnyakov A, Musgraves JD, Bossard JA, Shin HJ, Muise R, Rogers S, Johnson JD. Adaptive phase change metamaterials for infrared aperture control Proceedings of Spie - the International Society For Optical Engineering. 8165. DOI: 10.1117/12.894892 |
0.378 |
|
| 2011 |
John DBS, Shinb HB, Lee MY, Dickey EC, Podraza NJ, Jackson TN. Thin film silicon and germanium for uncooled microbolometer applications Proceedings of Spie - the International Society For Optical Engineering. 8012. DOI: 10.1117/12.884269 |
0.454 |
|
| 2011 |
Gauntt BD, Li J, Cabarcos OM, Basantani HA, Venkatasubramanian C, Bharadwaja SSN, Podraza NJ, Jackson TN, Allara DL, Antrazi S, Horn MW, Dickey EC. Microstructure of vanadium oxide used in microbolometers Proceedings of Spie. 8012: 1. DOI: 10.1117/12.884161 |
0.66 |
|
| 2011 |
Ko SW, Li J, Podraza NJ, Dickey EC, Trolier-Mckinstry S. Spin spray-deposited nickel manganite thermistor films for microbolometer applications Journal of the American Ceramic Society. 94: 516-523. DOI: 10.1111/J.1551-2916.2010.04097.X |
0.479 |
|
| 2011 |
Saint John DB, Shin HB, Lee MY, Ajmera SK, Syllaios AJ, Dickey EC, Jackson TN, Podraza NJ. Influence of microstructure and composition on hydrogenated silicon thin film properties for uncooled microbolometer applications Journal of Applied Physics. 110. DOI: 10.1063/1.3610422 |
0.451 |
|
| 2011 |
Desireddy A, Joshi CP, Sestak M, Little S, Kumar S, Podraza NJ, Marsillac S, Collins RW, Bigioni TP. Wafer-scale self-assembled plasmonic thin films Thin Solid Films. 519: 6077-6084. DOI: 10.1016/J.Tsf.2011.03.111 |
0.46 |
|
| 2011 |
Dahal LR, Sainju D, Podraza NJ, Marsillac S, Collins RW. Real time spectroscopic ellipsometry of Ag/ZnO and Al/ZnO interfaces for back-reflectors in thin film Si:H photovoltaics Thin Solid Films. 519: 2682-2687. DOI: 10.1016/J.Tsf.2010.11.093 |
0.451 |
|
| 2011 |
Podraza NJ, Saint John DB, Ko SW, Schulze HM, Li J, Dickey EC, Trolier-Mckinstry S. Optical and structural properties of solution deposited nickel manganite thin films Thin Solid Films. 519: 2919-2923. DOI: 10.1016/J.Tsf.2010.11.088 |
0.484 |
|
| 2010 |
Podraza NJ, John DBS, Li J, Wronski CR, Dickey EC, Collins RW. Microstructural evolution in Si1-x Gex:H thin films for photovoltaic applications Conference Record of the Ieee Photovoltaic Specialists Conference. 158-163. DOI: 10.1109/PVSC.2010.5616039 |
0.38 |
|
| 2010 |
Kumar A, Denev S, Zeches RJ, Vlahos E, Podraza NJ, Melville A, Schlom DG, Ramesh R, Gopalan V. Probing mixed tetragonal/rhombohedral-like monoclinic phases in strained bismuth ferrite films by optical second harmonic generation Applied Physics Letters. 97. DOI: 10.1063/1.3483923 |
0.38 |
|
| 2010 |
Yoon HP, Yuwen YA, Kendrick CE, Barber GD, Podraza NJ, Redwing JM, Mallouk TE, Wronski CR, Mayer TS. Enhanced conversion efficiencies for pillar array solar cells fabricated from crystalline silicon with short minority carrier diffusion lengths Applied Physics Letters. 96. DOI: 10.1063/1.3432449 |
0.349 |
|
| 2010 |
Chen P, Podraza NJ, Xu XS, Melville A, Vlahos E, Gopalan V, Ramesh R, Schlom DG, Musfeldt JL. Optical properties of quasi-tetragonal BiFeO3 thin films Applied Physics Letters. 96. DOI: 10.1063/1.3364133 |
0.478 |
|
| 2010 |
Li J, Gauntt B, Podraza N, Jackson T, Dickey E. Micro-Twinned VOx Nanocrystalline Film and Hopping Conduction Microscopy and Microanalysis. 16: 1274-1275. DOI: 10.1017/S1431927610060708 |
0.407 |
|
| 2010 |
Sloppy JD, Podraza NJ, Dickey EC, MacDonald DD. Complex dielectric functions of anodic bi-layer tantalum oxide Electrochimica Acta. 55: 8751-8757. DOI: 10.1016/J.Electacta.2010.07.077 |
0.358 |
|
| 2009 |
Ramirez MO, Kumar A, Denev SA, Podraza NJ, Xu XS, Rai RC, Chu YH, Seidel J, Martin LW, Yang SY, Saiz E, Ihlefeld JF, Lee S, Klug J, Cheong SW, et al. Magnon sidebands and spin-charge coupling in bismuth ferrite probed by nonlinear optical spectroscopy Physical Review B - Condensed Matter and Materials Physics. 79. DOI: 10.1103/Physrevb.79.224106 |
0.316 |
|
| 2009 |
Lee JH, Ke X, Podraza NJ, Kourkoutis LF, Heeg T, Roeckerath M, Freeland JW, Fennie CJ, Schubert J, Muller DA, Schiffer P, Schlom DG. Optical band gap and magnetic properties of unstrained EuTiO3 films Applied Physics Letters. 94. DOI: 10.1063/1.3133351 |
0.467 |
|
| 2008 |
Podraza NJ, Li J, Wronski CR, Horn MW, Dickey EC, Collins RW. Analysis of compositionally and structurally graded Si:H and Si 1-xGe x:H thin films by real time spectroscopic ellipsometry Materials Research Society Symposium Proceedings. 1066: 253-258. DOI: 10.1557/Proc-1066-A10-01 |
0.642 |
|
| 2008 |
Podraza NJ, Pursel SM, Chen C, Horn MW, Collins RW. Analysis of the optical properties and structure of serial bi-deposited TiO2 chiral sculptured thin films using Mueller matrix ellipsometry Journal of Nanophotonics. 2. DOI: 10.1117/1.3062210 |
0.652 |
|
| 2008 |
Kumar A, Podraza NJ, Denev S, Li J, Martin LW, Chu YH, Ramesh R, Collins RW, Gopalan V. Linear and nonlinear optical properties of multifunctional PbV O3 thin films Applied Physics Letters. 92. DOI: 10.1063/1.2943283 |
0.39 |
|
| 2008 |
Kumar A, Rai RC, Podraza NJ, Denev S, Ramirez M, Chu YH, Martin LW, Ihlefeld J, Heeg T, Schubert J, Schlom DG, Orenstein J, Ramesh R, Collins RW, Musfeldt JL, et al. Linear and nonlinear optical properties of BiFeO3 Applied Physics Letters. 92. DOI: 10.1063/1.2901168 |
0.31 |
|
| 2008 |
Ihlefeld JF, Podraza NJ, Liu ZK, Rai RC, Xu X, Heeg T, Chen YB, Li J, Collins RW, Musfeldt JL, Pan XQ, Schubert J, Ramesh R, Schlom DG. Optical band gap of BiFe O3 grown by molecular-beam epitaxy Applied Physics Letters. 92. DOI: 10.1063/1.2901160 |
0.486 |
|
| 2008 |
John DBS, Podraza NJ, Gauntt BD, Li J, Dickey EC. Microstructural and radial distribution function analysis of hydrogenated silicon, germanium, and silicon-germanium alloy thin films Microscopy and Microanalysis. 14: 406-407. DOI: 10.1017/S1431927608087631 |
0.386 |
|
| 2008 |
Cao X, Stoke JA, Li J, Podraza NJ, Du W, Yang X, Attygalle D, Liao X, Collins RW, Deng X. Fabrication and optimization of single-junction nc-Si:H n-i-p solar cells using Si:H phase diagram concepts developed by real time spectroscopic ellipsometry Journal of Non-Crystalline Solids. 354: 2397-2402. DOI: 10.1016/J.Jnoncrysol.2007.10.078 |
0.374 |
|
| 2008 |
Stoke JA, Podraza NJ, Li J, Cao X, Deng X, Collins RW. Advanced deposition phase diagrams for guiding Si:H-based multijunction solar cells Journal of Non-Crystalline Solids. 354: 2435-2439. DOI: 10.1016/J.Jnoncrysol.2007.10.061 |
0.379 |
|
| 2008 |
Marsillac S, Barreau N, Khatri H, Li J, Sainju D, Parikh A, Podraza NJ, Collins RW. Spectroscopic ellipsometry studies of in2S3 top window and Mo back contacts in chalcopyrite photovoltaics technology Physica Status Solidi (C) Current Topics in Solid State Physics. 5: 1244-1248. DOI: 10.1002/Pssc.200777889 |
0.44 |
|
| 2008 |
Li J, Podraza NJ, Collins RW. Real time spectroscopic ellipsometry of sputtered CdTe, CdS, and CdTe 1-xS x thin films for photovoltaic applications Physica Status Solidi (a) Applications and Materials Science. 205: 901-904. DOI: 10.1002/Pssa.200777892 |
0.339 |
|
| 2008 |
Podraza NJ, Li J, Wronski CR, Dickey EC, Horn MW, Collins RW. Analysis of Si 1-xGe x:H thin films with graded composition and structure by real time spectroscopic ellipsometry Physica Status Solidi (a) Applications and Materials Science. 205: 892-895. DOI: 10.1002/Pssa.200777876 |
0.67 |
|
| 2007 |
Collins J, Podraza NJ, Li J, Cao X, Deng X, Collins RW. Advanced Deposition Phase Diagrams for Guiding Si:H-Based Multijunction Solar Cells Mrs Proceedings. 989. DOI: 10.1557/Proc-0989-A15-02 |
0.378 |
|
| 2007 |
Podraza NJ, Wronski CR, Horn MW, Collins RW. Dielectric functions of a-Si1-xGex:H versus ge content, temperature, and processing: Advances in optical function parameterization Materials Research Society Symposium Proceedings. 910: 259-264. DOI: 10.1557/Proc-0910-A10-01 |
0.677 |
|
| 2007 |
Pearce JM, Podraza N, Collins RW, Al-Jassim MM, Jones KM, Deng J, Wronski CR. Optimization of open circuit voltage in amorphous silicon solar cells with mixed-phase (amorphous+nanocrystalline) p -type contacts of low nanocrystalline content Journal of Applied Physics. 101. DOI: 10.1063/1.2714507 |
0.368 |
|
| 2006 |
Podraza NJ, Wronski CR, Horn MW, Collins RW. Dielectric Functions of a-Si1-xGex:H versus Ge Content, Temperature, and Processing: Advances in Optical Function Parameterization Mrs Proceedings. 910. DOI: 10.1557/PROC-0910-A10-01 |
0.645 |
|
| 2006 |
Podraza NJ, Wronski CR, Horn MW, Collins RW. Surface Roughening Transition in Si 1-x Ge x :H Thin Films Mrs Proceedings. 910. DOI: 10.1557/Proc-0910-A03-02 |
0.63 |
|
| 2006 |
Podraza NJ, Wronski CR, Collins RW. Model for the amorphous roughening transition in amorphous semiconductor deposition Journal of Non-Crystalline Solids. 352: 950-954. DOI: 10.1016/J.Jnoncrysol.2005.12.013 |
0.456 |
|
| 2006 |
Podraza NJ, Wronski CR, Collins RW. Deposition phase diagrams for Si1-xGex:H from real time spectroscopic ellipsometry Journal of Non-Crystalline Solids. 352: 1263-1267. DOI: 10.1016/J.Jnoncrysol.2005.09.037 |
0.342 |
|
| 2005 |
Podraza NJ, Chen C, Sainju D, Ezekoye O, Horn MW, Wronski CR, Collins RW. Transparent Conducting Oxide Sculptured Thin Films for Photovoltaic Applications Mrs Proceedings. 865. DOI: 10.1557/Proc-865-F7.1 |
0.645 |
|
| 2005 |
Li J, Chen J, Zapien JA, Podraza NJ, Chen C, Drayton J, Vasko A, Gupta A, Wang SL, Collins RW, Compaan AD. Real time analysis of magnetron-sputtered thin-film CdTe by multichannel spectroscopic ellipsometry Materials Research Society Symposium Proceedings. 865: 9-14. DOI: 10.1557/Proc-865-F1.2 |
0.47 |
|
| 2004 |
Podraza NJ, Chen C, An I, Ferreira GM, Rovira PI, Messier R, Collins RW. Analysis of the optical properties and structure of sculptured thin films from spectroscopic Mueller matrix ellipsometry Thin Solid Films. 455: 571-575. DOI: 10.1016/J.Tsf.2003.11.219 |
0.437 |
|
| 2004 |
Chen C, An I, Ferreira GM, Podraza NJ, Zapien JA, Collins RW. Multichannel Mueller matrix ellipsometer based on the dual rotating compensator principle Thin Solid Films. 455: 14-23. DOI: 10.1016/J.Tsf.2003.11.191 |
0.384 |
|
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