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Jian-Min ( Zuo - Publications

Affiliations: 
University of Illinois, Urbana-Champaign, Urbana-Champaign, IL 
Area:
Materials Science Engineering, Condensed Matter Physics
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47 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2020 Hsiao H, Shao Y, Yuan R, Zuo J. Imaging Lattice Distortions in High Entropy Alloys at Multiple Length Scales Using Electron Nanodiffraction and 4D-STEM Microscopy and Microanalysis. 1-3. DOI: 10.1017/S1431927620016554  0.313
2020 Zuo J, Yuan R, Hsiao H. From Scanning Electron Nanodiffraction to 4D-STEM: How and Why Coherence Matters Microscopy and Microanalysis. 1-2. DOI: 10.1017/S1431927620016517  0.314
2019 Yoon A, Zuo J. Environment-Dependent Electron Beam Reduction of Rutile Nanocrystals at High Temperatures Microscopy and Microanalysis. 25: 1680-1681. DOI: 10.1017/S1431927619009139  0.314
2018 Kwon J, Meng Y, Wu L, Zhu Y, Zhang Y, Selvamanickam V, Welp U, Kwok W, Zuo J. Extended electronic structure inhomogeneity created by double chain layer defects surrounding columnar tracks in heavy-ion irradiated YBa2Cu3O7−δ Superconductor Science and Technology. 31: 105006. DOI: 10.1088/1361-6668/Aad842  0.371
2018 Zuo J, Shao Y. Scanning Convergent Beam Electron Diffraction (CBED), the Essential Questions of Why, What and How? Microscopy and Microanalysis. 24: 172-173. DOI: 10.1017/S1431927618001356  0.356
2018 Kim T, Zuo J. Structural determination of single-walled carbon nanotube with an intramolecular junction and its electrical transport property Carbon. 139: 472-476. DOI: 10.1016/J.Carbon.2018.06.075  0.557
2017 Guo W, Sneed BT, Meng Y, Cullen DA, Zuo J, Poplawsky JD. Recent Progress of Correlative Transmission Electron Microscopy and Atom Probe Tomography for Materials Characterization Microscopy and Microanalysis. 23: 692-693. DOI: 10.1017/S1431927617004123  0.354
2017 Yuan R, Meng Y, Zhang J, Zuo J. Accurate Diffraction Peak Identification for Scanning Electron Nanodiffraction Based on Automated Image Processing and Feature Detection Microscopy and Microanalysis. 23: 180-181. DOI: 10.1017/S1431927617001581  0.328
2017 Kwon J, Park J, Park G, Zuo J, Kang S, Oh J, Kim M. Nanoscale physico-chemical investigation of complementary ZnO-Si nanocomposites and their photoconductive behavior Current Applied Physics. 17: 152-156. DOI: 10.1016/J.Cap.2016.11.013  0.345
2016 Shao Y, Zuo J. Fundamental Symmetry of Barium Titanate Single Crystal Determined Using Energy-Filtered Scanning Convergent Beam Electron Diffraction Microscopy and Microanalysis. 22: 516-517. DOI: 10.1017/S1431927616003433  0.353
2016 Meng Y, Zuo J. Three-Dimensional Nanostructure Determination Based On Scanning Electron Nanodiffraction Microscopy and Microanalysis. 22: 498-499. DOI: 10.1017/S1431927616003342  0.369
2015 Zheng Q, Kim H, Zhang R, Sardela M, Zuo J, Balaji M, Lourdudoss S, Sun YT, Braun PV. Epitaxial growth of three dimensionally structured III-V photonic crystal via hydride vapor phase epitaxy Journal of Applied Physics. 118. DOI: 10.1063/1.4937273  0.339
2015 Gao W, Sivaramakrishnan S, Wen J, Zuo J. Direct Observation of Interfacial Au atoms Using STEM Depth Sectioning Microscopy and Microanalysis. 21: 2417-2418. DOI: 10.1017/S1431927615012866  0.549
2015 Zuo J, Meng Y, Vivek Deshpande P, Hu Y, Kim K, Xing H, Zhang P, Wang H. TEM Based High Resolution Electron Diffraction Techniques for Three-dimensional Nanostructure Determination Microscopy and Microanalysis. 21: 1095-1096. DOI: 10.1017/S1431927615006261  0.355
2015 Kim K, Zuo J. Quantitative symmetry determination and symmetry mapping using convergent beam electron diffraction technique Microscopy and Microanalysis. 21: 821-822. DOI: 10.1017/S1431927615004900  0.344
2014 Gao W, Wu J, Zhang X, Yoon A, Mabon J, Swiech W, Wilson W, Yang H, Zuo J. Surface Atomic Diffusion Processes Observed at Milliseconds Time Resolution using Environmental TEM Microscopy and Microanalysis. 20: 1590-1591. DOI: 10.1017/S1431927614009684  0.352
2013 Wei H, House S, Wu J, Zhang J, Wang Z, He Y, Gao EJ, Gao Y, Robinson H, Li W, Zuo J, Robertson IM, Lu Y. Enhanced and tunable fluorescent quantum dots within a single crystal of protein Nano Research. 6: 627-634. DOI: 10.1007/S12274-013-0348-0  0.513
2012 Kim K, Payne DA, Zuo J. Symmetry of piezoelectric (1−x)Pb(Mg1/3Nb2/3)O3-xPbTiO3(x=0.31) single crystal at different length scales in the morphotropic phase boundary region Physical Review B. 86. DOI: 10.1103/Physrevb.86.184113  0.346
2012 Hu H, Zheng M, Eckstein J, Zuo J. Scanning Transmission Electron Microscopy Evidences Of Interstitial And Substitutional Oxygen In MBE Grown Fe1+xTe Thin Films And Emergence Of Superconductivity Microscopy and Microanalysis. 18: 1456-1457. DOI: 10.1017/S1431927612009130  0.321
2010 Kim T, Kim G, Choi WI, Kwon Y, Zuo J. Electrical transport in small bundles of single-walled carbon nanotubes: Intertube interaction and effects of tube deformation Applied Physics Letters. 96: 173107. DOI: 10.1063/1.3402768  0.513
2009 Hu H, Zuo J. Atomic-Resolution Imaging of Crystals Using Charge Flipping and Precession Electron Diffraction Microscopy and Microanalysis. 15: 740-741. DOI: 10.1017/S1431927609093702  0.375
2009 Zhang J, Zuo J. Quantitative Analysis Carbon-Carbon Bonds in a Multiwall Carbon Nanotube using Electron Diffraction Microscopy and Microanalysis. 15: 764-765. DOI: 10.1017/S1431927609093404  0.551
2009 Zhang J, Zuo J. Structure and diameter-dependent bond lengths of a multi-walled carbon nanotube revealed by electron diffraction Carbon. 47: 3515-3528. DOI: 10.1016/J.Carbon.2009.08.024  0.571
2009 Wei X, Chen Q, Xu S, Peng L, Zuo J. Tuning Nanotubes: Beam to String Transition of Vibrating Carbon Nanotubes Under Axial Tension (Adv. Funct. Mater. 11/2009) Advanced Functional Materials. 19: NA-NA. DOI: 10.1002/Adfm.200990044  0.31
2009 Wei X, Chen Q, Xu S, Peng L, Zuo J. Beam to String Transition of Vibrating Carbon Nanotubes Under Axial Tension Advanced Functional Materials. 19: 1753-1758. DOI: 10.1002/Adfm.200900105  0.313
2008 Jacob D, Zuo J, Lefebvre A, Cordier Y. Composition analysis of semiconductor quantum wells by energy filtered convergent-beam electron diffraction. Ultramicroscopy. 108: 358-366. PMID 17630214 DOI: 10.1016/J.Ultramic.2007.06.001  0.315
2008 Park H, Pounds T, Zuo J. Development of Time Resolved Reflection High-Energy Electron Diffraction System to Study Ultrafast Phases Transition at Surfaces Microscopy and Microanalysis. 14: 502-503. DOI: 10.1017/S1431927608084663  0.335
2008 Zuo J, Huang W, Shah A, Kröeger R. Modeling Electron Diffraction and Imaging in Microscopes with Aberration Correctors for Quantitative Materials Structural Analysis Microscopy and Microanalysis. 14: 920-921. DOI: 10.1017/S1431927608082469  0.366
2007 Xiao J, Liu B, Huang Y, Zuo J, Hwang KC, Yu MF. Collapse and stability of single-?and multi-wall carbon nanotubes Nanotechnology. 18: 395703. PMID 21730428 DOI: 10.1088/0957-4484/18/39/395703  0.328
2007 Huang WJ, Jiang B, Sun RS, Zuo J. Towards sub-Å atomic resolution electron diffraction imaging of metallic nanoclusters: A simulation study of experimental parameters and reconstruction algorithms Ultramicroscopy. 107: 1159-1170. PMID 17383097 DOI: 10.1016/J.Ultramic.2007.01.017  0.345
2007 Zuo J, Kim T, Celik-Aktas A, Tao J. Quantitative structural analysis of individual nanotubes by electron diffraction Zeitschrift FüR Kristallographie - Crystalline Materials. 222. DOI: 10.1524/Zkri.2007.222.11.625  0.537
2007 Celik-Aktas A, Stubbins J, Zuo J. Electron Beam Machining of Nanometer-Sized Tips from Multiwalled Boron Nitride Nanotubes Microscopy and Microanalysis. 13. DOI: 10.1017/S1431927607078506  0.346
2006 Kim T, Zuo J. Structure and Electrical Transport of Single-Walled Carbon Nanotubes with Intramolecular Junction and Defects Microscopy and Microanalysis. 12: 490-491. DOI: 10.1017/S1431927606062830  0.542
2006 Huang W, Jiang B, Zuo J. Atomic Resolution Electron Diffraction Imaging of Metallic Nanoclusters Microscopy and Microanalysis. 12: 576-577. DOI: 10.1017/S1431927606062180  0.363
2005 Balakrishnan K, Datar A, Oitker R, Chen H, Zuo J, Zang L. Nanobelt self-assembly from an organic n-type semiconductor: propoxyethyl-PTCDI. Journal of the American Chemical Society. 127: 10496-7. PMID 16045330 DOI: 10.1021/Ja052940V  0.309
2003 Bording JK, Li BQ, Shi YF, Zuo J. Size- and shape-dependent energetics of nanocrystal interfaces: experiment and simulation. Physical Review Letters. 90: 226104-226104. PMID 12857325 DOI: 10.1103/Physrevlett.90.226104  0.301
2002 Jiang B, Zuo J, Chen Q, Spence JCH. Orbital ordering in LaMnO3: estimates of structure factors and comparison of measurement methods. Acta Crystallographica Section A. 58: 4-11. PMID 11752757 DOI: 10.1107/S0108767301013800  0.347
2002 Zuo J, Twesten R, Li B, Tao J, Shi Y, Bording J, Chen H, Petrov I. Progress towards Quantitative Electron Nanodiffraction Microscopy and Microanalysis. 8: 658-659. DOI: 10.1017/S1431927602106295  0.344
1999 Weierstall U, Zuo J, Kjo̵rsvik T, Spence J. Convergent-beam RHEED in a dedicated UHV diffraction camera and applications to Si reconstructed surfaces Surface Science. 442: 239-250. DOI: 10.1016/S0039-6028(99)00922-X  0.336
1998 Zuo J. Quantitative Convergent Beam Electron Diffraction Materials Transactions. 39: 938-946. DOI: 10.1007/1-4020-3920-4_10  0.393
1997 Ren G, Zuo J, Peng L. Accurate measurements of crystal structure factors using a FEG electron microscope Micron. 28: 459-467. DOI: 10.1016/S0968-4328(97)00034-6  0.358
1996 Spence JCH, Zuo J, Weierstall U, Zhang X. The scanning-tunneling atom probe. Point reflection microscopy Acta Crystallographica Section a Foundations of Crystallography. 52: C33-C33. DOI: 10.1107/S0108767396097681  0.318
1996 Zuo J, McCartney M, Spence J. Performance of imaging plates for electron recording Ultramicroscopy. 66: 35-47. DOI: 10.1016/S0304-3991(96)00076-9  0.315
1995 Peng L, Zuo J. Direct retrieval of crystal structure factors in THEED Ultramicroscopy. 57: 1-9. DOI: 10.1016/0304-3991(94)00193-Q  0.369
1992 Spence JCH, Zuo J, Qian W. Comment on "Atomic resolution in lensless low-energy electron holography" Physical Review Letters. 68: 3256-3256. PMID 10045653 DOI: 10.1103/Physrevlett.68.3256  0.346
1989 Spence J, Zuo J, Lynch J. On the Holz contribution to stem lattice images formed using high-angle dark-field detectors Ultramicroscopy. 31: 233-239. DOI: 10.1016/0304-3991(89)90218-0  0.353
1988 Zuo J, Spence JCH, O'Keeffe M. Bonding in GaAs Physical Review Letters. 61: 353-356. PMID 10039309 DOI: 10.1103/Physrevlett.61.353  0.315
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