Jiewei Zeng, Ph.D. - Publications

Affiliations: 
2013 Mathematics, Statistics, and Computer Science University of Illinois at Chicago, Chicago, IL, United States 
Area:
Biostatistics, Epidemiology

6 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2016 Zhang S, Tang Y, Yuan W, Zeng J, Xie Y. A comparative study of flow boiling performance in the interconnected microchannel net and rectangular microchannels International Journal of Heat and Mass Transfer. 98: 814-823. DOI: 10.1016/j.ijheatmasstransfer.2016.03.066  0.32
2016 Zhai P, Liu J, Zeng J, Duan J, Xu L, Yao H, Guo H, Zhang S, Hou M, Sun Y. Evidence for re-crystallization process in the irradiated graphite with heavy ions obtained by Raman spectroscopy Carbon. 101: 22-27. DOI: 10.1016/j.carbon.2016.01.076  0.32
2016 Si Y, Li J, Zhong J, Zeng J, Huang S, Yuan W, Li M, Ding J. Charge separation properties of (BiO)2CO3/BiOI heterostructures with enhanced solar-driven photocatalytic activity Current Applied Physics. 16: 240-244. DOI: 10.1016/j.cap.2015.12.008  0.32
2016 Gou M, Zeng J, Wang H, Tang Y, Shigematsu T, Morimura S, Kida K. Microbial community structure and dynamics of starch-fed and glucose-fed chemostats during two years of continuous operation Frontiers of Environmental Science and Engineering. 10: 368-380. DOI: 10.1007/s11783-015-0815-9  0.32
2016 Guo H, Sun Y, Zhai P, Yao H, Zeng J, Zhang S, Duan J, Hou M, Khan M, Liu J. Swift-heavy ion irradiation-induced latent tracks in few- and mono-layer MoS2 Applied Physics a: Materials Science and Processing. 122. DOI: 10.1007/s00339-016-9940-y  0.32
2016 Zhang S, Wen L, Yang J, Zeng J, Sun Q, Li Z, Zhao D, Dou S. Facile Fabrication of Dendritic Mesoporous SiO2@CdTe@SiO2 Fluorescent Nanoparticles for Bioimaging Particle and Particle Systems Characterization. DOI: 10.1002/ppsc.201500254  0.32
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