Hui Tian, Ph.D. - Publications
Affiliations: | 2000 | Stanford University, Palo Alto, CA |
Area:
Electrical EngineeringYear | Citation | Score | |||
---|---|---|---|---|---|
2001 | Tian H, Liu X, Lim S, Kleinfelder S, Gamal AE. Active pixel sensors fabricated in a standard 0.18-μm CMOS technology Proceedings of Spie. 4306: 441-449. DOI: 10.1117/12.426982 | 0.482 | |||
2001 | Tian H, El Gamal A. Analysis of 1/f noise in switched MOSFET circuits Ieee Transactions On Circuits and Systems Ii: Analog and Digital Signal Processing. 48: 151-157. DOI: 10.1109/82.917783 | 0.376 | |||
2001 | Tian H, Fowler B, El Gamal A. Analysis of temporal noise in CMOS photodiode active pixel sensor Ieee Journal of Solid-State Circuits. 36: 92-101. DOI: 10.1109/4.896233 | 0.468 | |||
2000 | Tian H, Gamal AE. Analysis of 1/f noise in CMOS APS Electronic Imaging. 3965: 168-176. DOI: 10.1117/12.385433 | 0.684 | |||
1999 | Tian H, Fowler BA, Gamal AE. Analysis of temporal noise in CMOS APS Electronic Imaging. 3649: 177-185. DOI: 10.1117/12.347073 | 0.692 | |||
1999 | Yang DXD, Tian H, Fowler BA, Liu X, Gamal AE. Characterization of CMOS image sensors with Nyquist rate pixel-level ADC Electronic Imaging. 3650: 52-62. DOI: 10.1117/12.342863 | 0.725 | |||
1998 | Fowler B, El Gamal A, Yang D, Tian H. A method for estimating quantum efficiency for CMOS image sensors Proceedings of Spie - the International Society For Optical Engineering. 3301: 178-185. DOI: 10.1117/12.304561 | 0.443 | |||
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