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Eva Schubert - Publications

Affiliations: 
Electrical Engineering The University of Nebraska - Lincoln, Lincoln, NE 
Area:
Optics Physics, Nanotechnology
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42 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2021 Kilic U, Mock A, Sekora D, Gilbert S, Valloppilly S, Melendez G, Ianno N, Langell M, Schubert E, Schubert M. Author Correction: Precursor-surface interactions revealed during plasma-enhanced atomic layer deposition of metal oxide thin films by in-situ spectroscopic ellipsometry. Scientific Reports. 11: 7157. PMID 33762652 DOI: 10.1038/s41598-021-86624-1  0.308
2020 Ruder A, Wright B, Peev D, Feder R, Kilic U, Hilfiker M, Schubert E, Herzinger CM, Schubert M. Mueller matrix ellipsometer using dual continuously rotating anisotropic mirrors. Optics Letters. 45: 3541-3544. PMID 32630893 DOI: 10.1364/Ol.398060  0.376
2020 Kilic U, Mock A, Sekora D, Gilbert S, Valloppilly S, Ianno N, Langell M, Schubert E, Schubert M. Precursor-surface interactions revealed during plasma-enhanced atomic layer deposition of metal oxide thin films by in-situ spectroscopic ellipsometry. Scientific Reports. 10: 10392. PMID 32587273 DOI: 10.1038/S41598-020-66409-8  0.428
2019 Kılıç U, Mock A, Feder R, Sekora D, Hilfiker M, Korlacki R, Schubert E, Argyropoulos C, Schubert M. Tunable plasmonic resonances in Si-Au slanted columnar heterostructure thin films. Scientific Reports. 9: 71. PMID 30635603 DOI: 10.1038/S41598-018-37153-X  0.413
2019 Kananizadeh N, Lee J, Mousavi ES, Rodenhausen KB, Sekora D, Schubert M, Bartelt-Hunt S, Schubert E, Zhang J, Li Y. Deposition of titanium dioxide nanoparticles onto engineered rough surfaces with controlled heights and properties Colloids and Surfaces a: Physicochemical and Engineering Aspects. 571: 125-133. DOI: 10.1016/J.Colsurfa.2019.03.088  0.343
2018 Kılıç U, Sekora D, Mock A, Korlacki R, Valloppilly S, Echeverría EM, Ianno N, Schubert E, Schubert M. Critical-point model dielectric function analysis of WO3 thin films deposited by atomic layer deposition techniques Journal of Applied Physics. 124: 115302. DOI: 10.1063/1.5038746  0.411
2017 Sekora D, Lai RY, Schmidt D, Schubert M, Schubert E. Structural and optical properties of alumina passivated amorphous Si slanted columnar thin films during electrochemical Li-ion intercalation and deintercalation observed byin situgeneralized spectroscopic ellipsometry Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena. 35: 031401. DOI: 10.1116/1.4982880  0.453
2017 Rice C, Mock A, Sekora D, Schmidt D, Hofmann T, Schubert E, Schubert M. Control of slanting angle, porosity, and anisotropic optical constants of slanted columnar thin films via in situ nucleation layer tailoring Applied Surface Science. 421: 766-771. DOI: 10.1016/J.Apsusc.2017.03.134  0.468
2017 Hofmann T, Knight S, Sekora D, Schmidt D, Herzinger CM, Woollam JA, Schubert E, Schubert M. Screening effects in metal sculptured thin films studied with terahertz Mueller matrix ellipsometry Applied Surface Science. 421: 513-517. DOI: 10.1016/J.Apsusc.2016.12.200  0.493
2017 Briley C, Mock A, Korlacki R, Hofmann T, Schubert E, Schubert M. Effects of annealing and conformal alumina passivation on anisotropy and hysteresis of magneto-optical properties of cobalt slanted columnar thin films Applied Surface Science. 421: 320-324. DOI: 10.1016/J.Apsusc.2016.12.198  0.486
2017 Sekora D, Briley C, Schubert M, Schubert E. Optical and structural properties of cobalt-permalloy slanted columnar heterostructure thin films Applied Surface Science. 421: 783-787. DOI: 10.1016/J.Apsusc.2016.10.104  0.506
2017 Mock A, Carlson T, VanDerslice J, Mohrmann J, Woollam JA, Schubert E, Schubert M. Multiple-layered effective medium approximation approach to modeling environmental effects on alumina passivated highly porous silicon nanostructured thin films measured by in-situ Mueller matrix ellipsometry Applied Surface Science. 421: 663-666. DOI: 10.1016/J.Apsusc.2016.10.004  0.499
2016 Peev D, Hofmann T, Kananizadeh N, Beeram S, Rodriguez E, Wimer S, Rodenhausen KB, Herzinger CM, Kasputis T, Pfaunmiller E, Nguyen A, Korlacki R, Pannier A, Li Y, Schubert E, et al. Anisotropic contrast optical microscope. The Review of Scientific Instruments. 87: 113701. PMID 27910407 DOI: 10.1063/1.4965878  0.345
2016 Kananizadeh N, Rice C, Lee J, Rodenhausen KB, Sekora D, Schubert M, Schubert E, Bartelt-Hunt S, Li Y. Combined quartz crystal microbalance with dissipation (QCM-D) and generalized ellipsometry (GE) to characterize the deposition of titanium dioxide nanoparticles on model rough surfaces. Journal of Hazardous Materials. PMID 27041442 DOI: 10.1016/J.Jhazmat.2016.03.048  0.342
2016 Mock A, Korlacki R, Briley C, Sekora D, Hofmann T, Wilson P, Sinitskii A, Schubert E, Schubert M. Anisotropy, band-to-band transitions, phonon modes, and oxidation properties of cobalt-oxide core-shell slanted columnar thin films Applied Physics Letters. 108. DOI: 10.1063/1.4941399  0.402
2015 Kasputis T, Pieper A, Rodenhausen KB, Schmidt D, Sekora D, Rice C, Schubert E, Schubert M, Pannier AK. Use of precisely sculptured thin film (STF) substrates with generalized ellipsometry to determine spatial distribution of adsorbed fibronectin to nanostructured columnar topographies and effect on cell adhesion. Acta Biomaterialia. 18: 88-99. PMID 25712389 DOI: 10.1016/J.Actbio.2015.02.016  0.368
2015 Wilson PM, Zobel A, Lipatov A, Schubert E, Hofmann T, Sinitskii A. Multilayer graphitic coatings for thermal stabilization of metallic nanostructures. Acs Applied Materials & Interfaces. 7: 2987-92. PMID 25594774 DOI: 10.1021/Am506777A  0.317
2015 Liang D, Sekora D, Rice C, Schubert E, Schubert M. Optical anisotropy of porous polymer film with inverse slanted nanocolumnar structure revealed via generalized spectroscopic ellipsometry Applied Physics Letters. 107. DOI: 10.1063/1.4929367  0.433
2015 Wilson PM, Lipatov A, Schmidt D, Schubert E, Schubert M, Sinitskii A, Hofmann T. Structural and optical properties of cobalt slanted nanopillars conformally coated with few-layer graphene Applied Physics Letters. 106. DOI: 10.1063/1.4922199  0.402
2015 Briley C, Schmidt D, Hofmann T, Schubert E, Schubert M. Anisotropic magneto-optical hysteresis of permalloy slanted columnar thin films determined by vector magneto-optical generalized ellipsometry Applied Physics Letters. 106. DOI: 10.1063/1.4916669  0.453
2013 Liang D, Schmidt D, Wang H, Schubert E, Schubert M. Generalized ellipsometry effective medium approximation analysis approach for porous slanted columnar thin films infiltrated with polymer Applied Physics Letters. 103. DOI: 10.1063/1.4821159  0.466
2013 Schmidt D, Briley C, Schubert E, Schubert M. Vector magneto-optical generalized ellipsometry for sculptured thin films Applied Physics Letters. 102: 123109. DOI: 10.1063/1.4799365  0.455
2013 Kasputis T, Koenig M, Schmidt D, Sekora D, Rodenhausen KB, Eichhorn KJ, Uhlmann P, Schubert E, Pannier AK, Schubert M, Stamm M. Slanted columnar thin films prepared by glancing angle deposition functionalized with polyacrylic acid polymer brushes Journal of Physical Chemistry C. 117: 13971-13980. DOI: 10.1021/Jp402055H  0.393
2012 Rodenhausen KB, Schmidt D, Kasputis T, Pannier AK, Schubert E, Schubert M. Generalized ellipsometry in-situ quantification of organic adsorbate attachment within slanted columnar thin films. Optics Express. 20: 5419-28. PMID 22418349 DOI: 10.1364/Oe.20.005419  0.466
2012 Hofmann T, Schmidt D, Boosalis A, Kühne P, Herzinger C, Woollam J, Schubert E, Schubert M. Metal slanted columnar thin film THz optical sensors Mrs Proceedings. 1409. DOI: 10.1557/Opl.2012.780  0.456
2012 Schmidt D, Schubert E, Schubert M. Aging Effects of As-deposited and Passivated Cobalt Slanted Columnar Thin Films Mrs Proceedings. 1409. DOI: 10.1557/Opl.2012.393  0.518
2012 Schmidt D, Briley C, Schubert E, Schubert M. Vector Magneto-Optical Generalized Ellipsometry on Passivated Permalloy Slanted Columnar Thin Films Mrs Proceedings. 1408. DOI: 10.1557/Opl.2012.39  0.478
2012 Schmidt D, Schubert E, Schubert M. Optical properties of cobalt slanted columnar thin films passivated by atomic layer deposition Applied Physics Letters. 100: 011912. DOI: 10.1063/1.3675549  0.507
2011 Hofmann T, Schmidt D, Boosalis A, Kühne P, Skomski R, Herzinger CM, Woollam JA, Schubert M, Schubert E. THz dielectric anisotropy of metal slanted columnar thin films Applied Physics Letters. 99: 081903. DOI: 10.1063/1.3626846  0.491
2011 Schmidt D, Müller C, Hofmann T, Inganäs O, Arwin H, Schubert E, Schubert M. Optical properties of hybrid titanium chevron sculptured thin films coated with a semiconducting polymer Thin Solid Films. 519: 2645-2649. DOI: 10.1016/J.Tsf.2010.12.111  0.498
2010 Makinistian L, Albanesi EA, Gonzalez Lemus NV, Petukhov AG, Schmidt D, Schubert E, Schubert M, Losovyj YB, Galiy P, Dowben P. Ab initio calculations and ellipsometry measurements of the optical properties of the layered semiconductor In4 Se3 Physical Review B - Condensed Matter and Materials Physics. 81. DOI: 10.1103/Physrevb.81.075217  0.373
2010 Schmidt D, Hofmann T, Herzinger CM, Schubert E, Schubert M. Magneto-optical properties of cobalt slanted columnar thin films Applied Physics Letters. 96: 091906. DOI: 10.1063/1.3340913  0.489
2009 Schmidt D, Booso B, Hofmann T, Schubert E, Sarangan A, Schubert M. Generalized ellipsometry for monoclinic absorbing materials: determination of optical constants of Cr columnar thin films. Optics Letters. 34: 992-4. PMID 19340195 DOI: 10.1364/Ol.34.000992  0.487
2009 Schmidt D, Kjerstad AC, Hofmann T, Skomski R, Schubert E, Schubert M. Optical, structural, and magnetic properties of cobalt nanostructure thin films Journal of Applied Physics. 105: 113508. DOI: 10.1063/1.3138809  0.5
2009 Schmidt D, Booso B, Hofmann T, Schubert E, Sarangan A, Schubert M. Monoclinic optical constants, birefringence, and dichroism of slanted titanium nanocolumns determined by generalized ellipsometry Applied Physics Letters. 94. DOI: 10.1063/1.3062996  0.478
2008 Hofmann T, Schubert M, Schmidt D, Schubert E. Infrared behavior of aluminum nanostructure sculptured thin films Mrs Proceedings. 1080. DOI: 10.1557/Proc-1080-O04-16  0.42
2008 Saenger MF, Höing T, Robertson BW, Billa RB, Hofmann T, Schubert E, Schubert M. Polaron and phonon properties in proton intercalated amorphous tungsten oxide thin films Physical Review B - Condensed Matter and Materials Physics. 78. DOI: 10.1103/Physrevb.78.245205  0.35
2008 Schmidt D, Schubert E, Schubert M. Generalized ellipsometry determination of non-reciprocity in chiral silicon sculptured thin films Physica Status Solidi (a). 205: 748-751. DOI: 10.1002/Pssa.200777906  0.454
2007 Schubert E. Sub-wavelength antireflection coatings from nanostructure sculptured thin films Contributions to Plasma Physics. 47: 545-550. DOI: 10.1002/ctpp.200710070  0.393
2005 Schubert E, Frost F, Ziberi B, Wagner G, Neumann H, Rauschenbach B. Ion beam sputter deposition of soft x-ray Mo∕Si multilayer mirrors Journal of Vacuum Science & Technology B. 23: 959-965. DOI: 10.1116/1.1924610  0.318
2005 Schubert E, Höche T, Frost F, Rauschenbach B. Nanostructure fabrication by glancing angle ion beam assisted deposition of silicon Applied Physics A. 81: 481-486. DOI: 10.1007/S00339-005-3270-9  0.38
2005 Schubert E, Mändl S, Neumann H, Rauschenbach B. Real-time in situ spectroscopic ellipsometry investigation of the amorphous to crystalline phase transition in Mo single layers Applied Physics A. 80: 47-50. DOI: 10.1007/S00339-004-3005-3  0.379
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