David S. Grierson, Ph.D. - Publications

Affiliations: 
2008 University of Wisconsin, Madison, Madison, WI 
Area:
Applied Mechanics, Mechanical Engineering, Condensed Matter Physics

29 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2018 Tangpatjaroen C, Bagchi K, Martínez RA, Grierson D, Szlufarska I. Mechanical Properties of Structure-Tunable, Vapor-Deposited TPD Glass The Journal of Physical Chemistry C. 122: 27775-27781. DOI: 10.1021/Acs.Jpcc.8B09718  0.315
2017 Liu J, Jiang Y, Grierson DS, Sridharan K, Shao Y, Jacobs TDB, Falk ML, Carpick RW, Turner KT. Tribochemical Wear of Diamond-Like Carbon-Coated Atomic Force Microscope Tips. Acs Applied Materials & Interfaces. PMID 28960949 DOI: 10.1021/Acsami.7B08026  0.641
2016 Tangpatjaroen C, Grierson DS, Shannon S, Jakes JE, Szlufarska I. Size dependence of nanoscale wear of silicon carbide. Acs Applied Materials & Interfaces. PMID 27997110 DOI: 10.1021/Acsami.6B13283  0.428
2016 Grierson DS, Flack FS, Lagally MG, Turner KT. Rolling-based direct-transfer printing: A process for large-area transfer of micro- and nanostructures onto flexible substrates Journal of Applied Physics. 120. DOI: 10.1063/1.4961407  0.3
2014 Ryan KE, Keating PL, Jacobs TD, Grierson DS, Turner KT, Carpick RW, Harrison JA. Simulated adhesion between realistic hydrocarbon materials: effects of composition, roughness, and contact point. Langmuir : the Acs Journal of Surfaces and Colloids. 30: 2028-37. PMID 24494582 DOI: 10.1021/La404342D  0.786
2014 Jiang Y, Grierson DS, Turner KT. Flat punch adhesion: Transition from fracture-based to strength-limited pull-off Journal of Physics D: Applied Physics. 47. DOI: 10.1088/0022-3727/47/32/325301  0.322
2013 Vahdat V, Grierson DS, Turner KT, Carpick RW. Mechanics of interaction and atomic-scale wear of amplitude modulation atomic force microscopy probes. Acs Nano. 7: 3221-35. PMID 23506316 DOI: 10.1021/Nn305901N  0.803
2013 Vahdat V, Grierson DS, Turner KT, Carpick RW. Correction to Mechanics of Interaction and Atomic-Scale Wear of Amplitude Modulation Atomic Force Microscopy Probes Acs Nano. 7: 10435-10435. DOI: 10.1021/Nn405606Y  0.774
2013 Grierson DS, Liu J, Carpick RW, Turner KT. Adhesion of nanoscale asperities with power-law profiles Journal of the Mechanics and Physics of Solids. 61: 597-610. DOI: 10.1016/J.Jmps.2012.09.003  0.587
2013 Jacobs TDB, Ryan KE, Keating PL, Grierson DS, Lefever JA, Turner KT, Harrison JA, Carpick RW. The effect of atomic-scale roughness on the adhesion of nanoscale asperities: A combined simulation and experimental investigation Tribology Letters. 50: 81-93. DOI: 10.1007/S11249-012-0097-3  0.642
2012 Moldovan N, Dai Z, Zeng H, Carlisle JA, Jacobs TDB, Vahdat V, Grierson DS, Liu J, Turner KT, Carpick RW. Advances in manufacturing of molded tips for scanning probe microscopy Journal of Microelectromechanical Systems. 21: 431-442. DOI: 10.1109/Jmems.2011.2174430  0.78
2012 Konicek AR, Grierson DS, Sumant AV, Friedmann TA, Sullivan JP, Gilbert PUPA, Sawyer WG, Carpick RW. Influence of surface passivation on the friction and wear behavior of ultrananocrystalline diamond and tetrahedral amorphous carbon thin films Physical Review B - Condensed Matter and Materials Physics. 85. DOI: 10.1103/Physrevb.85.155448  0.782
2011 Cavallo F, Grierson DS, Turner KT, Lagally MG. "Soft Si": effective stiffness of supported crystalline nanomembranes. Acs Nano. 5: 5400-7. PMID 21644543 DOI: 10.1021/Nn200461G  0.327
2011 Vahdat V, Grierson DS, Turner KT, Carpick RW. Nano-scale forces, stresses, and tip geometry evolution of amplitude modulation atomic force microscopy probes Proceedings of the Asme Design Engineering Technical Conference. 7: 543-549. DOI: 10.1115/DETC2011-48653  0.793
2010 Liu J, Grierson DS, Moldovan N, Notbohm J, Li S, Jaroenapibal P, O'Connor SD, Sumant AV, Neelakantan N, Carlisle JA, Turner KT, Carpick RW. Preventing nanoscale wear of atomic force microscopy tips through the use of monolithic ultrananocrystalline diamond probes. Small (Weinheim An Der Bergstrasse, Germany). 6: 1140-9. PMID 20486220 DOI: 10.1002/Smll.200901673  0.677
2010 Liu J, Grierson DS, Sridharan K, Carpick RW, Turner KT. Assessment of the mechanical integrity of silicon and diamond-like carbon coated silicon atomic force microscope probes Proceedings of Spie - the International Society For Optical Engineering. 7767. DOI: 10.1117/12.861789  0.673
2010 Grierson DS, Sumant AV, Konicek AR, Friedmann TA, Sullivan JP, Carpick RW. Thermal stability and rehybridization of carbon bonding in tetrahedral amorphous carbon Journal of Applied Physics. 107. DOI: 10.1063/1.3284087  0.761
2009 Grierson DS, Konicek AR, Wabiszewski GE, Sumant AV, De Boer MP, Corwin AD, Carpick RW. Characterization of microscale wear in a polysilicon-based MEMS device using AFM and PEEM-NEXAFS spectromicroscopy Tribology Letters. 36: 233-238. DOI: 10.1007/S11249-009-9478-7  0.732
2009 Hamilton MA, Konicek AR, Grierson DS, Sumant AV, Auciello O, Sawyer WG, Carpick RW. Environmental performance limits of ultrananocrystalline diamond films 2008 Proceedings of the Stle/Asme International Joint Tribology Conference, Ijtc 2008. 9-10.  0.563
2008 Konicek AR, Grierson DS, Gilbert PU, Sawyer WG, Sumant AV, Carpick RW. Origin of ultralow friction and wear in ultrananocrystalline diamond. Physical Review Letters. 100: 235502. PMID 18643515 DOI: 10.1103/Physrevlett.100.235502  0.768
2008 Chen YC, Zhong XY, Konicek AR, Grierson DS, Tai NH, Lin IN, Kabius B, Hiller JM, Sumant AV, Carpick RW, Auciello O. Synthesis and characterization of smooth ultrananocrystalline diamond films via low pressure bias-enhanced nucleation and growth Applied Physics Letters. 92. DOI: 10.1063/1.2838303  0.767
2007 Grierson DS, Sumant AV, Konicek AR, Abrecht M, Birrell J, Auciello O, Carlisle JA, Scharf TW, Dugger MT, Gilbert PUPA, Carpick RW. Tribochemistry and material transfer for the ultrananocrystalline diamond-silicon nitride interface revealed by x-ray photoelectron emission spectromicroscopy Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 25: 1700-1705. DOI: 10.1116/1.2782428  0.775
2007 Sumant AV, Grierson DS, Gerbi JE, Carlisle JA, Auciello O, Carpick RW. Surface chemistry and bonding configuration of ultrananocrystalline diamond surfaces and their effects on nanotribological properties Physical Review B - Condensed Matter and Materials Physics. 76. DOI: 10.1103/Physrevb.76.235429  0.665
2007 Grierson DS, Carpick RW. Nanotribology of carbon-based materials Nano Today. 2: 12-21. DOI: 10.1016/S1748-0132(07)70139-1  0.592
2007 Sumant AV, Gilbert PUPA, Grierson DS, Konicek AR, Abrecht M, Butler JE, Feygelson T, Rotter SS, Carpick RW. Surface composition, bonding, and morphology in the nucleation and growth of ultra-thin, high quality nanocrystalline diamond films Diamond and Related Materials. 16: 718-724. DOI: 10.1016/J.Diamond.2006.12.011  0.79
2007 Bares JA, Sumant AV, Grierson DS, Carpick RW, Sridharan K. Small amplitude reciprocating wear performance of diamond-like carbon films: Dependence of film composition and counterface material Tribology Letters. 27: 79-88. DOI: 10.1007/S11249-007-9209-X  0.629
2006 Naguib NN, Elam JW, Birrell J, Wang J, Grierson DS, Kabius B, Hiller JM, Sumant AV, Carpick RW, Auciello O, Carlisle JA. Enhanced nucleation, smoothness and conformality of ultrananocrystalline diamond (UNCD) ultrathin films via tungsten interlayers Chemical Physics Letters. 430: 345-350. DOI: 10.1016/J.Cplett.2006.08.137  0.623
2005 Grierson DS, Flater EE, Carpick RW. Accounting for the JKR-DMT transition in adhesion and friction measurements with atomic force microscopy Journal of Adhesion Science and Technology. 19: 291-311. DOI: 10.1163/1568561054352685  0.626
2005 Sumant AV, Grierson DS, Gerbi JE, Birrell J, Lanke UD, Auciello O, Carlisle JA, Carpick RW. Toward the ultimate tribological interface: Surface chemistry and nanotribology of ultrananocrystalline diamond Advanced Materials. 17: 1039-1045. DOI: 10.1002/Adma.200401264  0.561
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