☰

Andrew M. Thron, Ph.D. - Publications

Affiliations: 
2013 Materials Science and Engineering University of California, Davis, Davis, CA 
Area:
Materials Science Engineering, Inorganic Chemistry
Tree Info Similar researchers PubMed Report error

23 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2018 Zhang S, Yu E, Gates S, Cassata WS, Makel J, Thron AM, Bartel C, Weimer AW, Faller R, Stroeve P, Tringe JW. Helium interactions with alumina formed by atomic layer deposition show potential for mitigating problems with excess helium in spent nuclear fuel Journal of Nuclear Materials. 499: 301-311. DOI: 10.1016/J.Jnucmat.2017.11.029  0.351
2017 Qin W, Yun J, Thron AM, Benthem Kv. Temperature gradient and microstructure evolution in AC flash sintering of 3 mol% yttria-stabilized zirconia Materials and Manufacturing Processes. 32: 549-556. DOI: 10.1080/10426914.2016.1232814  0.31
2017 Cen X, Thron AM, Benthem Kv. In-situ study of the dewetting behavior of Au/Ni bilayer films supported by a SiO2/Si substrate Acta Materialia. 140: 149-156. DOI: 10.1016/J.Actamat.2017.08.027  0.465
2016 Cen X, Thron AM, Zhang X, van Benthem K. Cross-sectional characterization of the dewetting of a Au/Ni bilayer film. Ultramicroscopy. PMID 27324837 DOI: 10.1016/J.Ultramic.2016.06.004  0.7
2016 Cen X, Thron A, Zhang X, Benthem Kv. Dewetting Transitions of Au/Ni Bilayer Films Microscopy and Microanalysis. 22: 1628-1629. DOI: 10.1017/S1431927616008989  0.373
2016 Cen X, Zhang X, Thron AM, van Benthem K. Agglomeration and long-range edge retraction for Au/Ni bilayer films during thermal annealing Acta Materialia. 119: 167-176. DOI: 10.1016/J.Actamat.2016.08.021  0.446
2014 Thron AM, Greene P, Liu K, van Benthem K. In-situ observation of equilibrium transitions in Ni films; agglomeration and impurity effects. Ultramicroscopy. 137: 55-65. PMID 24321382 DOI: 10.1016/J.Ultramic.2013.11.004  0.697
2013 Chan J, Balakchiev M, Thron AM, Chapman RA, Riley D, Song SC, Jain A, Blatchford J, Shaw JB, Van Benthem K, Vogel EM, Hinkle CL. PtSi dominated Schottky barrier heights of Ni(Pt)Si contacts due to Pt segregation Applied Physics Letters. 102. DOI: 10.1063/1.4799277  0.336
2013 Hihath S, Riechers P, Thron A, van Benthem K, Kiehl R, Murray C, Chen J. Characterization of the Interface Between Fe3O4 Nanoparticles and a GaAs Substrate As a Platform For Next Generation Spintronic Devices Microscopy and Microanalysis. 19: 1650-1651. DOI: 10.1017/S1431927613010246  0.304
2013 Thron AM, Greene P, Liu K, Benthem Kv. In-situ Heating Investigations of Dewetting Transtions in Ultra-Thin Ni films on SiO2 Layers Microscopy and Microanalysis. 19: 450-451. DOI: 10.1017/S1431927613004248  0.413
2013 Thron AM, Pennycook TJ, Chan J, Luo W, Jain A, Riley D, Blatchford J, Shaw J, Vogel EM, Hinkle CL, Van Benthem K. Formation of pre-silicide layers below Ni1-xPt xSi/Si interfaces Acta Materialia. 61: 2481-2488. DOI: 10.1016/J.Actamat.2013.01.022  0.406
2012 Matsuno M, Bonifacio CS, Rufner JF, Thron AM, Holland TB, Mukherjee AK, Van Benthem K. In situ transmission electron microscopic investigations of reduction-oxidation reactions during densification of nickel nanoparticles Journal of Materials Research. 27: 2431-2440. DOI: 10.1557/Jmr.2012.256  0.638
2012 Schwarz S, Thron AM, Rufner J, Van Benthem K, Guillon O. Low temperature sintering of nanocrystalline zinc oxide: Effect of heating rate achieved by field assisted sintering/spark plasma sintering Journal of the American Ceramic Society. 95: 2451-2457. DOI: 10.1111/J.1551-2916.2012.05205.X  0.31
2012 Thron A, van Benthem K, Chan J, Hinkle C, Pennycook T, Pennycook S, Jain A. Substitutional and Interstitial Diffusion of Ni across the NiSi/Si interface Microscopy and Microanalysis. 18: 344-345. DOI: 10.1017/S1431927612003571  0.318
2012 Thron AM, Greene PK, Liu K, Benthem KV. Structural changes during the reaction of Ni thin films with (1 0 0) silicon substrates Acta Materialia. 60: 2668-2678. DOI: 10.1016/J.Actamat.2012.01.033  0.45
2011 Thron A, Greene P, Liu K, Benthem Kv. Wetting-Dewetting Transitions of Ultrathin Nickel Films Deposited on Silicon (100) Substrates Microscopy and Microanalysis. 17: 1328-1329. DOI: 10.1017/S1431927611007513  0.344
2011 Matsuno M, Bonifacio C, Thron A, Rufner J, Holland T, Benthem Kv. In situ Sintering of Ni Nanoparticles by Controlled Heating Microscopy and Microanalysis. 17: 524-525. DOI: 10.1017/S1431927611003497  0.611
2010 Holland TB, Thron AM, Bonifacio CS, Mukherjee AK, Van Benthem K. Field assisted sintering of nickel nanoparticles during in situ transmission electron microscopy Applied Physics Letters. 96. DOI: 10.1063/1.3452327  0.636
2010 Thron A, Greene P, Liu K, Benthem Kv. Atomic Level Mechanisms of Solid-State Dewetting in Thin Metal Films Deposited on Silicon (100) Substrates Microscopy and Microanalysis. 16: 1462-1463. DOI: 10.1017/S1431927610061258  0.366
2010 Benthem Kv, Bonifacio C, Thron A, Weil S, Holland T. Investigation of Dielectric Breakdown on the Atomic Length-Scale Using In Situ STM-TEM Microscopy and Microanalysis. 16: 1750-1751. DOI: 10.1017/S1431927610061106  0.596
2010 Bonifacio C, Thron A, Bersuker G, Benthem Kv. In Situ Investigation of Dielectric Breakdown in Field Effect Transistors Microscopy and Microanalysis. 16: 1298-1299. DOI: 10.1017/S1431927610058666  0.588
2009 Bonifacio CS, Thron AM, Pennycook SJ, Contescu CI, Gallego NC, Van Benthem K. Atomic Resolution Investigation of Metal-Assisted Hydrogen Storage Mechanisms in Activated Carbon Fibers Microscopy and Microanalysis. 15: 1426-1427. DOI: 10.1017/S1431927609099073  0.591
2009 Thron AM, Bonifacio CS, Erdman N, Harrison MA, Somarajan S, Dickerson JH, Van Benthem K. Characterization of EuS nanotubes in quantum confinement Microscopy and Microanalysis. 15: 1178-1179. DOI: 10.1017/S1431927609098778  0.561
Show low-probability matches.