Robert Joseph Lad - Publications

Affiliations: 
The University of Maine, Orono, ME, United States 
Area:
Condensed Matter Physics
Website:
https://physics.umaine.edu/robert-j-lad/

50 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2015 Stewart DM, Frankel DJ, Lad RJ. Growth, structure, and high temperature stability of zirconium diboride thin films Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 33. DOI: 10.1116/1.4916565  0.445
2015 Sell JC, Stewart DM, Bernhardt GP, Frankel DJ, Lad RJ. Electrically stable nanocomposite thin films formed by oxidation of Pt-ZrB2 nanolaminate templates Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics. 33. DOI: 10.1116/1.4914313  0.425
2015 Stewart DM, Meulenberg RW, Lad RJ. Nanostructure and bonding of zirconium diboride thin films studied by X-ray spectroscopy Thin Solid Films. DOI: 10.1016/J.Tsf.2015.06.063  0.43
2015 Frankel DJ, Moulzolf SC, da Cunha MP, Lad RJ. Influence of composition and multilayer architecture on electrical conductivity of high temperature Pt-alloy films Surface and Coatings Technology. 284: 215-221. DOI: 10.1016/j.surfcoat.2015.08.074  0.385
2014 Pollock EB, Lad RJ. Influence of dosing sequence and film thickness on structure and resistivity of Al-ZnO films grown by atomic layer deposition Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 32. DOI: 10.1116/1.4885063  0.365
2014 Bernhardt GP, Krassikoff JI, Sturtevant BT, Lad RJ. Properties of amorphous SiAlON thin films grown by RF magnetron co-sputtering Surface and Coatings Technology. 258: 1191-1195. DOI: 10.1016/j.surfcoat.2014.07.011  0.478
2014 Moulzolf SC, Frankel DJ, Pereira Da Cunha M, Lad RJ. High temperature stability of electrically conductive Pt-Rh/ZrO2 and Pt-Rh/HfO2 nanocomposite thin film electrodes Microsystem Technologies. 20: 523-531. DOI: 10.1007/s00542-013-1974-x  0.417
2013 Moulzolf SC, Frankel DJ, Da Cunha MP, Lad RJ. Electrically conductive Pt-Rh/ZrO2 and Pt-Rh/HfO2 nanocomposite electrodes for high temperature harsh environment sensors Proceedings of Spie - the International Society For Optical Engineering. 8763. DOI: 10.1117/12.2017596  0.41
2011 Moulzolf SC, Frankel DJ, Bernhardt GP, Nugent B, Lad RJ. Thin film electrodes and passivation coatings for harsh environment microwave acoustic sensors Proceedings of Spie - the International Society For Optical Engineering. 8066. DOI: 10.1117/12.886602  0.325
2011 Deniz D, Lad RJ. Temperature threshold for nanorod structuring of metal and oxide films grown by glancing angle deposition Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 29. DOI: 10.1116/1.3525882  0.469
2010 Steeves MM, Lad RJ. Influence of nanostructure on charge transport in Ru O2 thin films Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 28: 906-911. DOI: 10.1116/1.3273945  0.663
2010 Steeves MM, Deniz D, Lad RJ. Charge transport in flat and nanorod structured ruthenium thin films Applied Physics Letters. 96. DOI: 10.1063/1.3377006  0.638
2010 Deniz D, Frankel DJ, Lad RJ. Nanostructured tungsten and tungsten trioxide films prepared by glancing angle deposition Thin Solid Films. 518: 4095-4099. DOI: 10.1016/j.tsf.2009.10.153  0.466
2010 Deniz D, Reghu A, Lad RJ. Nanostructured tin dioxide and tungsten trioxide gas sensors prepared by glancing angle deposition Ceramic Engineering and Science Proceedings. 31: 37-44.  0.333
2009 Zhang X, Byrne MS, Lad RJ. Structure and optical properties of Zr1-xSixN thin films on sapphire Thin Solid Films. 518: 1522-1526. DOI: 10.1016/j.tsf.2009.09.025  0.423
2008 Frankel DJ, Bernhardt GP, Sturtevant BT, Moonlight T, Pereira Da Cunha M, Lad RJ. Stable electrodes and ultrathin passivation coatings for high temperature sensors in harsh environments Proceedings of Ieee Sensors. 82-85. DOI: 10.1109/ICSENS.2008.4716388  0.329
2007 Rivers SB, Bernhardt G, Wright MW, Frankel DJ, Steeves MM, Lad RJ. Structure, conductivity, and optical absorption of Ag2-xO films Thin Solid Films. 515: 8684-8688. DOI: 10.1016/j.tsf.2007.03.139  0.645
2007 Unertl WN, Lad RJ, Smallwood SA. Nanometer-scale contact mechanics of tungsten-gold contacts in ultra-high vacuum Materials Research Society Symposium Proceedings. 1021: 29-40.  0.587
2006 Doucette LD, Christensen TM, DeSisto WJ, Lad RJ. CrO2 (1 0 0) and TiO2 (1 0 0) film heteroepitaxy on a BaF2 (1 1 1)/Si (1 0 0) substrate Journal of Crystal Growth. 290: 653-659. DOI: 10.1016/j.jcrysgro.2006.01.040  0.328
2004 Bock FX, Christensen TM, Rivers SB, Doucette LD, Lad RJ. Growth and structure of silver and silver oxide thin films on sapphire Thin Solid Films. 468: 57-64. DOI: 10.1016/j.tsf.2004.04.009  0.396
2003 Doucette LD, Santiago F, Moran SL, Lad RJ. Heteroepitaxial growth of tungsten oxide films on silicon(100) using a BaF 2 buffer layer Journal of Materials Research. 18: 2859-2868.  0.37
2003 Krassikoff JI, Bernhardt GP, Call M, Dunn TA, More DD, Lad RJ. Synthesis and Characterization of SiAlON Thin Film Coatings Proceedings, Annual Technical Conference - Society of Vacuum Coaters. 627-630.  0.321
2003 El Madi A, Meulendyk B, Pilling RS, Bernhardt G, Lad RJ, Frederick BG. Phase and morphology in mixed CuO-WO3 films for chemical sensing Materials Research Society Symposium - Proceedings. 751: 149-154.  0.36
2002 Moulzolf SC, Frankel DJ, Lad RJ. In situ four-point conductivity and Hall effect apparatus for vacuum and controlled atmosphere measurements of thin film materials Review of Scientific Instruments. 73: 2325. DOI: 10.1063/1.1475349  0.328
2002 LeGore LJ, Lad RJ, Moulzolf SC, Vetelino JF, Frederick BG, Kenik EA. Defects and morphology of tungsten trioxide thin films Thin Solid Films. 406: 79-86. DOI: 10.1016/S0040-6090(02)00047-0  0.432
2002 Lad RJ. Heteroepitaxy of Tungsten Oxide Films on Sapphire and Silicon for Chemiresistive Sensor Applications Proceedings of Ieee Sensors. 1: 393-397.  0.415
2001 Moulzolf SC, Ding Sa, Lad RJ. Stoichiometry and microstructure effects on tungsten oxide chemiresistive films Sensors and Actuators, B: Chemical. 77: 375-382. DOI: 10.1016/S0925-4005(01)00757-2  0.463
2001 Bernhardt G, Silvestre C, LeCursi N, Moulzolf SC, Frankel DJ, Lad RJ. Performance of Zr and Ti adhesion layers for bonding of platinum metallization to sapphire substrates Sensors and Actuators, B: Chemical. 77: 368-374. DOI: 10.1016/S0925-4005(01)00756-0  0.321
2001 LeGore LJ, Lad RJ, Vetelino JF, Frederick BG, Kenik EA. Aggregation and sticking probability of gold on tungsten trioxide films Sensors and Actuators, B: Chemical. 76: 373-379. DOI: 10.1016/S0925-4005(01)00638-4  0.327
2001 Moulzolf SC, LeGore LJ, Lad RJ. Heteroepitaxial growth of tungsten oxide films on sapphire for chemical gas sensors Thin Solid Films. 400: 56-63. DOI: 10.1016/S0040-6090(01)01447-X  0.481
2000 Moulzolf SC, Lad RJ. Diffraction studies of cubic phase stability in undoped zirconia thin films Journal of Materials Research. 15: 369-376.  0.407
1999 Greenwood OD, Moulzolf SC, Blau PJ, Lad RJ. The influence of microstructure on tribological properties of WO3 thin films Wear. 232: 84-90. DOI: 10.1016/S0043-1648(99)00255-0  0.364
1999 Moulzolf SC, Lad RJ, Blau PJ. Microstructural effects on the friction and wear of zirconia films in unlubricated sliding contact Thin Solid Films. 347: 220-225. DOI: 10.1016/S0040-6090(99)00046-2  0.378
1997 LeGore LJ, Greenwood OD, Paulus JW, Frankel DJ, Lad RJ. Controlled growth of WO3 films Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 15: 1223-1227. DOI: 10.1116/1.580599  0.449
1997 Moulzolf SC, Yu Y, Frankel DJ, Lad RJ. Properties of ZrO2 films on sapphire prepared by electron cyclotron resonance oxygen-plasma-assisted deposition Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 15: 1211-1214. DOI: 10.1116/1.580595  0.412
1997 Imaduddin S, Lad RJ. Structure and composition of oxidized aluminum on NiO(100) Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 15: 532-537.  0.488
1996 Imaduddin S, Lad RJ. Growth and stability of MgO/NiO multilayered films on single crystal NiO(100) Materials Research Society Symposium - Proceedings. 401: 507-512.  0.401
1996 Marshall DA, Barbour JC, Follstaedt DM, Howard AJ, Lad RJ. Surface morphology and microstructure of Al-O alloys grown by ECR plasma deposition Materials Research Society Symposium - Proceedings. 403: 235-240.  0.396
1995 Antonik MD, Schneider JE, Wittman EL, Snow K, Vetelino JF, Lad RJ. Microstructural effects in WO3 gas-sensing films Thin Solid Films. 256: 247-252. DOI: 10.1016/0040-6090(94)06316-8  0.452
1995 Yu Y, Lad RJ. Chemical bonding, structure, and morphology of Mg/α-Al2O3 and MgO/α-Al2O3 interfaces Materials Research Society Symposium - Proceedings. 357: 47-52.  0.377
1995 Imaduddin S, Davidson AM, Lad RJ. Heteroepitaxial growth of MgO films on NiO(100) single crystal surfaces Materials Research Society Symposium - Proceedings. 357: 177-182.  0.34
1993 Imaduddin S, Lad RJ. Aluminum deposition on NiO(100): growth, structure and composition of the interface Surface Science. 290: 35-44. DOI: 10.1016/0039-6028(93)90586-9  0.435
1992 Cavicchi RE, Semancik S, Antonik MD, Lad RJ. Layer-by-layer growth of epitaxial SnO2 on sapphire by reactive sputter deposition Applied Physics Letters. 61: 1921-1923. DOI: 10.1063/1.108364  0.44
1988 Lad RJ, Henrich VE. Structure of α-Fe2O3 single crystal surfaces following Ar+ ion bombardment and annealing in O2 Surface Science. 193: 81-93. DOI: 10.1016/0039-6028(88)90324-X  0.305
1987 Lad RJ, Blakely JM. Initial oxidation and sulfidation of a Ni60Fe40(100) alloy surface Surface Science. 179: 467-482. DOI: 10.1016/0039-6028(87)90070-7  0.583
1986 Lad RJ, Blakely JM. Breakup of oxide films on a Ni-Fe(100) surface by S2 impingement Applied Surface Science. 27: 318-328. DOI: 10.1016/0169-4332(86)90136-4  0.59
1985 Lad RJ, Schrott AG, Blakely JA. Oxidation of Ni60Fe40(100) in the presence of sulfur Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 3: 1282-1286. DOI: 10.1116/1.573087  0.31
1984 Lad RJ, Schrott AG, Blakely JM. Surface Phases for Sulfur and Oxygen Coadsorbed on Ni60Fe40(100) Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 2: 856-860. DOI: 10.1116/1.572526  0.557
1980 Lad RJ, Funkenbusch PD, Aita CR. POSTDEPOSITION ANNEALING BEHAVIOR OF rf SPUTTERED ZnO FILMS Journal of Vacuum Science &Amp; Technology. 17: 808-811. DOI: 10.1116/1.570565  0.411
1980 Aita CR, Lad RJ, Tisone TC. The effect of rf power on reactively sputtered zinc oxide Journal of Applied Physics. 51: 6405-6410. DOI: 10.1063/1.327585  0.393
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