Tilo Baumbach - Publications

Affiliations: 
Physics Karlsruher Institut für Technologie 

211 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2020 Reich S, Göttlicher J, Ziefuss A, Streubel R, Letzel A, Menzel A, Mathon O, Pascarelli S, Baumbach T, Zuber M, Gökce B, Barcikowski S, Plech A. In situ speciation and spatial mapping of Zn products during pulsed laser ablation in liquids (PLAL) by combined synchrotron methods. Nanoscale. PMID 32579650 DOI: 10.1039/D0Nr01500H  0.373
2020 Mescher H, Schackmar F, Eggers H, Abzieher T, Zuber M, Hamann E, Baumbach T, Richards BS, Hernandez-Sosa G, Paetzold UW, Lemmer U. Flexible Inkjet-Printed Triple Cation Perovskite X-ray Detectors. Acs Applied Materials & Interfaces. PMID 32182029 DOI: 10.1021/Acsami.9B14649  0.427
2020 Camattari R, Romagnoni M, Bandiera L, Bagli E, Mazzolari A, Sytov A, Haaga S, Kabukcuoglu M, Bode S, Hänschke D, Danilewsky A, Baumbach T, Bellucci V, Guidi V, Cavoto G. X-ray characterization of self-standing bent Si crystal plates for Large Hadron Collider beam extraction Journal of Applied Crystallography. 53: 486-493. DOI: 10.1107/S1600576720002800  0.371
2020 Kalt J, Sternik M, Krause B, Sergueev I, Mikolasek M, Bessas D, Sikora O, Vitova T, Göttlicher J, Steininger R, Jochym PT, Ptok A, Leupold O, Wille H-, Chumakov AI, ... ... Baumbach T, et al. Lattice dynamics and polarization-dependent phonon damping in α-phase FeSi2 nanostructures Physical Review B. 101: 165406. DOI: 10.1103/Physrevb.101.165406  0.333
2019 Bauer S, Rodrigues A, Horák L, Jin X, Schneider R, Baumbach T, Holý V. Structure Quality of LuFeO Epitaxial Layers Grown by Pulsed-Laser Deposition on Sapphire/Pt. Materials (Basel, Switzerland). 13. PMID 31877688 DOI: 10.3390/Ma13010061  0.389
2019 Lazarev S, Goransson D, Borgstrom MT, Messing ME, Xu H, Dzhigaev D, Yefanov O, Bauer S, Baumbach T, Feidenhans L R, Samuelson L, Vartaniants IA. Revealing misfit dislocations in InAsxP1-x-InP core-shell nanowires by x-ray diffraction. Nanotechnology. PMID 31480023 DOI: 10.1088/1361-6528/Ab40F1  0.345
2019 Schroth P, Al Humaidi M, Feigl L, Jakob J, Al Hassan A, Davtyan A, Küpers H, Tahraoui A, Geelhaar L, Pietsch U, Baumbach T. Impact of the shadowing effect on crystal structure of patterned self-catalyzed GaAs nanowires. Nano Letters. PMID 31150261 DOI: 10.1021/Acs.Nanolett.9B00380  0.326
2019 Plech A, Krause B, Baumbach T, Zakharova M, Eon S, Girmen C, Buth G, Bracht H. Structural and Thermal Characterisation of Nanofilms by Time-Resolved X-ray Scattering. Nanomaterials (Basel, Switzerland). 9. PMID 30939755 DOI: 10.3390/Nano9040501  0.313
2019 Lazarev S, Schroth P, Grigoriev D, Riotte M, Slobodskyy T, Minkevich AA, Hu DZ, Schaadt D, Baumbach T. Role of the strained substrate in the x-ray diffraction of free-standing epitaxial nanostructures under grazing incidence conditions Physical Review B. 99: 195432. DOI: 10.1103/Physrevb.99.195432  0.41
2018 Weinhardt V, Shkarin R, Wernet T, Wittbrodt J, Baumbach T, Loosli F. Quantitative morphometric analysis of adult teleost fish by X-ray computed tomography. Scientific Reports. 8: 16531. PMID 30410001 DOI: 10.1038/S41598-018-34848-Z  0.353
2018 Bauer S, Rodrigues A, Baumbach T. Real time in situ x-ray diffraction study of the crystalline structure modification of BaSrTiO during the post-annealing. Scientific Reports. 8: 11969. PMID 30097626 DOI: 10.1038/S41598-018-30392-Y  0.373
2018 Rolo TdS, Reich S, Karpov D, Gasilov S, Kunka D, Fohtung E, Baumbach T, Plech A. A Shack-Hartmann sensor for single-shot multi-contrast imaging with hard X-rays Applied Sciences. 8: 737. DOI: 10.3390/App8050737  0.746
2018 Asadchikov V, Buzmakov A, Chukhovskii F, Dyachkova I, Zolotov D, Danilewsky A, Baumbach T, Bode S, Haaga S, Hänschke D, Kabukcuoglu M, Balzer M, Caselle M, Suvorov E. X-ray topo-tomography studies of linear dislocations in silicon single crystals Journal of Applied Crystallography. 51: 1616-1622. DOI: 10.1107/S160057671801419X  0.43
2018 Reich S, Rolo TdS, Letzel A, Baumbach T, Plech A. Scalable, large area compound array refractive lens for hard X-rays Applied Physics Letters. 112: 151903. DOI: 10.1063/1.5022748  0.414
2018 Kornemann E, Márkus O, Opolka A, Sawhney K, Cecilia A, Hurst M, Baumbach T, Mohr J. Optical Characterization of an X-ray Zoom Lens Microscopy and Microanalysis. 24: 270-271. DOI: 10.1017/S1431927618013685  0.366
2018 Rodrigues A, Bauer S, Baumbach T. Effect of post-annealing on the chemical state and crystalline structure of PLD Ba0.5Sr0.5TiO3 films analyzed by combined synchrotron X-ray diffraction and X-ray photoelectron spectroscopy Ceramics International. 44: 16017-16024. DOI: 10.1016/J.Ceramint.2018.06.038  0.352
2017 Schroth P, Jakob J, Feigl L, Mostafavi Kashani SM, Vogel J, Strempfer J, Keller TF, Pietsch U, Baumbach T. Radial Growth of Self-Catalyzed GaAs Nanowires and the Evolution of the Liquid Ga-Droplet Studied by Time-Resolved in Situ X-ray Diffraction. Nano Letters. PMID 29283268 DOI: 10.1021/Acs.Nanolett.7B03486  0.338
2017 Hänschke D, Danilewsky A, Helfen L, Hamann E, Baumbach T. Correlated Three-Dimensional Imaging of Dislocations: Insights into the Onset of Thermal Slip in Semiconductor Wafers. Physical Review Letters. 119: 215504. PMID 29219418 DOI: 10.1103/Physrevlett.119.215504  0.385
2017 Faragó T, Mikulík P, Ershov A, Vogelgesang M, Hänschke D, Baumbach T. syris: a flexible and efficient framework for X-ray imaging experiments simulation. Journal of Synchrotron Radiation. 24: 1283-1295. PMID 29091072 DOI: 10.1107/S1600577517012255  0.365
2017 Gasilov S, Mittone A, Rolo TdS, Polyakov S, Zholudev S, Terentyev S, Blank V, Bravin A, Baumbach T. Refraction and ultra-small-angle scattering of X-rays in a single-crystal diamond compound refractive lens. Journal of Synchrotron Radiation. 24: 1137-1145. PMID 29091056 DOI: 10.1107/S1600577517012772  0.385
2017 Gasilov S, Rolo TDS, Mittone A, Polyakov S, Terentyev S, Farago T, Blank V, Bravin A, Baumbach T. Generalized pupil function of a compound X-ray refractive lens. Optics Express. 25: 25090-25097. PMID 29041180 DOI: 10.1364/Oe.25.025090  0.361
2017 Zuber M, Laaß M, Hamann E, Kretschmer S, Hauschke N, van de Kamp T, Baumbach T, Koenig T. Augmented laminography, a correlative 3D imaging method for revealing the inner structure of compressed fossils. Scientific Reports. 7: 41413. PMID 28128302 DOI: 10.1038/Srep41413  0.334
2017 Schröter TJ, Koch F, Meyer P, Baumann M, Münch D, Kunka D, Engelhardt S, Zuber M, Baumbach T, Mohr J. Large area gratings by x-ray LIGA dynamic exposure for x-ray phase-contrast imaging Journal of Micro-Nanolithography Mems and Moems. 16: 13501-13501. DOI: 10.1117/1.Jmm.16.1.013501  0.436
2017 Krause B, Stüber M, Zimina A, Steininger R, Trappen M, Ulrich S, Kashani SMM, Baumbach T. Theoretical and experimental study of the gradient properties and the resulting local crystalline structure and orientation in magnetron-sputtered CrAlN coatings with lateral composition and thickness gradient Journal of Applied Crystallography. 50: 1000-1010. DOI: 10.1107/S1600576717006513  0.312
2017 Schröter TJ, Koch F, Kunka D, Meyer P, Tietze S, Engelhardt S, Zuber M, Baumbach T, Willer K, Birnbacher L, Prade F, Pfeiffer F, Reichert K, Hofmann A, Mohr J. Large-area full field X-ray differential phase-contrast imaging using 2D tiled gratings Journal of Physics D. 50: 225401. DOI: 10.1088/1361-6463/Aa6E85  0.419
2017 Reich S, Göttlicher J, Letzel A, Gökce B, Barcikowski S, dos Santos Rolo T, Baumbach T, Plech A. X-ray spectroscopic and stroboscopic analysis of pulsed-laser ablation of Zn and its oxidation Applied Physics A. 124. DOI: 10.1007/S00339-017-1503-3  0.369
2016 Krause B, Abadias G, Michel A, Wochner P, Ibrahimkutty S, Baumbach T. Direct Observation of the Thickness-Induced Crystallization and Stress Build-Up during Sputter-Deposition of Nanoscale Silicide Films. Acs Applied Materials & Interfaces. 8: 34888-34895. PMID 27998117 DOI: 10.1021/Acsami.6B12413  0.358
2016 Suchomski C, Breitung B, Witte R, Knapp M, Bauer S, Baumbach T, Reitz C, Brezesinski T. Microwave synthesis of high-quality and uniform 4 nm ZnFe2O4 nanocrystals for application in energy storage and nanomagnetics. Beilstein Journal of Nanotechnology. 7: 1350-1360. PMID 27826509 DOI: 10.3762/Bjnano.7.126  0.353
2016 Gasilov S, Mittone A, Horng A, Geith T, Bravin A, Baumbach T, Coan P. Hard X-ray index of refraction tomography of a whole rabbit knee joint: A feasibility study. Physica Medica. 32: 1785-1789. PMID 27793538 DOI: 10.1016/J.Ejmp.2016.10.001  0.373
2016 Vogelgesang M, Farago T, Morgeneyer TF, Helfen L, Dos Santos Rolo T, Myagotin A, Baumbach T. Real-time image-content-based beamline control for smart 4D X-ray imaging. Journal of Synchrotron Radiation. 23: 1254-63. PMID 27577784 DOI: 10.1107/S1600577516010195  0.381
2016 Nelson G, Kirian RA, Weierstall U, Zatsepin NA, Faragó T, Baumbach T, Wilde F, Niesler FB, Zimmer B, Ishigami I, Hikita M, Bajt S, Yeh SR, Rousseau DL, Chapman HN, et al. Three-dimensional-printed gas dynamic virtual nozzles for x-ray laser sample delivery. Optics Express. 24: 11515-30. PMID 27410079 DOI: 10.1364/Oe.24.011515  0.413
2016 Yang Y, Cheng Y, Heine R, Baumbach T. Contrast transfer functions for Zernike phase contrast in full-field transmission hard X-ray microscopy. Optics Express. 24: 6063-6070. PMID 27136800 DOI: 10.1364/Oe.24.006063  0.426
2016 Voropaev A, Myagotin A, Helfen L, Baumbach T. Direct Fourier Inversion Reconstruction Algorithm for Computed Laminography. Ieee Transactions On Image Processing : a Publication of the Ieee Signal Processing Society. PMID 27046874 DOI: 10.1109/Tip.2016.2546547  0.3
2016 Koenig T, Zuber M, Trimborn B, Farago T, Meyer P, Kunka D, Albrecht F, Kreuer S, Volk T, Fiederle M, Baumbach T. On the origin and nature of the grating interferometric dark-field contrast obtained with low-brilliance x-ray sources. Physics in Medicine and Biology. 61: 3427-42. PMID 27046451 DOI: 10.1088/0031-9155/61/9/3427  0.441
2016 Köhl M, Schroth P, Baumbach T. Perspectives and limitations of symmetric X-ray Bragg reflections for inspecting polytypism in nanowires. Journal of Synchrotron Radiation. 23: 487-500. PMID 26917137 DOI: 10.1107/S1600577516000333  0.436
2016 Hofmann R, Schober A, Hahn S, Moosmann J, Kashef J, Hertel M, Weinhardt V, Hänschke D, Helfen L, Sánchez Salazar IA, Guigay JP, Xiao X, Baumbach T. Gauging low-dose X-ray phase-contrast imaging at a single and large propagation distance. Optics Express. 24: 4331-48. PMID 26907079 DOI: 10.1364/Oe.24.004331  0.367
2016 Grigoriev DA, Lazarev S, Schroth P, Minkevich AA, Köhl M, Slobodskyy T, Helfrich MF, Schaadt DM, Aschenbrenner T, Hommel D, Baumbach T. Asymmetric skew X-ray diffraction at fixed incidence angle: application to semiconductor nano-objects Journal of Applied Crystallography. 49: 961-967. DOI: 10.1107/S1600576716006385  0.435
2016 Koenig T, Zuber M, Trimborn B, Farago T, Meyer P, Kunka D, Albrecht F, Kreuer S, Volk T, Fiederle M, Baumbach T. On the origin and nature of the grating interferometric dark-field contrast obtained with low-brilliance x-ray sources Physics in Medicine and Biology. 61: 3427-3442. DOI: 10.1088/0031-9155/61/9/3427  0.333
2016 Seiler A, Ibrahimkutty S, Wochner P, Pradip R, Waller O, Krause B, Plech A, Baumbach T, Fiederle M, Stankov S. Thermal Stability Studies of DySi2 Nanowires and Nanoislands by in Situ GISAXS Journal of Physical Chemistry C. 120: 7365-7372. DOI: 10.1021/Acs.Jpcc.5B12583  0.316
2016 Nichelatti E, Bonfigli F, Vincenti MA, Cecilia A, Vagovič P, Baumbach T, Montereali RM. Broadband X-ray edge-enhancement imaging of a boron fibre on lithium fluoride thin film detector Nuclear Instruments & Methods in Physics Research Section a-Accelerators Spectrometers Detectors and Associated Equipment. 833: 68-76. DOI: 10.1016/J.Nima.2016.07.005  0.439
2016 Debastiani R, Simon R, Batchelor D, Dellagustin G, Baumbach T, Fiederle M. Synchrotron-based scanning macro-X-ray fluorescence applied to fragments of Roman mural paintings Microchemical Journal. 126: 438-445. DOI: 10.1016/J.Microc.2015.12.014  0.341
2016 Debastiani R, Simon R, Goettlicher J, Heissler S, Steininger R, Batchelor D, Fiederle M, Baumbach T. Identification of green pigments from fragments of Roman mural paintings of three Roman sites from north of Germania Superior Applied Physics A. 122: 871. DOI: 10.1007/S00339-016-0400-5  0.356
2016 Issenmann D, Eon S, Bracht H, Hettich M, Dekorsy T, Buth G, Steininger R, Baumbach T, Lundsgaard Hansen J, Nylandsted Larsen A, Ager JW, Haller EE, Plech A. Ultrafast study of phonon transport in isotopically controlled semiconductor nanostructures Physica Status Solidi (a) Applications and Materials Science. 213: 541-548. DOI: 10.1002/Pssa.201532462  0.34
2016 Asadchikov VE, Butashin AV, Buzmakov AV, Deryabin AN, Kanevsky VM, Prokhorov IA, Roshchin BS, Volkov YO, Zolotov DA, Jafari A, Alexeev P, Cecilia A, Baumbach T, Bessas D, Danilewsky AN, et al. Single-crystal sapphire microstructure for high-resolution synchrotron X-ray monochromators Crystal Research and Technology. 51: 290-298. DOI: 10.1002/Crat.201500343  0.392
2015 Trimborn B, Meyer P, Kunka D, Zuber M, Albrecht F, Kreuer S, Volk T, Baumbach T, Koenig T. Imaging properties of high aspect ratio absorption gratings for use in preclinical x-ray grating interferometry. Physics in Medicine and Biology. 61: 527-541. PMID 26683256 DOI: 10.1088/0031-9155/61/2/527  0.389
2015 Vagovič P, Korytár D, Cecilia A, Hamann E, Baumbach T, Pelliccia D. Laboratory-based multi-modal X-ray microscopy and micro-CT with Bragg magnifiers Optics Express. 23: 18391-18400. PMID 26191897 DOI: 10.1364/Oe.23.018391  0.437
2015 Li ZJ, Danilewsky AN, Helfen L, Mikulik P, Haenschke D, Wittge J, Allen D, McNally P, Baumbach T. Local strain and defects in silicon wafers due to nanoindentation revealed by full-field X-ray microdiffraction imaging. Journal of Synchrotron Radiation. 22: 1083-90. PMID 26134815 DOI: 10.1107/S1600577515009650  0.401
2015 Gasilov S, Mittone A, Horng A, Bravin A, Baumbach T, Geith T, Reiser M, Coan P. Boundary value problem for phase retrieval from unidirectional X-ray differential phase images. Optics Express. 23: 13294-308. PMID 26074580 DOI: 10.1364/Oe.23.013294  0.342
2015 Bauer S, de Biasi L, Glatthaar S, Toukam L, Gesswein H, Baumbach T. In operando study of the high voltage spinel cathode material LiNi(0.5)Mn(1.5)O4 using two dimensional full-field spectroscopic imaging of Ni and Mn. Physical Chemistry Chemical Physics : Pccp. 17: 16388-97. PMID 26051380 DOI: 10.1039/C5Cp02075A  0.336
2015 Schroth P, Köhl M, Hornung JW, Dimakis E, Somaschini C, Geelhaar L, Biermanns A, Bauer S, Lazarev S, Pietsch U, Baumbach T. Evolution of polytypism in GaAs nanowires during growth revealed by time-resolved in situ x-ray diffraction. Physical Review Letters. 114: 055504. PMID 25699455 DOI: 10.1103/Physrevlett.114.055504  0.395
2015 Ibrahimkutty S, Seiler A, Prüßmann T, Vitova T, Pradip R, Bauder O, Wochner P, Plech A, Baumbach T, Stankov S. A portable ultrahigh-vacuum system for advanced synchrotron radiation studies of thin films and nanostructures: EuSi2 nano-islands. Journal of Synchrotron Radiation. 22: 91-8. PMID 25537593 DOI: 10.1107/S1600577514019705  0.4
2015 Kaufholz M, Krause B, Kotapati S, Köhl M, Mantilla MF, Stüber M, Ulrich S, Schneider R, Gerthsen D, Baumbach T. Monitoring the thin film formation during sputter deposition of vanadium carbide. Journal of Synchrotron Radiation. 22: 76-85. PMID 25537591 DOI: 10.1107/S1600577514024412  0.315
2015 Köhl M, Schroth P, Minkevich AA, Hornung JW, Dimakis E, Somaschini C, Geelhaar L, Aschenbrenner T, Lazarev S, Grigoriev D, Pietsch U, Baumbach T. Polytypism in GaAs nanowires: determination of the interplanar spacing of wurtzite GaAs by X-ray diffraction. Journal of Synchrotron Radiation. 22: 67-75. PMID 25537590 DOI: 10.1107/S1600577514023480  0.368
2015 Verboven P, Herremans E, Helfen L, Ho QT, Abera M, Baumbach T, Wevers M, Nicolaï BM. Synchrotron X-ray computed laminography of the three-dimensional anatomy of tomato leaves. The Plant Journal : For Cell and Molecular Biology. 81: 169-82. PMID 25319143 DOI: 10.1111/Tpj.12701  0.338
2015 Hamann E, Koenig T, Zuber M, Cecilia A, Tyazhev A, Tolbanov O, Procz S, Fauler A, Baumbach T, Fiederle M. Performance of a Medipix3RX spectroscopic pixel detector with a high resistivity gallium arsenide sensor. Ieee Transactions On Medical Imaging. 34: 707-15. PMID 24759983 DOI: 10.1109/Tmi.2014.2317314  0.338
2015 Zuber M, Koenig T, Hussain R, Hamann E, Ballabriga R, Campbell M, Fauler A, Fiederle M, Baumbach T. Reducing the formation of image artifacts during spectroscopic micro-CT acquisitions Progress in Biomedical Optics and Imaging - Proceedings of Spie. 9412. DOI: 10.1117/12.2077685  0.364
2015 Stevanovic U, Caselle M, Cecilia A, Chilingaryan S, Farago T, Gasilov S, Herth A, Kopmann A, Vogelgesang M, Balzer M, Baumbach T, Weber M. A Control System and Streaming DAQ Platform with Image-Based Trigger for X-ray Imaging Ieee Transactions On Nuclear Science. 62: 911-918. DOI: 10.1109/Tns.2015.2425911  0.396
2015 Bauer S, Lazarev S, Bauer M, Meisch T, Caliebe M, Holý V, Scholz F, Baumbach T. Three-dimensional reciprocal space mapping with a two-dimensional detector as a low-latency tool for investigating the influence of growth parameters on defects in semipolar GaN Journal of Applied Crystallography. 48: 1000-1010. DOI: 10.1107/S1600576715009085  0.314
2015 Zuber M, Hamann E, Ballabriga R, Campbell M, Fiederle M, Baumbach T, Koenig T. An investigation into the temporal stability of CdTe-based photon counting detectors during spectral micro-CT acquisitions Biomedical Physics & Engineering Express. 1: 25205. DOI: 10.1088/2057-1976/1/2/025205  0.349
2015 Hamann E, Koenig T, Zuber M, Cecilia A, Tyazhev A, Tolbanov O, Procz S, Fauler A, Fiederle M, Baumbach T. Investigation of GaAs:Cr Timepix assemblies under high flux irradiation Journal of Instrumentation. 10. DOI: 10.1088/1748-0221/10/01/C01047  0.394
2015 Krause B, Kaufholz M, Kotapati S, Schneider R, Müller E, Gerthsen D, Wochner P, Baumbach T. Angle-resolved X-ray reflectivity measurements during off-normal sputter deposition of VN Surface and Coatings Technology. 277: 52-57. DOI: 10.1016/J.Surfcoat.2015.07.030  0.36
2014 Vagovi? P, Svéda L, Cecilia A, Hamann E, Pelliccia D, Gimenez EN, Korytár D, Pavlov KM, Zápražný Z, Zuber M, Koenig T, Olbinado M, Yashiro W, Momose A, Fiederle M, ... Baumbach T, et al. X-ray Bragg magnifier microscope as a linear shift invariant imaging system: image formation and phase retrieval. Optics Express. 22: 21508-20. PMID 25321529 DOI: 10.1364/Oe.22.021508  0.373
2014 Koenig T, Zuber M, Hamann E, Cecilia A, Ballabriga R, Campbell M, Ruat M, Tlustos L, Fauler A, Fiederle M, Baumbach T. How spectroscopic x-ray imaging benefits from inter-pixel communication. Physics in Medicine and Biology. 59: 6195-213. PMID 25255737 DOI: 10.1088/0031-9155/59/20/6195  0.353
2014 Minkevich AA, Köhl M, Escoubas S, Thomas O, Baumbach T. Retrieval of the atomic displacements in the crystal from the coherent X-ray diffraction pattern. Journal of Synchrotron Radiation. 21: 774-783. PMID 24971974 DOI: 10.1107/S1600577514010108  0.398
2014 Bykova Iu, Weinhardt V, Kashkarova A, Lebedev S, Baumbach T, Pichugin V, Zaitsev K, Khlusov I. Physical properties and biocompatibility of UHMWPE-derived materials modified by synchrotron radiation. Journal of Materials Science. Materials in Medicine. 25: 1843-52. PMID 24793194 DOI: 10.1007/S10856-014-5222-4  0.333
2014 Cheng Y, Suhonen H, Helfen L, Li J, Xu F, Grunze M, Levkin PA, Baumbach T. Direct three-dimensional imaging of polymer-water interfaces by nanoscale hard X-ray phase tomography. Soft Matter. 10: 2982-90. PMID 24695753 DOI: 10.1039/C3Sm52604F  0.384
2014 dos Santos Rolo T, Ershov A, van de Kamp T, Baumbach T. In vivo X-ray cine-tomography for tracking morphological dynamics. Proceedings of the National Academy of Sciences of the United States of America. 111: 3921-6. PMID 24594600 DOI: 10.1073/Pnas.1308650111  0.396
2014 Bauer S, Lazarev S, Molinari A, Breitenstein A, Leufke P, Kruk R, Hahn H, Baumbach T. The power of in situ pulsed laser deposition synchrotron characterization for the detection of domain formation during growth of Ba0.5Sr0.5TiO3 on MgO. Journal of Synchrotron Radiation. 21: 386-94. PMID 24562560 DOI: 10.1107/S1600577513034358  0.393
2014 Moosmann J, Ershov A, Weinhardt V, Baumbach T, Prasad MS, LaBonne C, Xiao X, Kashef J, Hofmann R. Time-lapse X-ray phase-contrast microtomography for in vivo imaging and analysis of morphogenesis. Nature Protocols. 9: 294-304. PMID 24407356 DOI: 10.1038/Nprot.2014.033  0.413
2014 Rack A, Cecilia A, Douissard P-, Dupré K, Wesemann V, Baumbach T, Couchaud M, Rochet X, Riesemeier H, Radtke M, Martin T. Thin film based scintillators for hard X-ray microimaging detectors: the Scin TAX project Proceedings of Spie. 9213: 921312. DOI: 10.1117/12.2060599  0.423
2014 Brogna AS, Balzer M, Smale S, Hartmann J, Bormann D, Hamann E, Cecilia A, Zuber M, Koenig T, Zwerger A, Weber M, Fiederle M, Baumbach T. A fast embedded readout system for large-area Medipix and Timepix systems Journal of Instrumentation. 9. DOI: 10.1088/1748-0221/9/05/C05047  0.358
2014 Zuber M, Koenig T, Hamann E, Cecilia A, Fiederle M, Baumbach T. Characterization of a 2x3 Timepix assembly with a 500μm thick silicon sensor Journal of Instrumentation. 9. DOI: 10.1088/1748-0221/9/05/C05037  0.361
2014 Yang Y, Heine R, Cheng Y, Wang C, Song Y, Baumbach T. Approaching quantitative Zernike phase contrast in full-field transmission hard X-ray microscopy: Origin and reduction of artifacts Applied Physics Letters. 105: 94101. DOI: 10.1063/1.4894276  0.409
2014 Cecilia A, Jary V, Nikl M, Mihokova E, Hänschke D, Hamann E, Douissard PA, Rack A, Martin T, Krause B, Grigorievc D, Baumbach T, Fiederle M. Investigation of the luminescence, crystallographic and spatial resolution properties of LSO:Tb scintillating layers used for X-ray imaging applications Radiation Measurements. 62: 28-34. DOI: 10.1016/J.Radmeas.2013.12.005  0.32
2014 Seiler A, Bauder O, Ibrahimkutty S, Pradip R, Prüßmann T, Vitova T, Fiederle M, Baumbach T, Stankov S. Growth and structure characterization of EuSi2 films and nanoislands on vicinal Si(001) surface Journal of Crystal Growth. 407: 74-77. DOI: 10.1016/J.Jcrysgro.2014.09.005  0.358
2014 Scholz F, Meisch T, Caliebe M, Schörner S, Thonke K, Kirste L, Bauer S, Lazarev S, Baumbach T. Growth and doping of semipolar GaN grown on patterned sapphire substrates Journal of Crystal Growth. 405: 97-101. DOI: 10.1016/J.Jcrysgro.2014.08.006  0.32
2014 Bauder O, Seiler A, Ibrahimkutty S, Merkel DG, Krause B, Rüffer R, Baumbach T, Stankov S. Temperature dependent epitaxial growth regimes of europium on the oxygen-induced c(6×2) reconstructed (110)Nb surface Journal of Crystal Growth. 400: 61-66. DOI: 10.1016/J.Jcrysgro.2014.04.012  0.305
2014 Morgeneyer TF, Taillandier-Thomas T, Helfen L, Baumbach T, Sinclair I, Roux S, Hild F. In situ 3-D observation of early strain localization during failure of thin Al alloy (2198) sheet Acta Materialia. 69: 78-91. DOI: 10.1016/J.Actamat.2014.01.033  0.335
2014 Al’tapova VR, Khlusov IA, Karpov DA, Chen F, Baumbach T, Pichugin VF. Diagnostics of 3D Scaffolds by the Method of X-Ray Phase Contrast Visualization Russian Physics Journal. 56: 1116-1123. DOI: 10.1007/S11182-014-0150-9  0.312
2014 Boden S, Rolo TdS, Baumbach T, Hampel U. Synchrotron radiation microtomography of Taylor bubbles in capillary two-phase flow Experiments in Fluids. 55: 1768. DOI: 10.1007/S00348-014-1768-7  0.318
2013 Köhl M, Schroth P, Minkevich AA, Baumbach T. Retrieving the displacement of strained nanoobjects: the impact of bounds for the scattering magnitude in direct space. Optics Express. 21: 27734-49. PMID 24514289 DOI: 10.1364/Oe.21.027734  0.343
2013 Myagotin A, Voropaev A, Helfen L, Hänschke D, Baumbach T. Efficient volume reconstruction for parallel-beam computed laminography by filtered backprojection on multi-core clusters. Ieee Transactions On Image Processing : a Publication of the Ieee Signal Processing Society. 22: 5348-61. PMID 24228274 DOI: 10.1109/Tip.2013.2285600  0.339
2013 Krause B, Darma S, Kaufholz M, Mangold S, Doyle S, Ulrich S, Leiste H, Stüber M, Baumbach T. Composition-dependent structure of polycrystalline magnetron-sputtered V-Al-C-N hard coatings studied by XRD, XPS, XANES and EXAFS. Journal of Applied Crystallography. 46: 1064-1075. PMID 24046506 DOI: 10.1107/S0021889813014477  0.381
2013 Korytár D, Vagovi? P, Végsö K, Siffalovi? P, Dobro?ka E, Jark W, A? V, Zápražný Z, Ferrari C, Cecilia A, Hamann E, Mikulík P, Baumbach T, Fiederle M, Jergel M. Potential use of V-channel Ge(220) monochromators in X-ray metrology and imaging. Journal of Applied Crystallography. 46: 945-952. PMID 24046503 DOI: 10.1107/S0021889813006122  0.379
2013 Moosmann J, Ershov A, Altapova V, Baumbach T, Prasad MS, LaBonne C, Xiao X, Kashef J, Hofmann R. X-ray phase-contrast in vivo microtomography probes new aspects of Xenopus gastrulation. Nature. 497: 374-7. PMID 23676755 DOI: 10.1038/Nature12116  0.374
2013 Vagovič P, Korytár D, Cecilia A, Hamann E, Svéda L, Pelliccia D, Härtwig J, Záprazný Z, Oberta P, Dolbnya I, Shawney K, Fleschig U, Fiederle M, Baumbach T. High-resolution high-efficiency X-ray imaging system based on the in-line Bragg magnifier and the Medipix detector. Journal of Synchrotron Radiation. 20: 153-9. PMID 23254668 DOI: 10.1107/S0909049512044366  0.427
2013 Scholz F, Forghani K, Klein M, Klein O, Kaiser U, Neuschl B, Tischer I, Feneberg M, Thonke K, Lazarev S, Bauer S, Baumbach T. Studies on Defect Reduction in AlGaN Heterostructures by Integrating an In-situ SiN Interlayer Japanese Journal of Applied Physics. 52. DOI: 10.7567/Jjap.52.08Jj07  0.331
2013 Koenig T, Hamann E, Procz S, Ballabriga R, Cecilia A, Zuber M, Llopart X, Campbell M, Fauler A, Baumbach T, Fiederle M. Charge summing in spectroscopic X-ray detectors with high-Z sensors Ieee Transactions On Nuclear Science. 60: 4713-4718. DOI: 10.1109/Tns.2013.2286672  0.369
2013 Lazarev S, Barchuk M, Bauer S, Forghani K, Holý V, Scholz F, Baumbach T. Study of threading dislocation density reduction in AlGaN epilayers by Monte Carlo simulation of high- resolution reciprocal-space maps of a two-layer system Journal of Applied Crystallography. 46: 120-127. DOI: 10.1107/S0021889812043051  0.316
2013 Cecilia A, Hamann E, Koenig T, Xu F, Cheng Y, Helfen L, Ruat M, Scheel M, Zuber M, Baumbach T, Fauler A, Fiederle M. High resolution 3D imaging of bump-bonds by means of synchrotron radiation computed laminography Journal of Instrumentation. 8. DOI: 10.1088/1748-0221/8/12/C12029  0.318
2013 Helfen L, Xu F, Suhonen H, Urbanelli L, Cloetens P, Baumbach T. Nano-laminography for three-dimensional high-resolution imaging of flat specimens Journal of Instrumentation. 8. DOI: 10.1088/1748-0221/8/05/C05006  0.39
2013 Slobodskyy T, Schroth P, Minkevich A, Grigoriev D, Fohtung E, Riotte M, Baumbach T, Powalla M, Lemmer U, Slobodskyy A. Three-dimensional reciprocal space profile of an individual nanocrystallite inside a thin-film solar cell absorber layer Journal of Physics D. 46: 475104. DOI: 10.1088/0022-3727/46/47/475104  0.721
2013 Tanner BK, Wittge J, Vagovič P, Baumbach T, Allen D, McNally PJ, Bytheway R, Jacques D, Fossati MC, Bowen DK, Garagorri J, Elizalde MR, Danilewsky AN. X-ray diffraction imaging for predictive metrology of crack propagation in 450-mm diameter silicon wafers Powder Diffraction. 28: 95-99. DOI: 10.1017/S0885715613000122  0.409
2013 Bonfigli F, Cecilia A, Bateni HS, Nichelatti E, Pelliccia D, Somma F, Vagovic P, Vincenti MA, Baumbach T, Montereali RM. In-line X-ray lensless imaging with lithium fluoride film detectors Radiation Measurements. 56: 277-280. DOI: 10.1016/J.Radmeas.2013.03.001  0.432
2013 Bateni HS, Bonfigli F, Cecilia A, Baumbach T, Pelliccia D, Somma F, Vincenti MA, Montereali RM. Optical characterisation of lithium fluoride detectors for broadband X-ray imaging Nuclear Instruments & Methods in Physics Research Section a-Accelerators Spectrometers Detectors and Associated Equipment. 720: 109-112. DOI: 10.1016/J.Nima.2012.12.023  0.421
2013 Lazarev S, Bauer S, Forghani K, Barchuk M, Scholz F, Baumbach T. High resolution synchrotron X-ray studies of phase separation phenomena and the scaling law for the threading dislocation densities reduction in high quality AlGaN heterostructure Journal of Crystal Growth. 370: 51-56. DOI: 10.1016/J.Jcrysgro.2012.07.033  0.442
2013 Bull DJ, Helfen L, Sinclair I, Spearing SM, Baumbach T. A comparison of multi-scale 3D X-ray tomographic inspection techniques for assessing carbon fibre composite impact damage Composites Science and Technology. 75: 55-61. DOI: 10.1016/J.Compscitech.2012.12.006  0.328
2013 Reischig P, Helfen L, Wallert A, Baumbach T, Dik J. High-resolution non-invasive 3D imaging of paint microstructure by synchrotron-based X-ray laminography Applied Physics A. 111: 983-995. DOI: 10.1007/S00339-013-7687-2  0.434
2012 Xu F, Helfen L, Suhonen H, Elgrabli D, Bayat S, Reischig P, Baumbach T, Cloetens P. Correlative nanoscale 3D imaging of structure and composition in extended objects. Plos One. 7: e50124. PMID 23185554 DOI: 10.1371/Journal.Pone.0050124  0.407
2012 Slobodskyy T, Schroth P, Grigoriev D, Minkevich AA, Hu DZ, Schaadt DM, Baumbach T. A portable molecular beam epitaxy system for in situ x-ray investigations at synchrotron beamlines. Review of Scientific Instruments. 83: 105112-105112. PMID 23126809 DOI: 10.1063/1.4759495  0.392
2012 Altapova V, Helfen L, Myagotin A, Hänschke D, Moosmann J, Gunneweg J, Baumbach T. Phase contrast laminography based on Talbot interferometry. Optics Express. 20: 6496-508. PMID 22418532 DOI: 10.1364/Oe.20.006496  0.347
2012 Krause B, Darma S, Kaufholz M, Gräfe HH, Ulrich S, Mantilla M, Weigel R, Rembold S, Baumbach T. Modular deposition chamber for in situ X-ray experiments during RF and DC magnetron sputtering. Journal of Synchrotron Radiation. 19: 216-22. PMID 22338682 DOI: 10.1107/S0909049511052320  0.36
2012 Helfen L, Morgeneyer TF, Xu F, Mavrogordato MN, Sinclair I, Schillinger B, Baumbach T. Synchrotron and neutron laminography for three-dimensional imaging of devices and flat material specimens International Journal of Materials Research. 103: 170-173. DOI: 10.3139/146.110668  0.397
2012 Douissard PA, Cecilia A, Rochet X, Chapel X, Martin T, Kamp Tvd, Helfen L, Baumbach T, Luquot L, Xiao X, Meinhardt J, Rack A. A versatile indirect detector design for hard X-ray microimaging Journal of Instrumentation. 7: 9016. DOI: 10.1088/1748-0221/7/09/P09016  0.419
2012 Hänschke D, Helfen L, Altapova V, Danilewsky A, Baumbach T. Three-dimensional imaging of dislocations by X-ray diffraction laminography Applied Physics Letters. 101: 244103. DOI: 10.1063/1.4769988  0.437
2012 Myagotin A, Helfen L, Baumbach T. Quantitative coalescence measurements for foaming metals by in situ radiography Scripta Materialia. 67: 775-778. DOI: 10.1016/J.Scriptamat.2012.07.011  0.301
2012 Maurel V, Helfen L, N’Guyen F, Koster A, Michiel MD, Baumbach T, Morgeneyer TF. Three-dimensional investigation of thermal barrier coatings by synchrotron-radiation computed laminography Scripta Materialia. 66: 471-474. DOI: 10.1016/J.Scriptamat.2011.12.021  0.307
2012 Schroth P, Slobodskyy T, Grigoriev D, Minkevich A, Riotte M, Lazarev S, Fohtung E, Hu DZ, Schaadt DM, Baumbach T. Investigation of buried quantum dots using grazing incidence X-ray diffraction Materials Science and Engineering B-Advanced Functional Solid-State Materials. 177: 721-724. DOI: 10.1016/J.Mseb.2011.10.012  0.724
2012 Kurinskiy P, Moeslang A, Chakin V, Slobodskyy T, Minkevich AA, Baumbach T, Dorn C-, Goraieb AA. X-ray study of surface layers of air-annealed Be12Ti and Be12V samples using synchrotron radiation Fusion Engineering and Design. 87: 872-875. DOI: 10.1016/J.Fusengdes.2012.02.047  0.404
2011 Hofmann R, Moosmann J, Baumbach T. Criticality in single-distance phase retrieval. Optics Express. 19: 25881-90. PMID 22274176 DOI: 10.1364/Oe.19.025881  0.327
2011 Vagovič P, Korytár D, Mikulík P, Cecilia A, Ferrari C, Yang Y, Hänschke D, Hamann E, Pelliccia D, Lafford TA, Fiederle M, Baumbach T. In-line Bragg magnifier based on V-shaped germanium crystals. Journal of Synchrotron Radiation. 18: 753-60. PMID 21862856 DOI: 10.1107/S090904951102989X  0.388
2011 Helfen L, Myagotin A, Mikulík P, Pernot P, Voropaev A, Elyyan M, Di Michiel M, Baruchel J, Baumbach T. On the implementation of computed laminography using synchrotron radiation. The Review of Scientific Instruments. 82: 063702. PMID 21721697 DOI: 10.1063/1.3596566  0.391
2011 Moosmann J, Hofmann R, Baumbach T. Single-distance phase retrieval at large phase shifts. Optics Express. 19: 12066-73. PMID 21716442 DOI: 10.1364/Oe.19.012066  0.325
2011 Ibrahimkutty S, Issenmann D, Schleef S, Müller AS, Mathis YL, Gasharova B, Huttel E, Steininger R, Göttlicher J, Baumbach T, Bartels A, Janke C, Plech A. Asynchronous sampling for ultrafast experiments with low momentum compaction at the ANKA ring. Journal of Synchrotron Radiation. 18: 539-45. PMID 21685668 DOI: 10.1107/S0909049511018267  0.336
2011 Minkevich AA, Fohtung E, Slobodskyy T, Riotte M, Grigoriev D, Metzger T, Irvine AC, Noávk V, Holḱ V, Baumbach T. Strain field in (Ga,Mn)As/GaAs periodic wires revealed by coherent X-ray diffraction Epl. 94. DOI: 10.1209/0295-5075/94/66001  0.726
2011 Boffo C, Walter W, Baumbach T, Casalbuoni S, Gerstl S, Grau A, Hagelstein M, Jauregui DSd. The New Conduction-Cooled Superconducting Undulator for ANKA Ieee Transactions On Applied Superconductivity. 21: 1756-1759. DOI: 10.1109/Tasc.2010.2100795  0.338
2011 Casalbuoni S, Baumbach T, Gerstl S, Grau A, Hagelstein M, Jauregui DSd, Boffo C, Steinmann J, Walter W. Training and Magnetic Field Measurements of the ANKA Superconducting Undulator Ieee Transactions On Applied Superconductivity. 21: 1760-1763. DOI: 10.1109/Tasc.2010.2085070  0.324
2011 Minkevich AA, Fohtung E, Slobodskyy T, Riotte M, Grigoriev D, Schmidbauer M, Irvine AC, Novák V, Holý V, Baumbach T. Selective coherent x-ray diffractive imaging of displacement fields in (Ga,Mn)As/GaAs periodic wires Physical Review B - Condensed Matter and Materials Physics. 84. DOI: 10.1103/Physrevb.84.054113  0.746
2011 Cecilia A, Hamann E, Haas C, Greiffenberg D, Danilewsky A, Haenscke D, Fauler A, Zwerger A, Buth G, Vagovic P, Baumbach T, Fiederle M. Investigation of crystallographic and detection properties of CdTe at the ANKA synchrotron light source Journal of Instrumentation. 6: 10016. DOI: 10.1088/1748-0221/6/10/P10016  0.372
2011 Tian T, Xu F, Kyu Han J, Choi D, Cheng Y, Helfen L, Di Michiel M, Baumbach T, Tu KN. Rapid diagnosis of electromigration induced failure time of Pb-free flip chip solder joints by high resolution synchrotron radiation laminography Applied Physics Letters. 99: 082114. DOI: 10.1063/1.3628342  0.328
2011 Barchuk M, Holý V, Miljević B, Krause B, Baumbach T. Grazing-incidence x-ray diffraction from GaN epitaxial layers with threading dislocations Applied Physics Letters. 98: 21912. DOI: 10.1063/1.3543842  0.412
2011 Helfen L, Xu F, Schillinger B, Calzada E, Zanette I, Weitkamp T, Baumbach T. Neutron laminography—a novel approach to three-dimensional imaging of flat objects with neutrons Nuclear Instruments & Methods in Physics Research Section a-Accelerators Spectrometers Detectors and Associated Equipment. 651: 135-139. DOI: 10.1016/J.Nima.2011.01.114  0.388
2011 Altapova VR, Butzer JS, Rolo TDS, Vagovic P, Cecilia A, Moosmann J, Kenntner J, Mohr J, Pelliccia D, Pichugin VF, Baumbach T. X-ray phase-contrast radiography using a filtered white beam with a grating interferometer Nuclear Instruments & Methods in Physics Research Section a-Accelerators Spectrometers Detectors and Associated Equipment. 648: 42-45. DOI: 10.1016/J.Nima.2010.12.218  0.361
2011 Cecilia A, Rack A, Douissard P-, Martin T, Rolo TdS, Vagovič P, Hamann E, Kamp Tvd, Riedel A, Fiederle M, Baumbach T. LPE grown LSO:Tb scintillator films for high-resolution X-ray imaging applications at synchrotron light sources Nuclear Instruments & Methods in Physics Research Section a-Accelerators Spectrometers Detectors and Associated Equipment. 648: 321. DOI: 10.1016/J.Nima.2010.10.150  0.416
2011 Cecilia A, Rack A, Douissard P-, Martin T, Rolo TdS, Vagovič P, Pelliccia D, Couchaud M, Dupré K, Baumbach T. Characterisation of LSO:Tb scintillator films for high resolution X-ray imaging applications Nuclear Instruments & Methods in Physics Research Section a-Accelerators Spectrometers Detectors and Associated Equipment. 633. DOI: 10.1016/J.Nima.2010.06.192  0.397
2011 Danilewsky AN, Wittge J, Croell A, Allen D, McNally P, Vagovič P, Dos Santos Rolo T, Li Z, Baumbach T, Gorostegui-Colinas E, Garagorri J, Elizalde MR, Fossati MC, Bowen DK, Tanner BK. Dislocation dynamics and slip band formation in silicon: In-situ study by X-ray diffraction imaging Journal of Crystal Growth. 318: 1157-1163. DOI: 10.1016/J.Jcrysgro.2010.10.199  0.397
2011 Danilewsky AN, Wittge J, Hess A, Cröll A, Rack A, Allen D, McNally P, Dos Santos Rolo T, Vagovič P, Baumbach T, Garagorri J, Elizalde MR, Tanner BK. Real-time X-ray diffraction imaging for semiconductor wafer metrology and high temperature in situ experiments Physica Status Solidi (a) Applications and Materials Science. 208: 2499-2504. DOI: 10.1002/Pssa.201184264  0.424
2010 Douissard PA, Cecilia A, Martin T, Chevalier V, Couchaud M, Baumbach T, Dupré K, Kühbacher M, Rack A. A novel epitaxially grown LSO-based thin-film scintillator for micro-imaging using hard synchrotron radiation. Journal of Synchrotron Radiation. 17: 571-83. PMID 20724778 DOI: 10.1107/S0909049510025938  0.414
2010 Rack A, Weitkamp T, Riotte M, Grigoriev D, Rack T, Helfen L, Baumbach T, Dietsch R, Holz T, Krämer M, Siewert F, Meduna M, Cloetens P, Ziegler E. Comparative study of multilayers used in monochromators for synchrotron-based coherent hard X-ray imaging. Journal of Synchrotron Radiation. 17: 496-510. PMID 20567082 DOI: 10.1107/S0909049510011623  0.432
2010 Xu F, Helfen L, Moffat AJ, Johnson G, Sinclair I, Baumbach T. Synchrotron radiation computed laminography for polymer composite failure studies. Journal of Synchrotron Radiation. 17: 222-6. PMID 20157275 DOI: 10.1107/S0909049510001512  0.308
2010 Wittge J, Danilewsky A, Allen D, McNally P, Li ZJ, Baumbach T, Gorostegui-Colinas E, Garagorri J, Elizalde MR, Jacques D, Fossati MC, Bowen DK, Tanner BK. X-ray diffraction imaging of dislocation generation related to microcracks in Si wafers Powder Diffraction. 25: 99-103. DOI: 10.1154/1.3392369  0.364
2010 Wittge J, Danilewsky AN, Allen D, McNally P, Li Z, Baumbach T, Gorostegui-Colinas E, Garagorri J, Elizalde MR, Jacques D, Fossati MC, Bowen DK, Tanner BK. Dislocation sources and slip band nucleation from indents on silicon wafers Journal of Applied Crystallography. 43: 1036-1039. DOI: 10.1107/S0021889810029894  0.328
2010 Slobodskyy A, Slobodskyy T, Ulyanenkova T, Doyle S, Powalla M, Baumbach T, Lemmer U. In-depth analysis of the CuIn1−xGaxSe2 film for solar cells, structural and optical characterization Applied Physics Letters. 97: 251911. DOI: 10.1063/1.3529939  0.344
2010 Barchuk M, Holý V, Miljević B, Krause B, Baumbach T, Hertkorn J, Scholz F. X-ray diffuse scattering from threading dislocations in epitaxial GaN layers Journal of Applied Physics. 108: 43521. DOI: 10.1063/1.3460803  0.373
2010 Riotte M, Fohtung E, Grigoriev D, Minkevich AA, Slobodskyy T, Schmidbauer M, Metzger TH, Hu DZ, Schaadt DM, Baumbach T. Lateral ordering, strain, and morphology evolution of InGaAs/GaAs(001) quantum dots due to high temperature postgrowth annealing Applied Physics Letters. 96: 83102. DOI: 10.1063/1.3299262  0.719
2010 Moffat AJ, Wright P, Helfen L, Baumbach T, Johnson G, Spearing SM, Sinclair I. In situ synchrotron computed laminography of damage in carbon fibre-epoxy [90/0](s) laminates Scripta Materialia. 62: 97-100. DOI: 10.1016/J.Scriptamat.2009.09.027  0.353
2010 Danilewsky A, Wittge J, Hess A, Cröll A, Allen D, McNally P, Vagovič P, Cecilia A, Li Z, Baumbach T, Gorostegui-Colinas E, Elizalde MR. Dislocation generation related to micro-cracks in Si wafers: High temperature in situ study with white beam X-ray topography Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms. 268: 399-402. DOI: 10.1016/J.Nimb.2009.09.013  0.34
2009 Modregger P, Lübbert D, Schäfer P, Richter J, Köhler R, Baumbach T. Influence of partial coherence on analyzer-based imaging with asymmetric Bragg reflection. Optics Express. 17: 11618-37. PMID 19582078 DOI: 10.1364/Oe.17.011618  0.395
2009 Rack A, García-Moreno F, Baumbach T, Banhart J. Synchrotron-based radioscopy employing spatio-temporal micro-resolution for studying fast phenomena in liquid metal foams. Journal of Synchrotron Radiation. 16: 432-4. PMID 19395811 DOI: 10.1107/S0909049509001939  0.326
2009 Dik J, Reischig P, Krug K, Wallert A, Coerdt A, Helfen L, Baumbach T. Three-dimensional Imaging of Paint Layers and Paint Substructures with Synchrotron Radiation Computed μ-laminography Journal of the American Institute For Conservation. 48: 185-197. DOI: 10.1179/019713612804514260  0.36
2009 Rack A, García-Moreno F, Banhart J, Betz O, Zabler S, Baumbach T. C-7 Synchrotron-Based Radioscopy with Spatio-Temporal Micro-Resolution Using Hard X-rays Powder Diffraction. 24: 168-168. DOI: 10.1154/1.3175955  0.391
2009 Martin T, Douissard P-, Couchaud M, Cecilia A, Baumbach T, Dupre K, Rack A. LSO-Based Single Crystal Film Scintillator for Synchrotron-Based Hard X-Ray Micro-Imaging Ieee Transactions On Nuclear Science. 56: 1412-1418. DOI: 10.1109/Tns.2009.2015878  0.444
2009 Myagotin A, Helfen L, Baumbach T. Coalescence measurements for evolving foams monitored by real-time projection imaging Measurement Science and Technology. 20: 55703. DOI: 10.1088/0957-0233/20/5/055703  0.334
2009 Cecilia A, Rack A, Pelliccia D, Douissard PA, Martin T, Couchaud M, Dupre K, Baumbach T. Studies of LSO:Tb radio-luminescence properties using white beam hard X-ray synchrotron irradiation Radiation Effects and Defects in Solids. 164: 517-522. DOI: 10.1080/10420150903092256  0.421
2009 Helfen L, Baumbach T, Cloetens P, Baruchel J. Phase-contrast and holographic computed laminography Applied Physics Letters. 94: 104103. DOI: 10.1063/1.3089237  0.33
2009 Rack A, Weitkamp T, Trabelsi SB, Modregger P, Cecilia A, Rolo TdS, Rack T, Haas D, Simon R, Heldele R, Schulz M, Mayzel B, Danilewsky AN, Waterstradt T, Diete W, ... ... Baumbach T, et al. The micro-imaging station of the TopoTomo beamline at the ANKA synchrotron light source Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions With Materials and Atoms. 267: 1978-1988. DOI: 10.1016/J.Nimb.2009.04.002  0.448
2009 Ulyanenkova T, Baumbusch R, Filatova T, Doyle S, Castrup A, Gruber PA, Markmann J, Weissmüller J, Baumbach T, Hahn H, Kraft O. A synchrotron tensile test setup for nanocrystalline thin films Physica Status Solidi (a). 206: 1795-1798. DOI: 10.1002/Pssa.200881599  0.328
2008 Modregger P, Lübbert D, Schäfer P, Köhler R, Weitkamp T, Hanke M, Baumbach T. Fresnel diffraction in the case of an inclined image plane. Optics Express. 16: 5141-9. PMID 18542614 DOI: 10.1364/Oe.16.005141  0.367
2008 Krug K, Porra L, Coan P, Wallert A, Dik J, Coerdt A, Bravin A, Elyyan M, Reischig P, Helfen L, Baumbach T. Relics in medieval altarpieces? Combining X-ray tomographic, laminographic and phase-contrast imaging to visualize thin organic objects in paintings. Journal of Synchrotron Radiation. 15: 55-61. PMID 18097079 DOI: 10.1107/S0909049507045438  0.384
2008 Lübbert D, Baumbach T, Holý V, Mikulík P, Helfen L, Pernot P, Elyyan M, Keller S, Katona TM, DenBaars SP, Speck JS. Microdiffraction imaging of dislocation densities in microstructured samples Epl. 82. DOI: 10.1209/0295-5075/82/56002  0.347
2008 Ulyanenkova TA, Baumbach T, Benediktovich AI, Feranchuk I, Ulyanenkov A. D-1 Invited—Long Range Scans And Many-Beam Effects For High-Resolution X-Ray Diffraction From Multilayered Structures Powder Diffraction. 23: 174-174. DOI: 10.1154/1.2951652  0.409
2008 Rack A, Riesemeier H, Zabler S, Weitkamp T, Müller BR, Weidemann G, Modregger P, Banhart J, Helfen L, Danilewsky AN, Gräber HG, Heldele R, Mayzel B, Goebbels J, Baumbach T. The high-resolution synchrotron-based imaging stations at the BAMline (BESSY) and TopoTomo (ANKA) Proceedings of Spie. 7078. DOI: 10.1117/12.793721  0.434
2008 Alexeeva TA, Benediktovich AI, Feranchuk ID, Baumbach T, Ulyanenkov A. Long-range scans and many-beam effects for high-resolution x-ray diffraction from multilayered structures : Experiment and theory Physical Review B. 77. DOI: 10.1103/Physrevb.77.174114  0.348
2008 Holý V, Baumbach T, Lübbert D, Helfen L, Ellyan M, Mikulík P, Keller S, DenBaars SP, Speck J. Diffuse x-ray scattering from statistically inhomogeneous distributions of threading dislocations beyond the ergodic hypothesis Physical Review B. 77. DOI: 10.1103/Physrevb.77.094102  0.371
2008 Betz O, Rack A, Schmitt C, Ershov A, Dieterich A, Körner L, Haas D, Baumbach T. High-Speed X-ray Cineradiography for Analyzing Complex Kinematics in Living Insects Synchrotron Radiation News. 21: 34-38. DOI: 10.1080/08940880802406091  0.436
2008 García-Moreno F, Rack A, Helfen L, Baumbach T, Zabler S, Babcsán N, Banhart J, Martin T, Ponchut C, Michiel MD. Fast processes in liquid metal foams investigated by high-speed synchrotron x-ray microradioscopy Applied Physics Letters. 92: 134104. DOI: 10.1063/1.2905748  0.349
2008 Danilewsky AN, Rack A, Wittge J, Weitkamp T, Simon R, Riesemeier H, Baumbach T. White beam synchrotron topography using a high resolution digital X-ray imaging detector Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions With Materials and Atoms. 266: 2035-2040. DOI: 10.1016/J.Nimb.2008.02.065  0.449
2008 Danilewsky AN, Wittge J, Rack A, Weitkamp T, Simon R, Baumbach T, McNally P. White beam topography of 300 mm Si wafers Journal of Materials Science: Materials in Electronics. 19: 269-272. DOI: 10.1007/S10854-007-9480-5  0.408
2007 Trabelsi-Bauer S, Bauer M, Steininger R, Baumbach T. XTrace: a new ray tracing tool for simulation of x-ray beamlines at ANKA Proceedings of Spie. 6667. DOI: 10.1117/12.746891  0.421
2007 Bernhard A, Casalbuoni S, Frahm R, Griesebock B, Haake U, Hagelstein M, Kostka B, Mathis YL, Müller AS, Rossmanith R, Schöck F, Steffens E, Weißer M, Wollmann D, Baumbach T. Performance of the first superconducting cold-bore undulator in an electron storage ring Ieee Transactions On Applied Superconductivity. 17: 1235-1238. DOI: 10.1109/Tasc.2007.899029  0.329
2007 Lübbert D, Baumbach T. Visrock: a program for digital topography and X-ray microdiffraction imaging Journal of Applied Crystallography. 40: 595-597. DOI: 10.1107/S0021889807011016  0.391
2007 Bauer ST, Bauer M, Steininger R, Baumbach T. Simulation of X-ray beamlines with the new ray tracing tool XTrace Nuclear Instruments & Methods in Physics Research Section a-Accelerators Spectrometers Detectors and Associated Equipment. 582: 90-92. DOI: 10.1016/J.Nima.2007.08.068  0.426
2007 Baumbach T, Lübbert D, Weitkamp T. Guest Editors' Introduction: Special issue on high resolution X‐ray diffraction and imaging Physica Status Solidi (a). 204: 2509-2513. DOI: 10.1002/Pssa.200790014  0.462
2007 Helfen L, Myagotin A, Rack A, Pernot P, Mikulík P, Di Michiel M, Baumbach T. Synchrotron-radiation computed laminography for high-resolution three-dimensional imaging of flat devices Physica Status Solidi (a) Applications and Materials Science. 204: 2760-2765. DOI: 10.1002/Pssa.200775676  0.395
2006 Helfen L, Baumbach T, Pernot P, Mikulík P, Dimichiel M, Baruchel J. High-resolution three-dimensional imaging by synchrotron-radiation computed laminography Progress in Biomedical Optics and Imaging - Proceedings of Spie. 6318. DOI: 10.1117/12.680797  0.358
2006 Casalbuoni S, Hagelstein M, Kostka B, Rossmanith R, Weisser M, Steffens E, Bernhard A, Wollmann D, Baumbach T. Generation of x-ray radiation in a storage ring by a superconductive cold-bore in-vacuum undulator Physical Review Special Topics-Accelerators and Beams. 9: 10702. DOI: 10.1103/Physrevstab.9.010702  0.361
2006 Helfen L, Myagotin A, Pernot P, DiMichiel M, Mikulík P, Berthold A, Baumbach T. Investigation of hybrid pixel detector arrays by synchrotron-radiation imaging Nuclear Instruments and Methods in Physics Research, Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 563: 163-166. DOI: 10.1016/J.Nima.2006.01.085  0.325
2006 Mikulík P, Lübbert D, Pernot P, Helfen L, Baumbach T. Crystallite misorientation analysis in semiconductor wafers and ELO samples by rocking curve imaging Applied Surface Science. 253: 188-193. DOI: 10.1016/J.Apsusc.2006.05.084  0.345
2006 Lübbert D, Mikulík P, Pernot P, Helfen L, Craven MD, Keller S, DenBaars S, Baumbach T. X-ray microdiffraction imaging investigations of wing tilt in epitaxially overgrown GaN Physica Status Solidi (a) Applications and Materials Science. 203: 1733-1738. DOI: 10.1002/Pssa.200565251  0.443
2005 Helfen L, Dehn F, Mikulík P, Baumbach T. Three-dimensional imaging of cement microstructure evolution during hydration Advances in Cement Research. 17: 103-111. DOI: 10.1680/Adcr.2005.17.3.103  0.374
2005 Lübbert D, Ferrari C, Mikulík P, Pernot P, Helfen L, Verdi N, Korytár D, Baumbach T. Distribution and Burgers vectors of dislocations in semiconductor wafers investigated by rocking-curve imaging Journal of Applied Crystallography. 38: 91-96. DOI: 10.1107/S0021889804028195  0.41
2005 Korytár D, Baumbach T, Ferrari C, Helfen L, Verdi N, Mikulík P, Kuběna A, Vagovič P. Monolithic two-dimensional beam compressor for hard x-ray beams Journal of Physics D. 38. DOI: 10.1088/0022-3727/38/10A/040  0.372
2005 Lübbert D, Baumbach T, Mikulík P, Pernot P, Helfen L, Köhler R, Katona TM, Keller S, Denbaars SP. Local wing tilt analysis of laterally overgrown GaN by x-ray rocking curve imaging Journal of Physics D: Applied Physics. 38: A50-A54. DOI: 10.1088/0022-3727/38/10A/010  0.437
2005 Helfen L, Baumbach T, Pernot P, Cloetens P, Stanzick H, Schladitz K, Banhart J. Investigation of pore initiation in metal foams by synchrotron-radiation tomography Applied Physics Letters. 86: 1-3. DOI: 10.1063/1.1941453  0.315
2005 Helfen L, Baumbach T, Mikulík P, Kiel D, Pernot P, Cloetens P, Baruchel J. High-resolution three-dimensional imaging of flat objects by synchrotron-radiation computed laminography Applied Physics Letters. 86: 1-3. DOI: 10.1063/1.1854735  0.388
2005 Mitschke M, Pernot P, Helfen L, Scherzer S, Zwerger A, Baumbach T. 'In-situ' observation of dynamical diffraction by means of Medipix2 sensor crystal fulfilling Bragg condition Nuclear Instruments and Methods in Physics Research, Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 546: 135-139. DOI: 10.1016/J.Nima.2005.03.046  0.358
2004 Mikulík P, Pernot P, Helfen L, Lübbert D, Korytár D, Baumbach T. Spatial micrometer-resolution three-dimensional local lattice misorientation determination of GaAs wafers by synchrotron radiation rocking-curve imaging Acta Crystallographica Section A. 60: 248-248. DOI: 10.1107/S010876730409508X  0.325
2003 Mikulík P, Lübbert D, Korytár D, Pernot P, Baumbach T. Synchrotron area diffractometry as a tool for spatial high-resolution three-dimensional lattice misorientation mapping Journal of Physics D. 36. DOI: 10.1088/0022-3727/36/10A/315  0.366
2003 Korytár D, Mikulík P, Ferrari C, Hrdý J, Baumbach T, Freund A, Kuběna A. Two-dimensional x-ray magnification based on a monolithic beam conditioner Journal of Physics D. 36. DOI: 10.1088/0022-3727/36/10A/313  0.418
2002 Buttard D, Bellet D, Dolino G, Baumbach T. X-ray diffuse scattering of p-type porous silicon Journal of Applied Physics. 91: 2742-2752. DOI: 10.1063/1.1429791  0.355
2002 Stanzick H, Wichmann M, Weise J, Helfen L, Baumbach T, Banhart J. Process control in aluminum foam production using real-time X-ray radioscopy Advanced Engineering Materials. 4: 814-823. DOI: 10.1002/1527-2648(20021014)4:10<814::Aid-Adem814>3.0.Co;2-5  0.359
2002 Helfen L, Baumbach T, Stanzick H, Banhart J, Elmoutaouakkil A, Cloetens P. Viewing the early stage of metal foam formation by computed tomography using synchrotron radiation Advanced Engineering Materials. 4: 808-813. DOI: 10.1002/1527-2648(20021014)4:10<808::Aid-Adem808>3.0.Co;2-U  0.334
2001 Mikulík P, Jergel M, Baumbach T, Majková E, Pinčík E, Luby Š, Ortega L, Tucoulou R, Hudek P, Kostič I. Coplanar and non-coplanar x-ray reflectivity characterization of lateral W/Si multilayer gratings Journal of Physics D. 34. DOI: 10.1088/0022-3727/34/10A/339  0.411
2001 Mazuelas A, Dotor ML, Golmayo D, Zeimer U, Baumbach T, Luebbert D, Grenzer J, Baruchel J. Observation of dislocation generation in highly strained quantum well lasers during operation Journal of Physics D. 34. DOI: 10.1088/0022-3727/34/10A/324  0.328
2001 Banhart J, Stanzick H, Helfen L, Baumbach T. Metal foam evolution studied by synchrotron radioscopy Applied Physics Letters. 78: 1152-1154. DOI: 10.1063/1.1350422  0.303
2001 Zeimer U, Grenzer J, Baumbach T, Lübbert D, Mazuelas A, Erbert G. Strain and temperature distribution in broad-area high-power laser diodes under operation determined by high resolution X-ray diffraction and topography Materials Science and Engineering B-Advanced Functional Solid-State Materials. 80: 87-90. DOI: 10.1016/S0921-5107(00)00595-X  0.385
2001 Banhart J, Stanzick H, Helfen L, Baumbach T, Nijhof K. Real-time X-ray Investigation of Aluminum Foam Sandwich Production Advanced Engineering Materials. 3: 407-411. DOI: 10.1002/1527-2648(200106)3:6<407::Aid-Adem407>3.0.Co;2-Y  0.368
2001 Aruta C, Zegenhagen J, Cowie B, Balestrino G, Pasquini G, Medaglia P, Ricci F, Luebbert D, Baumbach T, Riedo E, Ortega L, Kremer R, Albrecht J. Structure of Superconducting [BaCuOx]2/[CaCuO2]n Superlattices on SrTiO3(001) Investigated by X-ray Scattering Physica Status Solidi (a). 183: 353-364. DOI: 10.1002/1521-396X(200102)183:2<353::Aid-Pssa353>3.0.Co;2-V  0.418
2000 Baumbach T, Lübbert D, Gailhanou M. Strain and shape analysis of multilayer surface gratings by coplanar and by grazing-incidence x-ray diffraction Journal of Applied Physics. 87: 3744-3758. DOI: 10.1063/1.372409  0.411
2000 Baumbach T, Lübbert D, Gailhanou M. Strain relaxation in surface nano-structures studied by X-ray diffraction methods Materials Science and Engineering B-Advanced Functional Solid-State Materials. 392-396. DOI: 10.1016/S0921-5107(99)00415-8  0.42
2000 Buttard D, Eymery J, Rieutord F, Fournel F, Lübbert D, Baumbach T, Moriceau H. Grazing incidence X-ray studies of twist-bonded Si/Si and Si/SiO2 interfaces Physica B-Condensed Matter. 283: 103-107. DOI: 10.1016/S0921-4526(99)01900-6  0.319
2000 Lübbert D, Baumbach T, Härtwig J, Boller E, Pernot E. μm-resolved high resolution X-ray diffraction imaging for semiconductor quality control Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions With Materials and Atoms. 160: 521-527. DOI: 10.1016/S0168-583X(99)00619-9  0.428
1999 Lübbert D, Baumbach T, Ponti S, Pietsch U, Schneck LLJ, Talneau A. Strain investigation of low strained buried gratings by grazing incidence X-ray diffraction and elasticity theory Epl. 46: 479-485. DOI: 10.1209/Epl/I1999-00288-6  0.377
1999 Baumbach T, Lübbert D, Gailhanou M. Strain Relaxation in Surface Nano-Structures Studied by X-Ray Diffraction Methods Japanese Journal of Applied Physics. 38: 6591-6596. DOI: 10.1143/Jjap.38.6591  0.402
1999 Mikulík P, Baumbach T. X-ray reflection by rough multilayer gratings: Dynamical and kinematical scattering Physical Review B. 59: 7632-7643. DOI: 10.1103/Physrevb.59.7632  0.346
1999 Baumbach T, Lübbert D. Grazing incidence diffraction by laterally patterned semiconductor nanostructures Journal of Physics D. 32: 726-740. DOI: 10.1088/0022-3727/32/6/020  0.344
1999 Zeimer U, Baumbach T, Grenzer J, Lübbert D, Mazuelas A, Pietsch U, Erbert G. In situ characterization of strain distribution in broad-area high-power lasers under operation by high-resolution x-ray diffraction and topography using synchrotron radiation Journal of Physics D. 32. DOI: 10.1088/0022-3727/32/10A/326  0.344
1999 Lübbert D, Jenichen B, Baumbach T, Grahn HT, Paris G, Mazuelas A, Kojima T, Arai S. Elastic stress relaxation in GaInAsP quantum wires on InP Journal of Physics D. 32. DOI: 10.1088/0022-3727/32/10A/305  0.389
1999 Ulyanenkov A, Baumbach T, Darowski N, Pietsch U, Wang KH, Forchel A, Wiebach T. In-plane strain distribution in free-standing GaAs/InGaAs/GaAs single quantum well surface nanostructures on GaAs[001] Journal of Applied Physics. 85: 1524-1530. DOI: 10.1063/1.369282  0.404
1998 Buttard D, Bellet D, Dolino G, Baumbach T. Thin layers and multilayers of porous silicon: X-ray diffraction investigation Journal of Applied Physics. 83: 5814-5822. DOI: 10.1063/1.367438  0.395
1998 Darowski N, Pietsch U, Zhuang Y, Zerlauth S, Bauer G, Lübbert D, Baumbach T. In-plane strain and strain relaxation in laterally patterned periodic arrays of Si/SiGe quantum wires and dot arrays Applied Physics Letters. 73: 806-808. DOI: 10.1063/1.122008  0.384
1998 Mikulı́k P, Baumbach T. X-ray reflection by multilayer surface gratings Physica B-Condensed Matter. 248: 381-386. DOI: 10.1016/S0921-4526(98)00269-5  0.371
1998 Darowski N, Paschke K, Pietsch U, Wang K, Forchel A, Lübbert D, Baumbach T. Structural characterisation of a GaAs surface wire structure by triple axis X-ray grazing incidence diffraction Physica B: Condensed Matter. 248: 104-108. DOI: 10.1016/S0921-4526(98)00212-9  0.387
1998 Buttard D, Dolino G, Bellet D, Baumbach T, Rieutord F. X-ray reflectivity investigation of thin p-type porous silicon layers Solid State Communications. 109: 1-5. DOI: 10.1016/S0038-1098(98)00531-6  0.33
1997 Darowski N, Paschke K, Pietsch U, Wang KH, Forchel A, Baumbach T, Zeimer U. Identification of a buried single quantum well within surface structured semiconductors using depth resolved x-ray grazing incidence diffraction Journal of Physics D: Applied Physics. 30: L55-L59. DOI: 10.1088/0022-3727/30/16/001  0.412
1996 Buttard D, Dolino G, Bellet D, Baumbach T. X-Ray Diffraction and Reflectivity Studies of Thin Porous Silicon Layers Mrs Proceedings. 452: 437. DOI: 10.1557/Proc-452-437  0.365
1996 Buttard D, Bellet D, Baumbach T. X-ray diffraction investigation of porous silicon superlattices Thin Solid Films. 276: 69-72. DOI: 10.1016/0040-6090(95)08048-1  0.403
1995 Holy V, Baumbach T, Bessiere M. Interface roughness in surface-sensitive X-ray methods Journal of Physics D. 28. DOI: 10.1088/0022-3727/28/4A/043  0.41
1994 Holý V, Baumbach T. Nonspecular x-ray reflection from rough multilayers. Physical Review B. 49: 10668-10676. PMID 10009895 DOI: 10.1103/Physrevb.49.10668  0.4
1990 Brühl H-, Baumbach T, Gottschalch V, Pietsch U, Lengeler B. Extreme asymmetric X-ray bragg reflection of semiconductor heterostructures near the edge of total external reflection Journal of Applied Crystallography. 23: 228-233. DOI: 10.1107/S0021889890001704  0.347
1988 Baumbach T, Brühl H-, Rhan H, Pietsch U. Investigation of the compositional depth profile in epitaxial submicrometer layers of AIIIBV heterostructures Journal of Applied Crystallography. 21: 386-392. DOI: 10.1107/S0021889888003188  0.358
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