Year |
Citation |
Score |
2013 |
Ho B, Sun X, Shin C, Liu TK. Design Optimization of Multigate Bulk MOSFETs Ieee Transactions On Electron Devices. 60: 28-33. DOI: 10.1109/Ted.2012.2224870 |
0.686 |
|
2012 |
Ho B, Sun X, Xu N, Sako T, Maekawa K, Tomoyasu M, Akasaka Y, Bonnin O, Nguyen B, Liu TK. First Demonstration of Quasi-Planar Segmented-Channel MOSFET Design for Improved Scalability Ieee Transactions On Electron Devices. 59: 2273-2276. DOI: 10.1109/Ted.2012.2201721 |
0.669 |
|
2011 |
Sun X, Moroz V, Damrongplasit N, Shin C, Liu TJK. Variation study of the planar ground-plane bulk MOSFET, SOI FinFET, and trigate bulk MOSFET designs Ieee Transactions On Electron Devices. 58: 3294-3299. DOI: 10.1109/Ted.2011.2161479 |
0.598 |
|
2011 |
Shin C, Damrongplasit N, Sun X, Tsukamoto Y, Nikolic B, Liu TJK. Performance and yield benefits of quasi-planar bulk CMOS technology for 6-T SRAM at the 22-nm node Ieee Transactions On Electron Devices. 58: 1846-1854. DOI: 10.1109/Ted.2011.2139213 |
0.584 |
|
2010 |
Sun X, Liu TK. Spacer Gate Lithography for Reduced Variability Due to Line Edge Roughness Ieee Transactions On Semiconductor Manufacturing. 23: 311-315. DOI: 10.1109/Tsm.2010.2046050 |
0.383 |
|
2009 |
Sun X, Liu TK. Scale-Length Assessment of the Trigate Bulk MOSFET Design Ieee Transactions On Electron Devices. 56: 2840-2842. DOI: 10.1109/Ted.2009.2030711 |
0.375 |
|
2009 |
Shin C, Sun X, Liu TK. Study of Random-Dopant-Fluctuation (RDF) Effects for the Trigate Bulk MOSFET Ieee Transactions On Electron Devices. 56: 1538-1542. DOI: 10.1109/Ted.2009.2020321 |
0.613 |
|
2008 |
Sun X, Lu Q, Moroz V, Takeuchi H, Gebara G, Wetzel J, Ikeda S, Shin C, King Liu TJ. Tri-gate bulk MOSFET design for CMOS scaling to the end of the roadmap Ieee Electron Device Letters. 29: 491-493. DOI: 10.1109/Led.2008.919795 |
0.698 |
|
2007 |
Sun X, Lu Q, Takeuchi H, Balasubramanian S, King Liu TJ. Selective enhancement of SiO2 etch rate by Ar-ion implantation for improved etch depth control Electrochemical and Solid-State Letters. 10: 89-91. DOI: 10.1149/1.2748634 |
0.665 |
|
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