Year |
Citation |
Score |
2022 |
Chue-Sang J, Litorja M, Goldfain AM, Germer TA. Spatial frequency domain Mueller matrix imaging. Journal of Biomedical Optics. 27: 126003. PMID 36530345 DOI: 10.1117/1.JBO.27.12.126003 |
0.659 |
|
2022 |
Lemaillet P, Patrick HJ, Germer TA, Hanssen L, Johnson BC, Georgiev GT. Goniometric and hemispherical reflectance and transmittance measurements of fused silica diffusers. Proceedings of Spie--the International Society For Optical Engineering. 9961. PMID 35527792 DOI: 10.1117/12.2237975 |
0.72 |
|
2021 |
Patrick HJ, Cooksey CC, Germer TA, Nadal ME, Zarobila CJ. Bidirectional reflectance capabilities of the NIST Robotic Optical Scattering Instrument. Applied Optics. 60: 8774-8786. PMID 34613103 DOI: 10.1364/AO.435117 |
0.711 |
|
2020 |
Germer TA. Scattering mechanism for quadratic evolution of depolarization. Optics Letters. 45: 483-486. PMID 33223583 |
0.707 |
|
2020 |
Sparks WB, Parenteau MN, Blankenship RE, Germer TA, Patty CHL, Bott KM, Telesco CM, Meadows VS. Spectropolarimetry of Primitive Phototrophs as Global Surface Biosignatures. Astrobiology. PMID 33216615 DOI: 10.1089/ast.2020.2272 |
0.695 |
|
2020 |
Fischbach W, Germer T, Langer F, Mössner J. Coagulation Disorders: Manifestations in the Gastrointestinal Tract. Visceral Medicine. 36: 288-291. PMID 33005654 DOI: 10.1159/000509888 |
0.623 |
|
2020 |
Germer TA. Evolution of transmitted depolarization in diffusely scattering media. Journal of the Optical Society of America. a, Optics, Image Science, and Vision. 37: 980-987. PMID 32543599 DOI: 10.1364/Josaa.390598 |
0.73 |
|
2020 |
Smestad GP, Germer TA, Alrashidi H, Fernández EF, Dey S, Brahma H, Sarmah N, Ghosh A, Sellami N, Hassan IAI, Desouky M, Kasry A, Pesala B, Sundaram S, Almonacid F, et al. Modelling photovoltaic soiling losses through optical characterization. Scientific Reports. 10: 58. PMID 31919401 DOI: 10.1038/S41598-019-56868-Z |
0.695 |
|
2020 |
Germer TA. Scattering mechanism for quadratic evolution of depolarization Optics Letters. 45: 483. DOI: 10.1364/Ol.383215 |
0.37 |
|
2019 |
Sparks WB, Germer TA, Sparks RM. Classical polarimetry with a twist: a compact, geometric approach. Publications of the Astronomical Society of the Pacific. Astronomical Society of the Pacific. 131. PMID 31579323 DOI: 10.1088/1538-3873/Ab1933 |
0.701 |
|
2019 |
Angelo JP, Germer TA, Litorja M. Structured illumination Mueller matrix imaging. Biomedical Optics Express. 10: 2861-2868. PMID 31259056 DOI: 10.1364/Boe.10.002861 |
0.729 |
|
2019 |
Castagna A, Carol Johnson B, Voss K, Dierssen HM, Patrick H, Germer TA, Sabbe K, Vyverman W. Uncertainty in global downwelling plane irradiance estimates from sintered polytetrafluoroethylene plaque radiance measurements. Applied Optics. 58: 4497-4511. PMID 31251264 DOI: 10.1364/Ao.58.004497 |
0.713 |
|
2018 |
Roccapriore KM, Lyvers DP, Brown DP, Poutrina E, Urbas AM, Germer TA, Drachev VP. Waveguide coupling via magnetic gratings with effective strips. Applied Sciences (Basel, Switzerland). 8. PMID 31275624 DOI: 10.3390/App8040617 |
0.724 |
|
2018 |
Patty CHL, Luo DA, Snik F, Ariese F, Buma WJ, Ten Kate IL, van Spanning RJM, Sparks WB, Germer TA, Garab G, Kudenov MW. Imaging linear and circular polarization features in leaves with complete Mueller matrix polarimetry. Biochimica Et Biophysica Acta. PMID 29526506 DOI: 10.1016/J.Bbagen.2018.03.005 |
0.714 |
|
2017 |
Fischer G, Drahi E, Foldyna M, Germer TA, Johnson EV. Plasma nanotexturing of silicon surfaces for photovoltaics applications: influence of initial surface finish on the evolution of topographical and optical properties. Optics Express. 25: A1057-A1071. PMID 29220984 DOI: 10.1364/Oe.25.0A1057 |
0.722 |
|
2017 |
Germer TA. Full four-dimensional and reciprocal Mueller matrix bidirectional reflectance distribution function of sintered polytetrafluoroethylene. Applied Optics. 56: 9333-9340. PMID 29216106 DOI: 10.1364/Ao.56.009333 |
0.75 |
|
2017 |
Germer TA, Sharma KA, Brown TG, Oliver JB. Polarized optical scattering by inhomogeneities and surface roughness in an anisotropic thin film. Journal of the Optical Society of America. a, Optics, Image Science, and Vision. 34: 1974-1984. PMID 29091646 DOI: 10.1364/Josaa.34.001974 |
0.728 |
|
2017 |
Liman CD, Germer TA, Sunday DF, DeLongchamp DM, Kline RJ. Modeling the polarized X-ray scattering from periodic nanostructures with molecular anisotropy Journal of Applied Crystallography. 50: 1677-1690. DOI: 10.1107/S160057671701408X |
0.409 |
|
2016 |
Germer TA. Bidirectional scattering distribution function measurements from volume diffusers: correction factors and associated uncertainties. Applied Optics. 55: 6978-82. PMID 27607273 DOI: 10.1364/Ao.55.006978 |
0.724 |
|
2016 |
Patrick HJ, Germer TA, Zarobila CJ, Cooksey CC, Yoon HW. Optical reflectance of pyrheliometer absorption cavities: progress toward SI-traceable measurements of solar irradiance. Applied Optics. 55: 6346-54. PMID 27534478 DOI: 10.1364/Ao.55.006346 |
0.726 |
|
2016 |
Sharma KA, Germer TA, Smith C, Zuegel J, Oliver JB, Brown TG. Scattered-Light Analysis of Birefringent Coatings for Distributed Polarization Rotators Frontiers in Optics. DOI: 10.1364/Fio.2016.Jw4A.48 |
0.388 |
|
2016 |
Lemaillet P, Patrick HJ, Germer TA, Hanssen L, Johnson BC, Georgiev GT. Goniometric and hemispherical reflectance and transmittance measurements of fused silica diffusers Proceedings of Spie. 9961: 996109. DOI: 10.1117/12.2237975 |
0.404 |
|
2016 |
Germer TA, Foldyna M, Mrazkova Z, Fischer G, Drahi E. Mueller matrix bidirectional reflectance distribution function measurements and modeling of textured silicon surfaces Proceedings of Spie. 9961: 996107. DOI: 10.1117/12.2236976 |
0.412 |
|
2014 |
Tarrio CS, Grantham SE, Germer TA, Rife JC, Lucatorto TB, Kriese M, Platonov Y, Jiang L, Rodriguez J. Improved measurement capabilities at the NIST EUV reflectometry facility Proceedings of Spie. 9048. DOI: 10.1117/12.2046290 |
0.334 |
|
2014 |
Germer TA, Stover JC, Schröder S. Angle-Resolved Diffuse Reflectance and Transmittance Experimental Methods in the Physical Sciences. 46: 291-331. DOI: 10.1016/B978-0-12-386022-4.00008-X |
0.38 |
|
2014 |
Gaertner AA, Yoon HW, Germer TA. Chapter 3 - Dispersive Methods Experimental Methods in the Physical Sciences. 46: 67-95. DOI: 10.1016/B978-0-12-386022-4.00003-0 |
0.329 |
|
2014 |
Germer TA, Zwinkels JC, Tsai BK. Theoretical Concepts in Spectrophotometric Measurements Experimental Methods in the Physical Sciences. 46: 12-66. DOI: 10.1016/B978-0-12-386022-4.00002-9 |
0.437 |
|
2013 |
Patrick HJ, Zarobila CJ, Germer TA. The NIST Robotic Optical Scatter Instrument (ROSI) and its application to BRDF measurements of diffuse reflectance standards for remote sensing Proceedings of Spie. 8866: 886615. DOI: 10.1117/12.2023095 |
0.405 |
|
2013 |
Lemaillet P, Germer TA, Kline RJ, Sunday DF, Wang C, Wu W. Intercomparison between optical and x-ray scatterometry measurements of FinFET structures Proceedings of Spie. 8681. DOI: 10.1117/12.2011144 |
0.33 |
|
2012 |
Lee JH, Ro HW, Huang R, Lemaillet P, Germer TA, Soles CL, Stafford CM. Anisotropic, hierarchical surface patterns via surface wrinkling of nanopatterned polymer films. Nano Letters. 12: 5995-9. PMID 23088734 DOI: 10.1021/Nl303512D |
0.71 |
|
2012 |
Ghassemi P, Lemaillet P, Germer TA, Shupp JW, Venna SS, Boisvert ME, Flanagan KE, Jordan MH, Ramella-Roman JC. Out-of-plane Stokes imaging polarimeter for early skin cancer diagnosis. Journal of Biomedical Optics. 17: 076014. PMID 22894497 DOI: 10.1117/1.Jbo.17.7.076014 |
0.709 |
|
2012 |
Sparks W, Germer TA, MacKenty JW, Snik F. Compact and robust method for full Stokes spectropolarimetry. Applied Optics. 51: 5495-511. PMID 22859040 DOI: 10.1364/Ao.51.005495 |
0.716 |
|
2012 |
Germer TA. Realizable differential matrices for depolarizing media. Optics Letters. 37: 921-3. PMID 22378439 DOI: 10.1364/Ol.37.000921 |
0.678 |
|
2012 |
Germer TA. Large-Angle in-Plane Light Scattering from Rough Surfaces: Comment. Applied Optics. 40: 5708-10. PMID 18364859 DOI: 10.1364/Ao.40.005708 |
0.414 |
|
2012 |
Sung L, Mulholland GW, Germer TA. Polarized light-scattering measurements of dielectric spheres upon a silicon surface. Optics Letters. 24: 866-8. PMID 18073878 DOI: 10.1364/Ol.24.000866 |
0.676 |
|
2012 |
Stover JC, Schröder S, Germer TA. Upper roughness limitations on the TIS/RMS relationship Proceedings of Spie. 8495: 849503. DOI: 10.1117/12.930770 |
0.406 |
|
2012 |
Patrick HJ, Zarobila CJ, Germer TA, Ying VA, Cooksey CA, Tsai BK. Tunable supercontinuum fiber laser source for BRDF measurements in the STARR II gonioreflectometer Proceedings of Spie. 8495. DOI: 10.1117/12.930742 |
0.356 |
|
2012 |
Patrick HJ, Hanssen LM, Zeng J, Germer TA. BRDF measurements of graphite used in high-temperature fixed point blackbody radiators: a multi-angle study at 405 nm and 658 nm Metrologia. 49: S81-S92. DOI: 10.1088/0026-1394/49/2/S81 |
0.398 |
|
2012 |
Sparks W, Hough JH, Germer TA, Robb F, Kolokolova L. Remote sensing of chiral signatures on Mars Planetary and Space Science. 72: 111-115. DOI: 10.1016/J.Pss.2012.08.010 |
0.316 |
|
2011 |
Germer TA, Patrick HJ. Mueller matrix bidirectional reflectance distribution function measurements and modeling of diffuse reflectance standards Proceedings of Spie - the International Society For Optical Engineering. 8160. DOI: 10.1117/12.892713 |
0.328 |
|
2011 |
Foldyna M, Germer TA, Bergner BC, Dixson RG. Generalized ellipsometry of artificially designed line width roughness Thin Solid Films. 519: 2633-2636. DOI: 10.1016/J.Tsf.2010.11.085 |
0.314 |
|
2010 |
Bergner BC, Germer TA, Suleski TJ. Effective medium approximations for modeling optical reflectance from gratings with rough edges. Journal of the Optical Society of America. a, Optics, Image Science, and Vision. 27: 1083-90. PMID 20448775 DOI: 10.1364/Josaa.27.001083 |
0.715 |
|
2010 |
Germer TA, Patrick HJ. Effect of bandwidth and numerical aperture in optical scatterometry Proceedings of Spie. 7638. DOI: 10.1117/12.846776 |
0.312 |
|
2010 |
Martin WE, Hesse E, Hough JH, Sparks WB, Cockell CS, Ulanowski Z, Germer TA, Kaye PH. Polarized optical scattering signatures from biological materials Journal of Quantitative Spectroscopy and Radiative Transfer. 111: 2444-2459. DOI: 10.1016/J.Jqsrt.2010.07.001 |
0.422 |
|
2009 |
Sparks WB, Hough J, Germer TA, Chen F, DasSarma S, DasSarma P, Robb FT, Manset N, Kolokolova L, Reid N, Macchetto FD, Martin W. Detection of circular polarization in light scattered from photosynthetic microbes. Proceedings of the National Academy of Sciences of the United States of America. 106: 7816-21. PMID 19416893 DOI: 10.1073/Pnas.0810215106 |
0.731 |
|
2009 |
Marx E, Germer TA, Vorburger TV, Park BC. Angular distribution of light scattered from a sinusoidal grating. Applied Optics. 39: 4473-85. PMID 18350034 DOI: 10.1364/Ao.39.004473 |
0.426 |
|
2009 |
Wang B, Sparks WB, Germer TA, Leadbetter A. A spectroscopic polarimeter for detecting chiral signatures in astrobiological samples Proceedings of Spie. 7441: 744108. DOI: 10.1117/12.826378 |
0.349 |
|
2009 |
Silver RM, Zhang NF, Barnes BM, Zhou H, Heckert A, Dixson R, Germer TA, Bunday B. Improving optical measurement accuracy using multi-technique nested uncertainties 7272-02 Proceedings of Spie - the International Society For Optical Engineering. 7272. DOI: 10.1117/12.816569 |
0.304 |
|
2009 |
Patrick HJ, Germer TA, Ding Y, Ro HW, Richter LJ, Soles CL. In situ measurement of annealing-induced line shape evolution in nanoimprinted polymers using scatterometry Proceedings of Spie - the International Society For Optical Engineering. 7271. DOI: 10.1117/12.815360 |
0.649 |
|
2009 |
Germer TA, Patrick HJ, Silver RM, Bunday B. Developing an uncertainty analysis for optical scatterometry Proceedings of Spie. 7272. DOI: 10.1117/12.814835 |
0.321 |
|
2009 |
Bergner BC, Germer TA, Suleski TJ. Effect of line-width roughness on optical scatterometry measurements Proceedings of Spie. 7272. DOI: 10.1117/12.813770 |
0.321 |
|
2009 |
Sparks WB, Hough J, Germer TA, Chen F, DasSarma S, DasSarma P, Robb FT, Manset N, Kolokolova L, Reid N, Macchetto FD, Martin W. Detection of circular polarization in light scattered from photosynthetic microbes (Proceedings of the National Academy of Sciences of the United States of America (2009) 106, 19, (7816-7821) 10.1073/pnas.0810215106) Proceedings of the National Academy of Sciences of the United States of America. 106: 10871. DOI: 10.1073/Pnas.0905400106 |
0.36 |
|
2009 |
Sparks WB, Hough JH, Kolokolova L, Germer TA, Chen F, DasSarma S, DasSarma P, Robb FT, Manset N, Reid IN, Macchetto FD, Martin W. Circular polarization in scattered light as a possible biomarker Journal of Quantitative Spectroscopy and Radiative Transfer. 110: 1771-1779. DOI: 10.1016/J.Jqsrt.2009.02.028 |
0.397 |
|
2008 |
Attota R, Germer TA, Silver RM. Through-focus scanning-optical-microscope imaging method for nanoscale dimensional analysis. Optics Letters. 33: 1990-2. PMID 18758588 DOI: 10.1364/Ol.33.001990 |
0.702 |
|
2008 |
Germer TA, Wolters C, Brayton D. Calibration of wafer surface inspection systems using spherical silica nanoparticles Optics Express. 16: 4698-4705. PMID 18542566 DOI: 10.1364/Oe.16.004698 |
0.729 |
|
2008 |
Kenyon E, Cresswell MW, Patrick HJ, Germer TA. Modeling the effect of finite size gratings on scatterometry measurements Proceedings of Spie. 6922. DOI: 10.1117/12.772769 |
0.388 |
|
2008 |
Patrick HJ, Attota R, Barnes BM, Germer TA, Dixson RG, Stocker MT, Silver RM, Bishop MR. Optical critical dimension measurement of silicon grating targets using back focal plane scatterfield microscopy Journal of Micro/Nanolithography, Mems, and Moems. 7. DOI: 10.1117/1.2885275 |
0.359 |
|
2008 |
Patrick HJ, Germer TA, Ding Y, Ro HW, Richter LJ, Soles CL. Scatterometry for in situ measurement of pattern reflow in nanoimprinted polymers Applied Physics Letters. 93. DOI: 10.1063/1.3046117 |
0.655 |
|
2007 |
Ding Y, Ro HW, Germer TA, Douglas JF, Okerberg BC, Karim A, Soles CL. Relaxation behavior of polymer structures fabricated by nanoimprint lithography. Acs Nano. 1: 84-92. PMID 19206524 DOI: 10.1021/Nn700014P |
0.701 |
|
2007 |
Boulbry B, Ramella-Roman JC, Germer TA. Improved method for calibrating a Stokes polarimeter. Applied Optics. 46: 8533-41. PMID 18071386 DOI: 10.1364/Ao.46.008533 |
0.721 |
|
2007 |
Germer TA. Effect of line and trench profile variation on specular and diffuse reflectance from a periodic structure. Journal of the Optical Society of America. a, Optics, Image Science, and Vision. 24: 696-701. PMID 17301859 DOI: 10.1364/Josaa.24.000696 |
0.699 |
|
2007 |
Boulbry B, Ramella-Roman JC, Germer TA. Truncated singular value decomposition method for calibrating a Stokes Polarimeter Proceedings of Spie - the International Society For Optical Engineering. 6682. DOI: 10.1117/12.734452 |
0.368 |
|
2007 |
Patrick HJ, Germer TA. Progress toward traceable nanoscale optical critical dimension metrology for semiconductors Proceedings of Spie. 6672. DOI: 10.1117/12.734080 |
0.384 |
|
2007 |
Silver R, Germer T, Attota R, Barnes BM, Bunday B, Allgair J, Marx E, Jun J. Fundamental limits of optical critical dimension metrology: A simulation study Proceedings of Spie - the International Society For Optical Engineering. 6518. DOI: 10.1117/12.716604 |
0.343 |
|
2007 |
Germer TA. Modeling the Effect of Line Profile Variation on Optical Critical Dimension Metrology Proceedings of Spie. 6518. DOI: 10.1117/12.704246 |
0.32 |
|
2006 |
Dyer SD, Dennis T, Street LK, Etzel SM, Germer TA, Dienstfrey A. Spectroscopic phase-dispersion optical coherence tomography measurements of scattering phantoms. Optics Express. 14: 8138-53. PMID 19529186 DOI: 10.1364/Oe.14.008138 |
0.743 |
|
2006 |
Dyer SD, Dennis T, Williams PA, Street LK, Etzel SM, Joseph Espejo R, Germer TA, Milner TE. High sensitivity measurements of the scattering dispersion of phantoms using spectral domain optical coherence tomography Proceedings of Spie - the International Society For Optical Engineering. 6079. DOI: 10.1117/12.649180 |
0.407 |
|
2006 |
Boulbry B, Germer TA, Ramella-Roman JC. A novel hemispherical spectro-polarimetric scattering instrument for skin lesion imaging Progress in Biomedical Optics and Imaging - Proceedings of Spie. 6078. DOI: 10.1117/12.648164 |
0.363 |
|
2005 |
Ramella-Roman JC, Duncan D, Germer TA. Out-of-plane polarimetric imaging of skin: Surface and subsurface effects Progress in Biomedical Optics and Imaging - Proceedings of Spie. 5686: 142-153. DOI: 10.1117/12.592399 |
0.352 |
|
2005 |
Germer TA, Mulholland GW. Particle Size Metrology: Comparison Between Aerosol Electrical Mobility and Laser Surface Light Scattering Techniques Characterization and Metrology For Ulsi Technology. 788: 579-583. DOI: 10.1063/1.2063021 |
0.63 |
|
2004 |
Germer TA, Marx E. Ray model of light scattering by flake pigments or rough surfaces with smooth transparent coatings. Applied Optics. 43: 1266-74. PMID 15008529 DOI: 10.1364/Ao.43.001266 |
0.746 |
|
2004 |
Kim JH, Ehrman SH, Mulholland GW, Germer TA. Polarized light scattering by dielectric and metallic spheres on oxidized silicon surfaces. Applied Optics. 43: 585-91. PMID 14765917 DOI: 10.1364/Ao.43.000585 |
0.793 |
|
2004 |
Kim JH, Ehrman SH, Germer TA. Influence of particle oxide coating on light scattering by submicron metal particles on silicon wafers Applied Physics Letters. 84: 1278-1280. DOI: 10.1063/1.1650555 |
0.759 |
|
2003 |
Kim JH, Babushok VI, Germer TA, Mulholland GW, Ehrman SH. Cosolvent-assisted spray pyrolysis for the generation of metal particles Journal of Materials Research. 18: 1614-1622. DOI: 10.1557/Jmr.2003.0222 |
0.753 |
|
2002 |
Germer TA. Light scattering by slightly nonspherical particles on surfaces. Optics Letters. 27: 1159-61. PMID 18026393 DOI: 10.1364/Ol.27.001159 |
0.724 |
|
2002 |
Kim JH, Ehrman SH, Mulholland GW, Germer TA. Polarized light scattering by dielectric and metallic spheres on silicon wafers. Applied Optics. 41: 5405-12. PMID 12211571 DOI: 10.1364/Ao.41.005405 |
0.791 |
|
2002 |
Kim J, Germer T, Mulholland G, Ehrman S. Size-Monodisperse Metal Nanoparticles via Hydrogen-Free Spray Pyrolysis Advanced Materials. 14: 518-521. DOI: 10.1002/1521-4095(20020404)14:7<518::Aid-Adma518>3.0.Co;2-P |
0.745 |
|
2001 |
Germer TA. Polarized light scattering by microroughness and small defects in dielectric layers. Journal of the Optical Society of America. a, Optics, Image Science, and Vision. 18: 1279-88. PMID 11393621 DOI: 10.1364/Josaa.18.001279 |
0.426 |
|
2000 |
Germer TA. Measurement of roughness of two interfaces of a dielectric film by scattering ellipsometry Physical Review Letters. 85: 349-352. PMID 10991280 DOI: 10.1103/Physrevlett.85.349 |
0.408 |
|
2000 |
Shaw P, Gupta R, Germer TA, Arp U, Lucatorto TB, Lykke KR. Characterization of materials using an ultraviolet radiometric beamline at SURF III Metrologia. 37: 551-554. DOI: 10.1088/0026-1394/37/5/47 |
0.348 |
|
1999 |
Germer TA, Asmail CC. Polarization of light scattered by microrough surfaces and subsurface defects Journal of the Optical Society of America a-Optics Image Science and Vision. 16: 1326-1332. DOI: 10.1364/Josaa.16.001326 |
0.437 |
|
1999 |
Germer TA, Asmail CC. Goniometric Optical Scatter Instrument for Out-of-Plane Ellipsometry Measurements Review of Scientific Instruments. 70: 3688-3695. DOI: 10.1063/1.1149950 |
0.415 |
|
1998 |
Germer TA, Scheer BW. Polarization of out-of-plane optical scatter from SiO2 films grown on photolithographically-generated microrough silicon Proceedings of Spie - the International Society For Optical Engineering. 3426: 160-168. DOI: 10.1117/12.328451 |
0.339 |
|
1998 |
Germer TA. Application of bidirectional ellipsometry to the characterization of roughness and defects in dielectric layers High-Power Lasers and Applications. 3275: 121-131. DOI: 10.1117/12.304397 |
0.422 |
|
1998 |
Kelley EF, Jones GR, Germer TA. Display reflectance model based on the BRDF Displays. 19: 27-34. DOI: 10.1016/S0141-9382(98)00028-6 |
0.338 |
|
1997 |
Germer TA, Asmail CC, Scheer BW. Polarization of out-of-plane scattering from microrough silicon. Optics Letters. 22: 1284-6. PMID 18188214 DOI: 10.1364/Ol.22.001284 |
0.431 |
|
1997 |
Germer TA. Angular dependence and polarization of out-of-plane optical scattering from particulate contamination, subsurface defects, and surface microroughness Applied Optics. 36: 8798. DOI: 10.1364/Ao.36.008798 |
0.435 |
|
1997 |
Germer TA, Kołasin-acuteski KW, Stephenson JC, Richter LJ. Depletion-electric-field-induced second-harmonic generation near oxidized GaAs(001) surfaces Physical Review B. 55: 10694-10706. DOI: 10.1103/Physrevb.55.10694 |
0.643 |
|
1995 |
Cavanagh RR, Germer TA, Stephenson JC. Ultrafast time-resolved infrared probing of energy transfer at surfaces Vibrational Spectroscopy. 9: 77-83. DOI: 10.1016/0924-2031(94)00064-N |
0.596 |
|
1994 |
Germer TA, Stephenson JC, Heilweil EJ, Cavanagh RR. Picosecond time-resolved adsorbate response to substrate heating: Spectroscopy and dynamics of CO/Cu(100) The Journal of Chemical Physics. 101: 1704-1716. DOI: 10.1063/1.467792 |
0.576 |
|
1993 |
Germer TA, Stephenson JC, Heilweil EJ, Cavanagh RR. Hot carrier excitation of adlayers: Time-resolved measurement of adsorbate-lattice coupling. Physical Review Letters. 71: 3327-3330. PMID 10054945 DOI: 10.1103/Physrevlett.71.3327 |
0.578 |
|
1993 |
Germer TA, Stephenson JC, Heilweil EJ, Cavanagh RR. Picosecond measurement of substrate-to-adsorbate energy transfer: The frustrated translation of CO/Pt(111) The Journal of Chemical Physics. 98: 9986-9994. DOI: 10.1063/1.464324 |
0.586 |
|
1993 |
Germer TA, Young RY, Ho W, Ravel MK. Charge-coupled-device based time-of-flight charged particle analyzer Review of Scientific Instruments. 64: 3132-3138. DOI: 10.1063/1.1144320 |
0.545 |
|
1993 |
Cavanagh RR, Germer TA, Heilweil EJ, Stephenson JC. Time-resolved measurements of substrate to adsorbate energy transfer Faraday Discussions. 96: 235-243. DOI: 10.1039/Fd9939600235 |
0.591 |
|
1990 |
Germer TA, Ho W. Formation of hydroxyl and water from photoreaction of hydrogen and molecular oxygen coadsorbed on Pt(111) Journal of Chemical Physics. 93: 1474-1475. DOI: 10.1063/1.459158 |
0.537 |
|
1989 |
Germer TA, Ho W. Energy transfer and photochemistry on a metal surface: Mo(CO)6 on Rh(100) Journal of Vacuum Science and Technology. 7: 1878-1881. DOI: 10.1116/1.576020 |
0.576 |
|
1989 |
Germer TA, Ho W. Direct characterization of the hydroxyl intermediate during reduction of oxygen on Pt(111) by time-resolved electron energy loss spectroscopy Chemical Physics Letters. 163: 449-454. DOI: 10.1016/0009-2614(89)85166-8 |
0.535 |
|
1988 |
Richter LJ, Germer TA, Sethna JP, Ho W. Electron-energy-loss spectroscopy of H adsorbed on Rh(100): Interpretation of overtone spectra as two-phonon bound states. Physical Review. B, Condensed Matter. 38: 10403-10420. PMID 9945891 DOI: 10.1103/Physrevb.38.10403 |
0.711 |
|
1988 |
Germer TA, Ho W. The adsorption and photochemistry of Mo(CO)6 on Rh(100) Journal of Chemical Physics. 89: 562-569. DOI: 10.1063/1.455446 |
0.55 |
|
1988 |
Richter LJ, Germer TA, Ho W. Coadsorption-induced site changes: Bridging hydrogen from CO and H on Rh(100) Surface Science. 195: L182-L192. DOI: 10.1016/0039-6028(88)90342-1 |
0.717 |
|
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