Year |
Citation |
Score |
2013 |
Machado HA, Abercrombie JJ, You T, Deluca PP, Leung KP. Release of a wound-healing agent from PLGA microspheres in a thermosensitive gel. Biomed Research International. 2013: 387863. PMID 24224161 DOI: 10.1155/2013/387863 |
0.313 |
|
2005 |
Gregory OJ, You T. Ceramic temperature sensors for harsh environments Ieee Sensors Journal. 5: 833-838. DOI: 10.1109/Jsen.2005.844346 |
0.693 |
|
2005 |
Gregory OJ, You T, Crisman EE. Effect of aluminum doping on the high-temperature stability and piezoresistive response of indium tin oxide strain sensors Thin Solid Films. 476: 344-351. DOI: 10.1016/J.Tsf.2004.10.045 |
0.697 |
|
2004 |
Gregory OJ, You T. Piezoresistive properties of ITO strain sensors prepared with controlled nanoporosity Journal of the Electrochemical Society. 151. DOI: 10.1149/1.1767839 |
0.689 |
|
2004 |
Gregory OJ, You T. Ceramic temperature sensors for gas turbine engine applications Proceedings of the International Instrumentation Symposium. 249-259. |
0.458 |
|
2004 |
Gregory OJ, You T. Ceramic temperature sensors for gas turbine engine applications Proceedings of the International Instrumentation Symposium. 249-259. |
0.663 |
|
2004 |
Gregory OJ, You T. Integrated ceramic temperature sensors for harsh environments Proceedings of Ieee Sensors. 3: 1165-1168. |
0.671 |
|
2003 |
Gregory OJ, You T. Piezoresistive properties of ceramic strain sensors with controlled nanoporosity Materials Research Society Symposium - Proceedings. 785: 489-494. DOI: 10.1557/Proc-785-D14.1 |
0.692 |
|
2003 |
Gregory OJ, You T, Platek M, Crisman E. Stabilization of indium tin oxide films to very high temperatures Materials Research Society Symposium - Proceedings. 751: 109-114. DOI: 10.1557/Proc-751-Z3.33 |
0.668 |
|
2003 |
Gregory OJ, You T. Stability and Piezoresistive Properties of Indium-Tin-Oxide Ceramic Strain Gages Proceedings of Ieee Sensors. 2: 801-806. |
0.678 |
|
2003 |
Gregory OJ, Platek MJ, You T. Stabilization of Ceramic Strain Gages to Temperatures beyond 1500°C Proceedings of the International Instrumentation Symposium. 49: 23-34. |
0.676 |
|
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