Year |
Citation |
Score |
2014 |
Chawla JS, Singh KJ, Myers A, Michalak DJ, Schenker R, Jezewski C, Krist B, Gstrein F, Indukuri TK, Yoo HJ. Patterning challenges in the fabrication of 12 nm half-pitch dual damascene copper ultra low-k interconnects Proceedings of Spie - the International Society For Optical Engineering. 9054. DOI: 10.1117/12.2048599 |
0.617 |
|
2011 |
Chawla JS, Gstrein F, O'Brien KP, Clarke JS, Gall D. Electron scattering at surfaces and grain boundaries in Cu thin films and wires Physical Review B - Condensed Matter and Materials Physics. 84. DOI: 10.1103/Physrevb.84.235423 |
0.308 |
|
2008 |
Michalak DJ, Gstrein F, Lewis NS. The role of band bending in affecting the surface recombination velocities for Si(111) in contact with aqueous acidic electrolytes Journal of Physical Chemistry C. 112: 5911-5921. DOI: 10.1021/Jp075354S |
0.743 |
|
2007 |
Michalak DJ, Gstrein F, Lewis NS. Interfacial energetics of silicon in contact with 11 M NH 4F(aq), buffered HF(aq), 27 MHF(aq), and 18 M H 2so 4 Journal of Physical Chemistry C. 111: 16516-16532. DOI: 10.1021/Jp074971D |
0.732 |
|
2007 |
Gstrein F, Michalak DJ, Knapp DW, Lewis NS. Near-surface channel impedance measurements, open-circuit impedance spectra, and differential capacitance vs potential measurements of the fermi level position at Si/CH3CN contacts Journal of Physical Chemistry C. 111: 8120-8127. DOI: 10.1021/Jp066226R |
0.729 |
|
2006 |
Hamann TW, Gstrein F, Brunschwig BS, Lewis NS. Measurement of the driving force dependence of interfacial charge-transfer rate constants in response to pH changes at n-ZnO/H2O interfaces Chemical Physics. 326: 15-23. DOI: 10.1016/J.Chemphys.2006.02.027 |
0.686 |
|
2005 |
Hamann TW, Gstrein F, Brunschwig BS, Lewis NS. Measurement of the dependence of interfacial charge-transfer rate constants on the reorganization energy of redox species at n-ZnO/H2O interfaces. Journal of the American Chemical Society. 127: 13949-54. PMID 16201817 DOI: 10.1021/Ja0515452 |
0.678 |
|
2005 |
Hamann TW, Gstrein F, Brunschwig BS, Lewis NS. Measurement of the free-energy dependence of interfacial charge-transfer rate constants using ZnO/H2O semiconductor/liquid contacts. Journal of the American Chemical Society. 127: 7815-24. PMID 15913371 DOI: 10.1021/Ja0436188 |
0.686 |
|
2002 |
Gstrein F, Michalak DJ, Royea WJ, Lewis NS. Effects of interfacial energetics on the effective surface recombination velocity of Si/liquid contacts Journal of Physical Chemistry B. 106: 2950-2961. DOI: 10.1021/Jp012997D |
0.644 |
|
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