Year |
Citation |
Score |
2020 |
Brazil O, de Silva JP, Chowdhury M, Yoon H, McKenna GB, Oliver WC, Kilpatrick J, Pethica JB, Cross GL. In situ measurement of bulk modulus and yield response of glassy thin films via confined layer compression - ERRATUM Journal of Materials Research. 35: 654-654. DOI: 10.1557/Jmr.2020.67 |
0.331 |
|
2019 |
Clarke AR, Pethica JB, Nieminen JA, Besenbacher F, Lægsgaard E, Stensgaard I. Quantitative scanning tunneling microscopy at atomic resolution: Influence of forces and tip configuration. Physical Review Letters. 76: 1276-1279. PMID 10061680 DOI: 10.1103/Physrevlett.76.1276 |
0.444 |
|
2017 |
Brazil O, Usov V, Pethica JB, Cross GL. Large area thermal nanoimprint below the glass transition temperature via small amplitude oscillatory shear forming Microelectronic Engineering. 182: 35-41. DOI: 10.1016/J.Mee.2017.08.002 |
0.336 |
|
2011 |
O'Brien SJ, Ozer HO, Cross GLW, Pethica JB. Multiparameter imaging and understanding the role of the tip - Atomic resolution images of rutile TiO 2(110) Materials Research Society Symposium Proceedings. 1318: 127-135. DOI: 10.1557/Opl.2011.423 |
0.394 |
|
2011 |
McKenzie W, Pethica J, Cross G. A direct-write, resistless hard mask for rapid nanoscale patterning of diamond Diamond and Related Materials. 20: 707-710. DOI: 10.1016/J.Diamond.2011.03.008 |
0.345 |
|
2009 |
McGovern IT, Ozer HO, Pethica JB, Egdell RG. The adsorption and decomposition of H2S on Ge(001): An STM study E-Journal of Surface Science and Nanotechnology. 7: 203-206. DOI: 10.1380/Ejssnt.2009.203 |
0.335 |
|
2008 |
Tang B, Ngan AH, Pethica JB. A method to quantitatively measure the elastic modulus of materials in nanometer scale using atomic force microscopy. Nanotechnology. 19: 495713. PMID 21730693 DOI: 10.1088/0957-4484/19/49/495713 |
0.459 |
|
2008 |
Rowland HD, King WP, Cross GL, Pethica JB. Measuring glassy and viscoelastic polymer flow in molecular-scale gaps using a flat punch mechanical probe. Acs Nano. 2: 419-28. PMID 19206565 DOI: 10.1021/Nn700211G |
0.323 |
|
2008 |
Rowland HD, King WP, Pethica JB, Cross GL. Molecular confinement accelerates deformation of entangled polymers during squeeze flow. Science (New York, N.Y.). 322: 720-4. PMID 18832609 DOI: 10.1126/Science.1157945 |
0.309 |
|
2008 |
Matei G, Jeffery S, Patil S, Khan SH, Pantea M, Pethica JB, Hoffmann PM. Simultaneous normal and shear measurements of nanoconfined liquids in a fiber-based atomic force microscope. The Review of Scientific Instruments. 79: 023706. PMID 18315304 DOI: 10.1063/1.2839913 |
0.752 |
|
2008 |
Cross GL, O'Connell BS, Pethica JB, Rowland H, King WP. Variable temperature thin film indentation with a flat punch. The Review of Scientific Instruments. 79: 013904. PMID 18248047 DOI: 10.1063/1.2830028 |
0.384 |
|
2007 |
Cross GL, O'Connell BS, Ozer HO, Pethica JB. Room temperature mechanical thinning and imprinting of solid films. Nano Letters. 7: 357-62. PMID 17298001 DOI: 10.1021/Nl0624566 |
0.352 |
|
2007 |
Özgür Özer H, O'Brien SJ, Pethica JB. Local force gradients on Si(111) during simultaneous scanning tunneling/atomic force microscopy Applied Physics Letters. 90. DOI: 10.1063/1.2717115 |
0.462 |
|
2006 |
Bobji MS, Ramanujan CS, Pethica JB, Inkson BJ. A miniaturized TEM nanoindenter for studying material deformationin situ Measurement Science and Technology. 17: 1324-1329. DOI: 10.1088/0957-0233/17/6/006 |
0.38 |
|
2005 |
Bobji M, Pethica J, Inkson B. Indentation mechanics of Cu–Be quantified by an in situ transmission electron microscopy mechanical probe Journal of Materials Research. 20: 2726-2732. DOI: 10.1557/Jmr.2005.0332 |
0.456 |
|
2005 |
Özer HÖ, O'Brien SJ, Norris A, Sader JE, Pethica JB. Dissipation Imaging with Low Amplitude off-Resonance Atomic Force Microscopy Japanese Journal of Applied Physics. 44: 5325-5327. DOI: 10.1143/Jjap.44.5325 |
0.443 |
|
2005 |
Cross GLW, O’Connell BS, Pethica JB. Influence of elastic strains on the mask ratio in glassy polymer nanoimprint Applied Physics Letters. 86: 081902. DOI: 10.1063/1.1868074 |
0.37 |
|
2004 |
Cross GLW, Langford RM, O'Connell BS, Pethica JB. The Mechanics of Nanoimprint Forming Mrs Proceedings. 841. DOI: 10.1557/Proc-841-R1.6 |
0.386 |
|
2004 |
Hoffmann PM, Patil S, Matei G, Tanulku A, Grimble R, Özer Ö, Jeffery S, Oral A, Pethica J. Linear measurements of nanomechanical phenomena using small-amplitude AFM Mrs Proceedings. 838. DOI: 10.1557/Proc-838-O1.8 |
0.778 |
|
2004 |
Jeffery S, Hoffmann PM, Pethica JB, Ramanujan C, Özer HÖ, Oral A. Direct measurement of molecular stiffness and damping in confined water layers Physical Review B. 70. DOI: 10.1103/Physrevb.70.054114 |
0.604 |
|
2003 |
Özer HÖ, Norris A, Oral A, Hoffmann PM, Pethica JB. Low-amplitude, force gradient imaging of Cu(100) surface using tunnel current feedback Nanotechnology. 15: S5-S8. DOI: 10.1088/0957-4484/15/2/002 |
0.613 |
|
2003 |
Oral A, Grimble RA, Özer HÖ, Pethica JB. High-sensitivity noncontact atomic force microscope/scanning tunneling microscope (nc AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopy Review of Scientific Instruments. 74: 3656-3663. DOI: 10.1063/1.1593786 |
0.452 |
|
2002 |
Mann AB, Van Heerden D, Pethica JB, Bowes P, Weihs TP. Contact resistance and phase transformations during nanoindentation of silicon Philosophical Magazine a: Physics of Condensed Matter, Structure, Defects and Mechanical Properties. 82: 1921-1929. DOI: 10.1080/01418610208235704 |
0.696 |
|
2002 |
Wang J, Howard A, Egdell RG, Pethica JB, Foord JS. Arrangement of rotational domains of the (√31 × √31) R ± 9° reconstruction of Al2O3(0 0 0 1) revealed by non-contact AFM Surface Science. 515: 337-343. DOI: 10.1016/S0039-6028(02)01911-8 |
0.357 |
|
2001 |
Hoffmann PM, Jeffery S, Pethica JB, Ozer HO, Oral A. Energy dissipation in atomic force microscopy and atomic loss processes. Physical Review Letters. 87: 265502. PMID 11800839 DOI: 10.1103/Physrevlett.87.265502 |
0.624 |
|
2001 |
Pethica JB, Egdell R. The insulator uncovered Nature. 414: 27-29. PMID 11689925 DOI: 10.1038/35102135 |
0.385 |
|
2001 |
Hoffmann PM, Oral A, Grimble RA, Özgür özer H, Jeffery S, Pethica JB. Direct measurement of interatomic force gradients using an ultra-low-amplitude atomic force microscope Proceedings of the Royal Society of London. Series a: Mathematical, Physical and Engineering Sciences. 457: 1161-1174. DOI: 10.1098/Rspa.2000.0713 |
0.628 |
|
2001 |
Oral A, Grimble RA, Özer HÖ, Hoffmann PM, Pethica JB. Quantitative atom-resolved force gradient imaging using noncontact atomic force microscopy Applied Physics Letters. 79: 1915-1917. DOI: 10.1063/1.1389785 |
0.633 |
|
2000 |
Fishlock TW, Oral A, Egdell RG, Pethica JB. Manipulation of atoms across a surface at room temperature Nature. 404: 743-5. PMID 10783883 DOI: 10.1038/35008030 |
0.436 |
|
2000 |
Hoffmann PM, Jeffery S, Oral A, Grimble RA, Özer Hö, Pethica JB. Nanomechanics Using an Ultra-Small Amplitude AFM Mrs Proceedings. 649. DOI: 10.1557/Proc-649-Q9.2 |
0.636 |
|
2000 |
Mann AB, Van Heerden D, Pethica JB, Weihs TP. Size-dependent phase transformations during point loading of silicon Journal of Materials Research. 15: 1754-1758. DOI: 10.1557/Jmr.2000.0253 |
0.701 |
|
2000 |
Jeffery S, Oral A, Pethica JB. Quantitative electrostatic force measurement in AFM Applied Surface Science. 157: 280-284. DOI: 10.1016/S0169-4332(99)00565-6 |
0.456 |
|
1999 |
Mann AB, Pethica JB. The effect of tip momentum on the contact stiffness and yielding during nanoindentation testing Philosophical Magazine A. 79: 577-592. DOI: 10.1080/01418619908210318 |
0.587 |
|
1999 |
Mann AB, Pethica JB. The effect of tip momentum on the contact stiffness and yielding during nanoindentation testing Philosophical Magazine a: Physics of Condensed Matter, Structure, Defects and Mechanical Properties. 79: 577-592. DOI: 10.1080/01418619908210318 |
0.699 |
|
1999 |
Wee ATS, Dixon RA, Egdell RG, Foord JS, Fishlock TW, Pethica JB. Scanning tunnelling microscopy study of palladium on stepped Cu(210) surfaces: chemical contrast and room-temperature tip-induced motion Surface Science. 442: 55-64. DOI: 10.1016/S0039-6028(99)00884-5 |
0.336 |
|
1999 |
Fishlock TW, Pethica JB, Oral A, Egdell RG, Jones FH. Interaction of bromine with Ni(110) studied by scanning tunnelling microscopy Surface Science. 426: 212-224. DOI: 10.1016/S0039-6028(99)00323-4 |
0.385 |
|
1998 |
Mann AB, Searson PC, Pethica JB, Weihs TP. Relationship between near-surface mechanical properties, loading rate and surface chemistry Materials Research Society Symposium - Proceedings. 505: 307-318. DOI: 10.1557/Proc-505-307 |
0.776 |
|
1998 |
Pethica JB. SURFACE SCIENCE: How to Have Your Cake and Eat It Too Science. 280: 1715-1715. DOI: 10.1126/Science.280.5370.1715 |
0.363 |
|
1998 |
Syed Asif SA, Pethica JB. Nano-Scale Indentation Creep Testing at Non-Ambient Temperature The Journal of Adhesion. 67: 153-165. DOI: 10.1080/00218469808011105 |
0.4 |
|
1998 |
Jeffery S, Sofield CJ, Pethica JB. The influence of mechanical stress on the dielectric breakdown field strength of thin SiO2 films Applied Physics Letters. 73: 172-174. DOI: 10.1063/1.121745 |
0.344 |
|
1997 |
Asif SAS, Pethica JB. Nano-Scale Viscoelastic Properties of Polymer Materials Mrs Proceedings. 505. DOI: 10.1557/Proc-505-103 |
0.352 |
|
1997 |
Syed Asif SA, Pethica JB. Nanoindentation creep of single-crystal tungsten and gallium arsenide Philosophical Magazine A. 76: 1105-1118. DOI: 10.1080/01418619708214217 |
0.401 |
|
1997 |
Bobji MS, Biswas SK, Pethica JB. Effect of roughness on the measurement of nanohardness—a computer simulation study Applied Physics Letters. 71: 1059-1061. DOI: 10.1063/1.119727 |
0.374 |
|
1997 |
Jarvis SP, Yamamoto S, Yamada H, Tokumoto H, Pethica JB. Tip-surface interactions studied using a force controlled atomic force microscope in ultrahigh vacuum Applied Physics Letters. 70: 2238-2240. DOI: 10.1063/1.118826 |
0.467 |
|
1997 |
Fishlock TW, Pethica JB, Jones FH, Egdell RG, Foord JS. Interaction of chlorine with nickel (110) studied by scanning tunnelling microscopy Surface Science. 629-633. DOI: 10.1016/S0039-6028(96)01476-8 |
0.426 |
|
1997 |
Jones F, Dixon R, Foord J, Egdell R, Pethica J. The surface structure of SnO2(110)(4 × 1) revealed by scanning tunneling microscopy Surface Science. 376: 367-373. DOI: 10.1016/S0039-6028(96)01327-1 |
0.352 |
|
1996 |
Jones FH, Rawlings K, Foord JS, Cox PA, Egdell RG, Pethica JB, Wanklyn BM. Erratum: Superstructures and defect structures revealed by atomic-scale STM imaging of WO3(001) Physical Review. B, Condensed Matter. 53: 10412. PMID 9986974 DOI: 10.1103/Physrevb.53.10412.3 |
0.346 |
|
1996 |
Asif SAS, Pethica JB. Nano Scale Creep and the Role of Defects Mrs Proceedings. 436. DOI: 10.1557/Proc-436-201 |
0.439 |
|
1996 |
Mann AB, Pethica JB. Dislocation nucleation and multiplication during nanoindentation testing Materials Research Society Symposium - Proceedings. 436. DOI: 10.1557/Proc-436-153 |
0.681 |
|
1996 |
Mann AB, Pethica JB. Dislocation Nucleation and Multiplication During Nanoindentation Testing Mrs Proceedings. 436. DOI: 10.1557/PROC-436-153 |
0.656 |
|
1996 |
Mann AB, Pethica JB. The role of atomic size asperities in the mechanical deformation of nanocontacts Applied Physics Letters. 69: 907-909. DOI: 10.1063/1.116939 |
0.667 |
|
1996 |
Mann AB, Pethica JB. The role of atomic size asperities in the mechanical deformation of nanocontacts Applied Physics Letters. 69: 907-909. DOI: 10.1063/1.116939 |
0.622 |
|
1996 |
Jarvis SP, Yamada H, Yamamoto S, Tokumoto H, Pethica JB. Direct mechanical measurement of interatomic potentials Nature. 384: 247-249. DOI: 10.1038/384247A0 |
0.473 |
|
1996 |
Mann AB, Pethica JB. Nanoindentation studies in a liquid environment Langmuir. 12: 4583-4586. DOI: 10.1021/La950901Z |
0.653 |
|
1996 |
Jarvis S, Pethica J. Comparison of hydrophobic modifying layers on SiO2 studied with a force-controlled atomic force microscope Thin Solid Films. 273: 284-288. DOI: 10.1016/0040-6090(95)06791-4 |
0.462 |
|
1996 |
Jones F, Rawlings K, Foord J, Egdell R, Pethica J, Wanklyn B, Parker S, Oliver P. An STM study of surface structures on WO3(001) Surface Science. 359: 107-121. DOI: 10.1016/0039-6028(96)00302-0 |
0.311 |
|
1995 |
Jones FH, Rawlings K, Foord JS, Cox PA, Egdell RG, Pethica JB, Wanklyn BM. Superstructures and defect structures revealed by atomic-scale STM imaging of WO3(001). Physical Review. B, Condensed Matter. 52: 14392-14395. PMID 9980767 DOI: 10.1103/Physrevb.52.R14392 |
0.346 |
|
1995 |
Jones FH, Rawlings KH, Foord JS, Cox PA, Egdell RG, Pethica JB. Real space observation of peroxide-like dimers on a sodium tungsten bronze surface by scanning tunnelling microscopy Journal of the Chemical Society, Chemical Communications. 2419-2420. DOI: 10.1039/C39950002419 |
0.344 |
|
1995 |
Jones FH, Rawlings K, Parker S, Foord JS, Cox PA, Egdell RG, Pethica JB. STM characterisation of a c(2 × 2) reconstruction on Na0.65WO3(100) Surface Science. 336: 181-192. DOI: 10.1016/0039-6028(95)00513-7 |
0.377 |
|
1994 |
Mann AB, Pethica JB, Nix WD, Tomiya S. Nanoindentation of Epitaxial Films: A Study of Pop-in Events Mrs Proceedings. 356. DOI: 10.1557/Proc-356-271 |
0.704 |
|
1994 |
O'Shea S, Welland M, Pethica J. Atomic force microscopy of local compliance at solid—liquid interfaces Chemical Physics Letters. 223: 336-340. DOI: 10.1016/0009-2614(94)00458-7 |
0.507 |
|
1993 |
Jarvis SP, Weihs TP, Oral A, Pethica JB. Mechanics of contacts at less than 100A scale: indentation and AFM Materials Research Society Symposium - Proceedings. 308: 127-132. DOI: 10.1557/Proc-308-127 |
0.649 |
|
1993 |
Jarvis SP, Oral A, Weihs TP, Pethica JB. A novel force microscope and point contact probe Review of Scientific Instruments. 64: 3515-3520. DOI: 10.1063/1.1144276 |
0.662 |
|
1992 |
Nieminen JA, Sutton AP, Pethica JB, Kaski K. Mechanism of lubrication by a thin solid film on a metal surface Modelling and Simulation in Materials Science and Engineering. 1: 83-90. DOI: 10.1088/0965-0393/1/1/008 |
0.418 |
|
1992 |
Mayne AJ, Cataldi TRI, Knall J, Avery AR, Jones TS, Pinheiro L, Hill HAO, Briggs GAD, Pethica JB, Weinberg WH. Chemisorption of organic adsorbates on silicon and gold studied by scanning tunnelling microscopy Faraday Discussions. 94: 199. DOI: 10.1039/Fd9929400199 |
0.34 |
|
1992 |
Nieminen J, Sutton A, Pethica J. Static junction growth during frictional sliding of metals Acta Metallurgica Et Materialia. 40: 2503-2509. DOI: 10.1016/0956-7151(92)90320-E |
0.356 |
|
1992 |
Wilson JH, McInnes DA, Knall J, Sutton AP, Pethica JB. Quantitative voltage-dependent STM image simulations for semiconductors Ultramicroscopy. 801-808. DOI: 10.1016/0304-3991(92)90361-M |
0.32 |
|
1991 |
Weihs TP, Lawrence CW, Derby B, Scruby CB, Pethica JB. Acoustic Emissions During Indentation Tests Mrs Proceedings. 239. DOI: 10.1557/Proc-239-361 |
0.546 |
|
1991 |
Weihs TP, Pethica JB. Monitoring Time-Dependent Deformation in Small Volumes Mrs Proceedings. 239. DOI: 10.1557/Proc-239-325 |
0.603 |
|
1991 |
Rafii-Tabar H, Pethica JB, Sutton AP. Influence of Adsorbate Monolayer on the Nano-Mechanics of TIP-Substrate Interactions Mrs Proceedings. 239. DOI: 10.1557/Proc-239-313 |
0.397 |
|
1991 |
Wilson JH, Scott PD, Pethica JB, Knall J. Reconstruction of Si(113) by adsorption of atomic hydrogen Journal of Physics: Condensed Matter. 3: S133-S138. DOI: 10.1088/0953-8984/3/S/022 |
0.329 |
|
1991 |
Nawaz Z, Knall JH, Richardson T, Roberts GG, Pethica JB. STM imaging of molecules on well defined substrates Journal of Physics: Condensed Matter. 3. DOI: 10.1088/0953-8984/3/S/002 |
0.326 |
|
1991 |
Weihs TP, Nawaz Z, Jarvis SP, Pethica JB. Limits of imaging resolution for atomic force microscopy of molecules Applied Physics Letters. 59: 3536-3538. DOI: 10.1063/1.105649 |
0.642 |
|
1990 |
Ramos MMD, Stoneham AM, Sutton AP, Pethica JB. Effects of the STM tip on atomic positions: an explanation for the nonobservation of adsorbed molecules? Journal of Physics: Condensed Matter. 2: 5913-5917. DOI: 10.1088/0953-8984/2/26/029 |
0.333 |
|
1990 |
Sutton AP, Pethica JB. Inelastic flow processes in nanometre volumes of solids Journal of Physics: Condensed Matter. 2: 5317-5326. DOI: 10.1088/0953-8984/2/24/004 |
0.358 |
|
1990 |
Cataldi TR, Blackham IG, Briggs GD, Pethica JB, Hill HO. In situ scanning tunneling microscopy Journal of Electroanalytical Chemistry and Interfacial Electrochemistry. 290: 1-20. DOI: 10.1016/0022-0728(90)87416-H |
0.437 |
|
1989 |
Todd JD, Pethica JB. Imaging by Sliding Planes in Scanning Tunnelling Microscopy Mrs Proceedings. 159. DOI: 10.1557/Proc-159-283 |
0.433 |
|
1989 |
Todd JD, Pethica JB. A shear model for STM imaging of layered materials Journal of Physics: Condensed Matter. 1: 9823-9831. DOI: 10.1088/0953-8984/1/49/003 |
0.442 |
|
1988 |
Pethica JB. Scanning tunnelling microscopes. Atomic-scale engineering. Nature. 331: 301. PMID 3340174 DOI: 10.1038/331301A0 |
0.336 |
|
1988 |
Pethica JB, Oliver WC. Mechanical Properties of Nanometre Volumes of Material: use of the Elastic Response of Small Area Indentations Mrs Proceedings. 130. DOI: 10.1557/Proc-130-13 |
0.405 |
|
1988 |
Pethica JB, Sutton AP. On the stability of a tip and flat at very small separations Journal of Vacuum Science & Technology a: Vacuum, Surfaces, and Films. 6: 2490-2494. DOI: 10.1116/1.575577 |
0.465 |
|
1988 |
Coombs J, Pethica J, Welland M. Scanning tunnelling microscopy of thin organic films Thin Solid Films. 159: 293-299. DOI: 10.1016/0040-6090(88)90641-4 |
0.386 |
|
1988 |
Coombs J, Welland M, Pethica J. Experimental barrier heights and the image potential in scanning tunneling microscopy Surface Science. 198: L353-L358. DOI: 10.1016/0039-6028(88)90365-2 |
0.301 |
|
1987 |
Pethica JB, Oliver WC. Tip Surface Interactions in STM and AFM Physica Scripta. 1987: 61-66. DOI: 10.1088/0031-8949/1987/T19A/010 |
0.476 |
|
1987 |
Pethica J. New ways to see atoms Nature. 325: 388-389. DOI: 10.1038/325388A0 |
0.327 |
|
1986 |
Baumann T, Pethica JB, Grimsditch M, Schuller IK. Nanocontact Measurements in Superlattices Mrs Proceedings. 77. DOI: 10.1557/Proc-77-527 |
0.439 |
|
1985 |
Pashley MD, Pethica JB. The role of surface forces in metal–metal contacts Journal of Vacuum Science & Technology a: Vacuum, Surfaces, and Films. 3: 757-761. DOI: 10.1116/1.573301 |
0.485 |
|
1985 |
Pethica JB, Koidl P, Gobrecht J, Schüler C. Micromechanical investigations of amorphous hydrogenated carbon films on silicon Journal of Vacuum Science & Technology a: Vacuum, Surfaces, and Films. 3: 2391-2393. DOI: 10.1116/1.572844 |
0.305 |
|
1985 |
Pashley MD, Pethica JB, Coombs J. Scanning tunnelling microscope studies Surface Science. 27-32. DOI: 10.1016/0039-6028(85)90121-9 |
0.399 |
|
1984 |
Pashley MD, Pethica JB. Failure Modes of Metal Interfaces: Experimental Evidence Relating to the Effect of Chemical Species Mrs Proceedings. 40. DOI: 10.1557/Proc-40-211 |
0.41 |
|
1984 |
Pashley MD, Pethica JB, Tabor D. Adhesion and micromechanical properties of metal surfaces Wear. 100: 7-31. DOI: 10.1016/0043-1648(84)90003-6 |
0.629 |
|
1983 |
Oliver W, Hutchings R, Pethica J, Singer I, Hubler G. Hardness as a Measure of Wear Resistance Mrs Proceedings. 27. DOI: 10.1557/Proc-27-603 |
0.313 |
|
1981 |
Pethica J, Oliver W. Ultra-Microhardness Tests on Ion Implanted Metal Surfaces Mrs Proceedings. 7. DOI: 10.1557/Proc-7-373 |
0.301 |
|
1981 |
Pethica JB. The effect of oxygen on the adhesion of clean metal surfaces Philosophical Magazine A. 43: 731-738. DOI: 10.1080/01418618108240404 |
0.399 |
|
1979 |
Pethica JB, Tabor D. Contact of characterised metal surfaces at very low loads: Deformation and adhesion Surface Science. 89: 182-190. DOI: 10.1016/0039-6028(79)90606-X |
0.611 |
|
Show low-probability matches. |