Year |
Citation |
Score |
2014 |
Ray MA, Youngstedt SD, Zhang H, Robb SW, Harmon BE, Jean-Louis G, Cai B, Hurley TG, Hébert JR, Bogan RK, Burch JB. Examination of wrist and hip actigraphy using a novel sleep estimation procedure ☆ Sleep Science. 7: 74-81. PMID 25580202 DOI: 10.1016/J.Slsci.2014.09.007 |
0.568 |
|
2014 |
Cai B, Nakarmi ML, Franks BS, Rai RC. Electro-optical effects and temperature-dependent electrical properties of LuFe2O4 thin films Thin Solid Films. 562: 490-494. DOI: 10.1016/J.Tsf.2014.04.022 |
0.65 |
|
2014 |
Oder TN, Smith A, Freeman M, McMaster M, Cai B, Nakarmi ML. Properties of ZnO thin films codoped with lithium and phosphorus Journal of Electronic Materials. 43: 1370-1378. DOI: 10.1007/S11664-014-3074-9 |
0.684 |
|
2013 |
Oder TN, Smith A, Freeman M, McMaster M, Cai B, Nakarmi ML. Properties of sputter deposited ZnO films co-doped with lithium and phosphorus Materials Research Society Symposium Proceedings. 1494: 77-82. DOI: 10.1557/Opl.2013.4 |
0.68 |
|
2013 |
Cai B, Nakarmi ML, Oder TN, Mcmaster M, Velpukonda N, Smith A. Elevated temperature dependent transport properties of phosphorus and arsenic doped zinc oxide thin films Journal of Applied Physics. 114. DOI: 10.1063/1.4845855 |
0.677 |
|
2012 |
Rai RC, Delmont A, Sprow A, Cai B, Nakarmi ML. Spin-charge-orbital coupling in multiferroic LuFe 2O 4 thin films Applied Physics Letters. 100. DOI: 10.1063/1.4720401 |
0.662 |
|
2012 |
Rai RC, Guminiak M, Wilser S, Cai B, Nakarmi ML. Elevated temperature dependence of energy band gap of ZnO thin films grown by e-beam deposition Journal of Applied Physics. 111. DOI: 10.1063/1.3699365 |
0.672 |
|
2012 |
Rai RC, Wilser S, Guminiak M, Cai B, Nakarmi ML. Optical and electronic properties of NiFe 2O 4 and CoFe 2O 4 thin films Applied Physics a: Materials Science and Processing. 106: 207-211. DOI: 10.1007/S00339-011-6549-Z |
0.668 |
|
2010 |
Cai B, Nakarmi ML. TEM analysis of microstructures of AlN/sapphire grown by MOCVD Materials Research Society Symposium Proceedings. 1202: 203-207. DOI: 10.1557/Proc-1202-I05-01 |
0.616 |
|
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