Jye-Chyi Lu
Affiliations: | North Carolina State University, Raleigh, NC | ||
| Industrial and Systems Engineering | Georgia Institute of Technology, Atlanta, GA |
Area:
StatisticsWebsite:
https://www.isye.gatech.edu/users/jye-chyi-luGoogle:
"Jye-Chyi Lu"Bio:
Parents
Sign in to add mentor| Gouri Kanta Bhattacharyya | grad student | 1988 | UW Madison | |
| (Bivariate Weibull Models and Inferences Based on Life Test of System and Components) | ||||
Children
Sign in to add trainee| Nianci Gan | grad student | 2000 | NCSU |
| Leah A. Martell | grad student | 2000 | NCSU |
| Nagesh Adiga | grad student | 2012 | Georgia Tech (E-Tree) |
BETA: Related publications
See more...
Publications
|
You can help our author matching system! If you notice any publications incorrectly attributed to this author, please sign in and mark matches as correct or incorrect. |
| Lu J, Yang Y, Han S, et al. (2020) Coordinated inventory policies for meeting demands from both store and online BOPS channels Computers & Industrial Engineering. 145: 106542 |
| Kim S, Kim H, Lu J. (2019) A practical approach to measuring the impacts of stockouts on demand Journal of Business & Industrial Marketing. 34: 891-901 |
| Tsao Y, Thanh V, Lu J. (2019) Multiobjective robust fuzzy stochastic approach for sustainable smart grid design Energy. 176: 929-939 |
| Tsao Y, Thanh V, Lu J, et al. (2018) Designing sustainable supply chain networks under uncertain environments: Fuzzy multi-objective programming Journal of Cleaner Production. 174: 1550-1565 |
| Kim H, Vastola JT, Kim S, et al. (2017) Incorporation of engineering knowledge into the modeling process: a local approach International Journal of Production Research. 55: 5865-5880 |
| Tsao Y, Linh V, Lu J. (2017) Closed-loop supply chain network designs considering RFID adoption Computers & Industrial Engineering. 113: 716-726 |
| Tsai TR, Sung WY, Lio YL, et al. (2016) Optimal Two-Variable Accelerated Degradation Test Plan for Gamma Degradation Processes Ieee Transactions On Reliability. 65: 459-468 |
| Kim H, Kim S, Deng J, et al. (2016) An integrated holistic model of a complex process The International Journal of Advanced Manufacturing Technology. 89: 1137-1147 |
| Lio YL, Lu JC, Ruan L. (2015) Robust Parameter Design for Quality and Reliability Issues Based on Accelerated Degradation Measurements Ieee Transactions On Reliability. 64: 949-959 |
| Kim S, Kim H, Lu RW, et al. (2015) Adaptive combined space-filling and D-optimal designs International Journal of Production Research |