Jeffrey B. Birch
Affiliations: | Virginia Polytechnic Institute and State University, Blacksburg, VA, United States |
Area:
StatisticsGoogle:
"Jeffrey Birch"Parents
Sign in to add mentorR. Douglas Martin | grad student | 1978 | University of Washington | |
(Small Sample Robustness Properties of Generalized M-Estimators Applied to First Order Autoregression) |
Children
Sign in to add traineeWillis A. Jensen | grad student | 2006 | Virginia Tech |
Wen Wan | grad student | 2007 | Virginia Tech |
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Publications
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Gomaa A, Birch JB. (2018) A semiparametric nonlinear mixed model approach to phase I profile monitoring Communications in Statistics - Simulation and Computation. 48: 1677-1693 |
Wan W, Pei XY, Grant S, et al. (2016) Nonlinear response surface in the study of interaction analysis of three combination drugs. Biometrical Journal. Biometrische Zeitschrift |
Chen Y, Birch JB, Woodall WH. (2016) Effect of Phase i Estimation on Phase II Control Chart Performance with Profile Data Quality and Reliability Engineering International. 32: 79-87 |
Williams JD, Birch JB, Abdel-Salam AS. (2015) Outlier robust nonlinear mixed model estimation. Statistics in Medicine. 34: 1304-16 |
Waterman MJ, Birch JB, Abdel-Salam ASG. (2015) Several nonparametric and semiparametric approaches to linear mixed model regression Journal of Statistical Computation and Simulation. 85: 956-977 |
Chen Y, Birch JB, Woodall WH. (2015) Cluster-Based Profile Analysis in Phase I Journal of Quality Technology. 47: 14-29 |
Chen Y, Birch JB, Woodall WH. (2014) A Phase I Cluster-Based Method for Analyzing Nonparametric Profiles Quality and Reliability Engineering International |
Lawrence DE, Birch JB, Chen Y. (2014) Cluster-based bounded influence regression Quality and Reliability Engineering International. 30: 97-109 |
Wan W, Birch JB. (2013) An improved hybrid genetic algorithm with a new local search procedure Journal of Applied Mathematics. 2013 |
Abdel-Salam ASG, Birch JB, Jensen WA. (2013) A semiparametric mixed model approach to phase i profile monitoring Quality and Reliability Engineering International. 29: 555-569 |