Paul Kvam

Affiliations: 
Georgia Institute of Technology, Atlanta, GA 
Area:
Statistics
Google:
"Paul Kvam"

Children

Sign in to add trainee
Suk J. Bae grad student 2003 Georgia Tech
Hyoungtae Kim grad student 2004 Georgia Tech
Ni Wang grad student 2006 Georgia Tech
Shu-Chuan Lin grad student 2008 Georgia Tech
BETA: Related publications

Publications

You can help our author matching system! If you notice any publications incorrectly attributed to this author, please sign in and mark matches as correct or incorrect.

Bae SJ, Kvam PH. (2015) Discussion of 'stochastic modelling and analysis of degradation for highly reliable products' Applied Stochastic Models in Business and Industry. 31: 33-34
Mun BM, Bae SJ, Kvam PH. (2013) A superposed log-linear failure intensity model for repairable artillery systems Journal of Quality Technology. 45: 100-115
Kang CW, Kvam PH. (2012) Basic Statistical Tools for Improving Quality Basic Statistical Tools For Improving Quality
Wang N, Lu JC, Chen D, et al. (2011) Adjusted empirical likelihood models with estimating equations for accelerated life tests Journal of Statistical Planning and Inference. 141: 140-155
Kim H, Lu JC, Kvam PH, et al. (2011) Ordering quantity decisions considering uncertainty in supply-chain logistics operations International Journal of Production Economics. 134: 16-27
Lin SC, Kvam PH, Lu JC. (2009) Extending the skill test for disease diagnosis. Statistics in Medicine. 28: 798-813
Bae SB, Kim SJ, Kuo W, et al. (2007) Statistical models for hot electron degradation in nano-scaled MOSFET devices Ieee Transactions On Reliability. 56: 392-400
Bae SJ, Kuo W, Kvam PH. (2007) Degradation models and implied lifetime distributions Reliability Engineering and System Safety. 92: 601-608
Wang N, Kvam P, Lu JC. (2007) Detection and estimation of a mixture in power law processes for a repairable system Journal of Quality Technology. 39: 140-150
Wang N, Lu JC, Kvam P. (2006) Reliability modeling in spatially distributed logistics systems Ieee Transactions On Reliability. 55: 525-534
See more...