Qingze Zou, Ph.D.

Affiliations: 
2003 University of Washington, Seattle, Seattle, WA 
Area:
Mechanical Engineering
Google:
"Qingze Zou"

Parents

Sign in to add mentor
Santosh Devasia grad student 2003 University of Washington
 (Preview-based system-inversion for output-tracking: Theory and application.)
BETA: Related publications

Publications

You can help our author matching system! If you notice any publications incorrectly attributed to this author, please sign in and mark matches as correct or incorrect.

Chen J, Zou Q. (2023) Large-range high-speed dynamic-mode atomic force microscope imaging: adaptive tapping towards minimal force. Nanotechnology
Wang J, Li X, Zou Q, et al. (2020) Rapid Broadband Discrete Nanomechanical Mapping of Soft Samples on Atomic Force Microscope. Nanotechnology
Zou Q, Clevy C, Yong YK, et al. (2020) Guest Editorial: Focused Section on Nano/Micromotion System: Design, Sensing, and Control Ieee-Asme Transactions On Mechatronics. 25: 487-490
Wang J, Zou Q. (2020) Rapid Probe Engagement and Withdrawal With Force Minimization in Atomic Force Microscopy: A Learning-Based Online-Searching Approach Ieee/Asme Transactions On Mechatronics. 25: 581-593
Liu J, Wang J, Zou Q. (2020) Decomposition-Learning-Based Output Tracking to Simultaneous Hysteresis and Dynamics Control: High-Speed Large-Range Nanopositioning Example Ieee Transactions On Control Systems and Technology. 1-8
Yi S, Li T, Zou Q. (2018) Active control of acoustics-caused nano-vibration in atomic force microscope imaging. Ultramicroscopy. 195: 101-110
Liu J, Guo Z, Zou Q. (2018) Low power femtosecond tip-based nanofabrication with advanced control Applied Physics B. 124: 23
Ren J, Zou Q. (2017) Adaptive-scanning, near-minimum-deformation atomic force microscope imaging of soft sample in liquid: Live mammalian cell example. Ultramicroscopy. 186: 150-157
Li T, Zou Q. (2017) Simultaneous topography imaging and broadband nanomechanical mapping on atomic force microscope. Nanotechnology
Ren J, Zou Q. (2017) High-speed dynamic-mode atomic force microscopy imaging of polymers: an adaptive multiloop-mode approach. Beilstein Journal of Nanotechnology. 8: 1563-1570
See more...