Yanfen Shang, Ph.D.
Affiliations: | 2011 | Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong |
Area:
Industrial EngineeringGoogle:
"Yanfen Shang"Parents
Sign in to add mentorFu-gee Tsung | grad student | HongKong University of Science and Technology | ||
Fugee Tsung | grad student | 2011 | HKUST | |
(Statistical Process Control for Manufacturing and Service Processes with Binary Outputs.) |
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Publications
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He S, Song L, Shang Y, et al. (2020) Change-point detection in Phase I for autocorrelated Poisson profiles with random or unbalanced designs International Journal of Production Research. 1-18 |
Shang Y, Li T, Song L, et al. (2019) Control charts for monitoring two-dimensional spatial count data with spatial correlations Computers & Industrial Engineering. 137: 106043 |
Li Z, Shang Y, He Z. (2019) Phase I outlier detection in profiles with binary data based on penalized likelihood Quality and Reliability Engineering International. 35: 1-13 |
Shang Y, Wang Z, Zhang Y. (2018) Nonparametric control schemes for profiles with attribute data Computers & Industrial Engineering. 125: 87-97 |
Shang Y, Wand Z, He Z, et al. (2017) Nonparametric Change-Point Detection for Profiles with Binary Data Journal of Quality Technology. 49: 123-135 |
He Z, Wang Z, Tsung F, et al. (2016) A control scheme for autocorrelated bivariate binomial data Computers and Industrial Engineering. 98: 350-359 |
Zhang Y, Shang Y, He Z, et al. (2016) CUSUM Schemes for Monitoring Prespecified Changes in Linear Profiles Quality and Reliability Engineering International. 33: 579-594 |
Shang Y, Man J, He Z, et al. (2016) Change-point Detection in Phase I for Profiles with Binary Data and Random Predictors Quality and Reliability Engineering International |
Shang Y, Zi X, Tsung F, et al. (2014) LASSO-based diagnosis scheme for multistage processes with binary data Computers & Industrial Engineering. 72: 198-205 |
Shang Y, Tsung F, Zou C. (2013) Statistical process control for multistage processes with binary outputs Iie Transactions (Institute of Industrial Engineers). 45: 1008-1023 |