Danxu Du, Ph.D.

Affiliations: 
2006 Princeton University, Princeton, NJ 
Area:
Materials Science Engineering, Electronics and Electrical Engineering
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"Danxu Du"

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David J. Srolovitz grad student 2006 Princeton
 (Modeling and simulation of faceted thin film crystal growth.)
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Publications

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Zhang H, Du D, Srolovitz DJ. (2008) Effects of boundary inclination and boundary type on shear-driven grain boundary migration Philosophical Magazine. 88: 243-256
Chua SJ, Zhou H, Srolovitz DJ, et al. (2008) Anisotropic coalescence behaviors of GaN islands grown by metal-organic chemical vapor deposition Physica Status Solidi (C). 5: 1589-1593
Gray J, Orme C, Du D, et al. (2007) In Situ Investigation of the Silver-CTAB System Mrs Proceedings. 1017
Du D, Zhang H, Srolovitz DJ. (2007) Properties and determination of the interface stiffness Acta Materialia. 55: 467-471
Zhang H, Du D, Srolovitz DJ, et al. (2006) Determination of grain boundary stiffness from molecular dynamics simulation Applied Physics Letters. 88: 121927
Du D, Srolovitz DJ. (2006) Crystal morphology evolution in film growth: A general approach Journal of Crystal Growth. 296: 86-96
Du D, Srolovitz DJ, Coltrin ME, et al. (2005) Systematic prediction of kinetically limited crystal growth morphologies. Physical Review Letters. 95: 155503
Du D, Srolovitz D. (2004) Electrostatic field-induced surface instability Applied Physics Letters. 85: 4917-4919
Du D, Srolovitz DJ. (2004) Faceted dislocation surface pits Acta Materialia. 52: 3365-3374
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