Tianquan Su, Ph.D.

Affiliations: 
2014 Optical Sciences University of Arizona, Tucson, AZ 
Area:
Optics Physics
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"Tianquan Su"
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James H. Burge grad student 2014 University of Arizona
 (Asphercial metrology for non-specular surfaces with the scanning long-wave optical test system.)
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Publications

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Graves LR, Choi H, Zhao W, et al. (2018) Model-free deflectometry for freeform optics measurement using an iterative reconstruction technique. Optics Letters. 43: 2110-2113
Oh CJ, Lowman AE, Smith GA, et al. (2016) Fabrication and testing of 4.2m off-axis aspheric primary mirror of Daniel K. Inouye Solar Telescope Proceedings of Spie. 9912
Su T, Maldonado A, Su P, et al. (2015) Instrument transfer function of slope measuring deflectometry systems. Applied Optics. 54: 2981-90
Zhao Z, Hui M, Zhou P, et al. (2014) Aberration analysis and calculation in system of Gaussian beam illuminates lenslet array Proceedings of Spie. 9195
Burge JH, Su P, Butel G, et al. (2014) Measuring large mirrors using SCOTS, the Software Configurable Optical Test System Proceedings of Spie - the International Society For Optical Engineering. 9151
Su P, Khreishi MAH, Su T, et al. (2014) Aspheric and freeform surfaces metrology with software configurable optical test system: A computerized reverse Hartmann test Optical Engineering. 53
Su T, Wang S, Parks RE, et al. (2013) Measuring rough optical surfaces using scanning long-wave optical test system. 1. Principle and implementation. Applied Optics. 52: 7117-26
Su T, Maldonado A, Su P, et al. (2013) Study of the instrument transfer function of a free-form optics metrology system: SCOTS Proceedings of Spie - the International Society For Optical Engineering. 9046
Su P, Khreishi M, Huang R, et al. (2013) Precision aspheric optics testing with SCOTS: A deflectometry approach Proceedings of Spie - the International Society For Optical Engineering. 8788
Su P, Wang S, Khreishi M, et al. (2012) SCOTS: A reverse Hartmann test with high dynamic range for Giant Magellan Telescope primary mirror segments Proceedings of Spie - the International Society For Optical Engineering. 8450
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