Taechung Yi - Publications
Affiliations: | 2000 | University of California, Los Angeles, Los Angeles, CA |
Year | Citation | Score | |||
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2000 | Yi T, Li L, Kim C. Microscale material testing of single crystalline silicon: process effects on surface morphology and tensile strength Sensors and Actuators a-Physical. 83: 172-178. DOI: 10.1016/S0924-4247(00)00350-2 | 0.423 | |||
1999 | Yi T, Kim CJ. Measurement of mechanical properties for MEMS materials Measurement Science and Technology. 10: 706-716. DOI: 10.1088/0957-0233/10/8/305 | 0.365 | |||
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