| Year |
Citation |
Score |
| 2023 |
Jaszewski ST, Calderon S, Shrestha B, Fields SS, Samanta A, Vega FJ, Minyard JD, Casamento JA, Maria JP, Podraza NJ, Dickey EC, Rappe AM, Beechem TE, Ihlefeld JF. Infrared Signatures for Phase Identification in Hafnium Oxide Thin Films. Acs Nano. PMID 38015799 DOI: 10.1021/acsnano.3c08371 |
0.816 |
|
| 2023 |
Henry MD, Smith SW, Fields SS, Jaszewski ST, Esteves G, Heinrich H, Ihlefeld JF. Impacts to FeRAM design arising from interfacial dielectric layers and wake up modulation in ferroelectric hafnium zirconium oxide. Ieee Transactions On Ultrasonics, Ferroelectrics, and Frequency Control. PMID 37703163 DOI: 10.1109/TUFFC.2023.3311328 |
0.816 |
|
| 2023 |
Kelley KP, Morozovska AN, Eliseev EA, Liu Y, Fields SS, Jaszewski ST, Mimura T, Calderon S, Dickey EC, Ihlefeld JF, Kalinin SV. Ferroelectricity in hafnia controlled via surface electrochemical state. Nature Materials. PMID 37580369 DOI: 10.1038/s41563-023-01619-9 |
0.78 |
|
| 2022 |
Aryana K, Tomko JA, Gao R, Hoglund ER, Mimura T, Makarem S, Salanova A, Hoque MSB, Pfeifer TW, Olson DH, Braun JL, Nag J, Read JC, Howe JM, Opila EJ, ... ... Ihlefeld JF, et al. Observation of solid-state bidirectional thermal conductivity switching in antiferroelectric lead zirconate (PbZrO). Nature Communications. 13: 1573. PMID 35322003 DOI: 10.1038/s41467-022-29023-y |
0.765 |
|
| 2021 |
Jenkins MA, Holden KEK, Smith SW, Brumbach MT, Henry MD, Weiland C, Woicik JC, Jaszewski ST, Ihlefeld JF, Conley JF. Determination of Hafnium Zirconium Oxide Interfacial Band Alignments Using Internal Photoemission Spectroscopy and X-ray Photoelectron Spectroscopy. Acs Applied Materials & Interfaces. PMID 33749229 DOI: 10.1021/acsami.0c17729 |
0.794 |
|
| 2021 |
Giri A, Cheaito R, Gaskins JT, Mimura T, Brown-Shaklee HJ, Medlin DL, Ihlefeld JF, Hopkins PE. Thickness-Independent Vibrational Thermal Conductance across Confined Solid-Solution Thin Films. Acs Applied Materials & Interfaces. PMID 33663216 DOI: 10.1021/acsami.0c20608 |
0.813 |
|
| 2020 |
Fields SS, Smith SW, Ryan PJ, Jaszewski ST, Brummel IA, Salanova A, Esteves G, Wolfley SL, Henry M, Davids P, Ihlefeld J. Phase Exchange Driven Wake-Up and Fatigue in Ferroelectric Hafnium Zirconium Oxide Films. Acs Applied Materials & Interfaces. PMID 32410447 DOI: 10.1021/Acsami.0C03570 |
0.742 |
|
| 2020 |
Ihlefeld JF, Luk TS, Smith SW, Fields SS, Jaszewski ST, Hirt DM, Riffe WT, Bender S, Constantin C, Ayyasamy MV, Balachandran PV, Lu P, Henry MD, Davids PS. Compositional dependence of linear and nonlinear optical response in crystalline hafnium zirconium oxide thin films Journal of Applied Physics. 128: 34101. DOI: 10.1063/5.0012175 |
0.702 |
|
| 2019 |
Sharma PA, Brumbach M, Adams DP, Ihlefeld JF, Lima-Sharma AL, Chou S, Sugar JD, Lu P, Michael JR, Ingersoll D. Electrical contact uniformity and surface oxidation of ternary chalcogenide alloys Aip Advances. 9: 15125. DOI: 10.1063/1.5081818 |
0.437 |
|
| 2019 |
Henry MD, Smith SW, Lewis RM, Ihlefeld JF. Stabilization of ferroelectric phase of Hf0.58Zr0.42O2 on NbN at 4 K Applied Physics Letters. 114: 92903. DOI: 10.1063/1.5052435 |
0.705 |
|
| 2018 |
Foley BM, Wallace M, Gaskins JT, Paisley EA, Johnson-Wilke RL, Kim JW, Ryan PJ, Trolier-McKinstry S, Hopkins PE, Ihlefeld J. Voltage Controlled Bistable Thermal Conductivity in Suspended Ferroelectric Thin Film Membranes. Acs Applied Materials & Interfaces. PMID 29978704 DOI: 10.1021/Acsami.8B04169 |
0.81 |
|
| 2018 |
Pan W, Lu P, Ihlefeld JF, Lee SR, Choi ES, Jiang Y, Jia QX. Electrical-current-induced magnetic hysteresis in self-assembled vertically aligned La2/3Sr1/3MnO3:ZnO nanopillar composites Physical Review Materials. 2. DOI: 10.1103/Physrevmaterials.2.021401 |
0.417 |
|
| 2018 |
Scott EA, Smith SW, Henry MD, Rost CM, Giri A, Gaskins JT, Fields SS, Jaszewski ST, Ihlefeld JF, Hopkins PE. Thermal resistance and heat capacity in hafnium zirconium oxide (Hf1–xZrxO2) dielectrics and ferroelectric thin films Applied Physics Letters. 113: 192901. DOI: 10.1063/1.5052244 |
0.808 |
|
| 2018 |
Smith SW, Henry MD, Brumbach MT, Rodriguez MA, Ihlefeld JF. Thickness scaling of pyroelectric response in thin ferroelectric Hf1−xZrxO2 films Applied Physics Letters. 113: 182904. DOI: 10.1063/1.5045635 |
0.709 |
|
| 2018 |
Paisley EA, Brumbach MT, Shelton CT, Allerman AA, Atcitty S, Rost CM, Ohlhausen JA, Doyle BL, Sitar Z, Maria J, Ihlefeld JF. Nitride surface chemistry influence on band offsets at epitaxial oxide/GaN interfaces Applied Physics Letters. 112: 092903. DOI: 10.1063/1.5013605 |
0.783 |
|
| 2018 |
Small LJ, Wheeler JS, Ihlefeld JF, Clem PG, Spoerke ED. Enhanced alkaline stability in a hafnium-substituted NaSICON ion conductor Journal of Materials Chemistry. 6: 9691-9698. DOI: 10.1039/C7Ta09924J |
0.491 |
|
| 2018 |
Lu P, Zhou L, Ihlefeld J, Pan W. Atomistic Understanding of Interface Structures and Properties in Self-Assembled and Vertically Aligned Nanocomposite Thin Films by Advanced Scanning Transmission Electron Microscopy Microscopy and Microanalysis. 24: 66-67. DOI: 10.1017/S143192761800082X |
0.461 |
|
| 2018 |
Beechem TE, Goldflam MD, Sinclair MB, Peters DW, McDonald AE, Paisley EA, Kitahara AR, Drury DE, Burckel DB, Finnegan PS, Kim J, Choi Y, Ryan PJ, Ihlefeld JF. Tunable Infrared Devices via Ferroelectrics: Tunable Infrared Devices via Ferroelectric Domain Reconfiguration (Advanced Optical Materials 24/2018) Advanced Optical Materials. 6: 1870094. DOI: 10.1002/Adom.201870094 |
0.776 |
|
| 2018 |
Beechem TE, Goldflam MD, Sinclair MB, Peters DW, McDonald AE, Paisley EA, Kitahara AR, Drury DE, Burckel DB, Finnegan PS, Kim J, Choi Y, Ryan PJ, Ihlefeld JF. Tunable Infrared Devices via Ferroelectric Domain Reconfiguration Advanced Optical Materials. 6: 1800862. DOI: 10.1002/Adom.201800862 |
0.77 |
|
| 2017 |
Wood MG, Campione S, Serkland DK, Parameswaran S, Ihlefeld J, Luk TS, Wendt JR, Geib KM, Keeler GA. High-Mobility Transparent Conducting Oxides for Compact Epsilon-Near-Zero Silicon Integrated Optical Modulators Frontiers in Optics. DOI: 10.1364/Fio.2017.Jw3A.46 |
0.326 |
|
| 2017 |
Campione S, Wood MG, Serkland DK, Parameswaran S, Ihlefeld J, Luk TS, Wendt JR, Geib KM, Keeler GA. Submicrometer Epsilon-Near-Zero Electroabsorption Modulators Enabled by High-Mobility Cadmium Oxide Ieee Photonics Journal. 9: 1-7. DOI: 10.1109/Jphot.2017.2723299 |
0.46 |
|
| 2017 |
Iamsasri T, Guerrier J, Esteves G, Fancher CM, Wilson AG, Smith RC, Paisley EA, Johnson-Wilke R, Ihlefeld JF, Bassiri-Gharb N, Jones JL. A Bayesian approach to modeling diffraction profiles and application to ferroelectric materials Journal of Applied Crystallography. 50: 211-220. DOI: 10.1107/S1600576716020057 |
0.792 |
|
| 2017 |
Smith EH, Ihlefeld JF, Heikes CA, Paik H, Nie Y, Adamo C, Heeg T, Liu Z, Schlom DG. Exploiting kinetics and thermodynamics to grow phase-pure complex oxides by molecular-beam epitaxy under continuous codeposition Physical Review Materials. 1. DOI: 10.1103/Physrevmaterials.1.023403 |
0.604 |
|
| 2017 |
Shelton CT, Bryan I, Paisley EA, Sachet E, Ihlefeld JF, Lavrik N, Collazo R, Sitar Z, Maria J. Step-free GaN surfaces grown by confined-area metal-organic vapor phase epitaxy Apl Materials. 5: 096109. DOI: 10.1063/1.4993840 |
0.77 |
|
| 2017 |
Brewer SJ, Zhou H, Williams SC, Rudy RQ, Rivas M, Polcawich RG, Cress CD, Glaser ER, Paisley EA, Ihlefeld JF, Jones JL, Bassiri-Gharb N. Effect of microstructure on irradiated ferroelectric thin films Journal of Applied Physics. 121: 244102. DOI: 10.1063/1.4987032 |
0.811 |
|
| 2017 |
Foley BM, Paisley EA, DiAntonio C, Chavez T, Blea-Kirby M, Brennecka G, Gaskins JT, Ihlefeld JF, Hopkins PE. Phonon scattering mechanisms dictating the thermal conductivity of lead zirconate titanate (PbZr1−xTixO3) thin films across the compositional phase diagram Journal of Applied Physics. 121: 205104. DOI: 10.1063/1.4983356 |
0.842 |
|
| 2017 |
Sharma PA, Brown-Shaklee HJ, Ihlefeld JF. Oxygen partial pressure dependence of thermoelectric power factor in polycrystalline n-type SrTiO3: Consequences for long term stability in thermoelectric oxides Applied Physics Letters. 110: 173901. DOI: 10.1063/1.4982239 |
0.749 |
|
| 2017 |
Smith SW, Kitahara AR, Rodriguez MA, Henry MD, Brumbach MT, Ihlefeld JF. Pyroelectric response in crystalline hafnium zirconium oxide (Hf1-xZrxO2) thin films Applied Physics Letters. 110: 72901. DOI: 10.1063/1.4976519 |
0.682 |
|
| 2017 |
Kang X, Shetty S, Garten L, Ihlefeld JF, Trolier-McKinstry S, Maria J. Enhanced dielectric and piezoelectric responses in Zn1-xMgxO thin films near the phase separation boundary Applied Physics Letters. 110: 042903. DOI: 10.1063/1.4973756 |
0.631 |
|
| 2017 |
Ihlefeld JF, Michael JR, McKenzie BB, Scrymgeour DA, Maria J, Paisley EA, Kitahara AR. Domain imaging in ferroelectric thin films via channeling-contrast backscattered electron microscopy Journal of Materials Science. 52: 1071-1081. DOI: 10.1007/S10853-016-0402-X |
0.793 |
|
| 2016 |
Lu P, Yuan RL, Ihlefeld JF, Spoerke ED, Pan W, Zuo JM. Fast Atomic-Scale Chemical Imaging of Crystalline Materials and Dynamic Phase Transformations. Nano Letters. PMID 26943670 DOI: 10.1021/Acs.Nanolett.6B00401 |
0.305 |
|
| 2016 |
Ihlefeld JF, Harris DT, Keech R, Jones JL, Maria JP, Trolier-McKinstry S. Scaling Effects in Perovskite Ferroelectrics: Fundamental Limits and Process-Structure-Property Relations Journal of the American Ceramic Society. 99: 2537-2557. DOI: 10.1111/Jace.14387 |
0.786 |
|
| 2016 |
Ihlefeld JF, Gurniak E, Jones BH, Wheeler DR, Rodriguez MA, McDaniel AH, Dunn B. Scaling Effects in Sodium Zirconium Silicate Phosphate (Na1+xZr2SixP3−xO12) Ion-Conducting Thin Films Journal of the American Ceramic Society. 99: 2729-2736. DOI: 10.1111/Jace.14285 |
0.405 |
|
| 2016 |
Wang JJ, Wang Y, Ihlefeld JF, Hopkins PE, Chen LQ. Tunable thermal conductivity via domain structure engineering in ferroelectric thin films: A phase-field simulation Acta Materialia. 111: 220-231. DOI: 10.1016/J.Actamat.2016.03.069 |
0.462 |
|
| 2016 |
Meyer KE, Cheaito R, Paisley E, Shelton CT, Braun JL, Maria JP, Ihlefeld JF, Hopkins PE. Crystalline coherence length effects on the thermal conductivity of MgO thin films Journal of Materials Science. 51: 10408-10417. DOI: 10.1007/S10853-016-0261-5 |
0.826 |
|
| 2015 |
Ihlefeld JF, Foley BM, Scrymgeour DA, Michael JR, McKenzie BB, Medlin DL, Wallace M, Trolier-McKinstry S, Hopkins PE. Room-temperature voltage tunable phonon thermal conductivity via reconfigurable interfaces in ferroelectric thin films. Nano Letters. 15: 1791-5. PMID 25695423 DOI: 10.1021/Nl504505T |
0.598 |
|
| 2015 |
Sachet E, Shelton CT, Harris JS, Gaddy BE, Irving DL, Curtarolo S, Donovan BF, Hopkins PE, Sharma PA, Sharma AL, Ihlefeld J, Franzen S, Maria JP. Dysprosium-doped cadmium oxide as a gateway material for mid-infrared plasmonics. Nature Materials. 14: 414-20. PMID 25686264 DOI: 10.1038/Nmat4203 |
0.799 |
|
| 2015 |
Ihlefeld JF, Kotula PG, Gauntt BD, Gough DV, Brennecka GL, Lu P, Spoerke ED. Solution Chemistry, Substrate, and Processing Effects on Chemical Homogeneity in Lead Zirconate Titanate Thin Films Journal of the American Ceramic Society. 98: 2028-2038. DOI: 10.1111/Jace.13576 |
0.45 |
|
| 2015 |
Cheaito R, Gaskins JT, Caplan ME, Donovan BF, Foley BM, Giri A, Duda JC, Szwejkowski CJ, Constantin C, Brown-Shaklee HJ, Ihlefeld JF, Hopkins PE. Thermal boundary conductance accumulation and interfacial phonon transmission: Measurements and theory Physical Review B - Condensed Matter and Materials Physics. 91. DOI: 10.1103/Physrevb.91.035432 |
0.777 |
|
| 2015 |
Paisley EA, Brumbach M, Allerman AA, Atcitty S, Baca AG, Armstrong AM, Kaplar RJ, Ihlefeld JF. Spectroscopic investigations of band offsets of MgO|AlxGa1-xN epitaxial heterostructures with varying AlN content Applied Physics Letters. 107. DOI: 10.1063/1.4930309 |
0.782 |
|
| 2015 |
Cui J, Liang CY, Paisley EA, Sepulveda A, Ihlefeld JF, Carman GP, Lynch CS. Generation of localized strain in a thin film piezoelectric to control individual magnetoelectric heterostructures Applied Physics Letters. 107. DOI: 10.1063/1.4930071 |
0.815 |
|
| 2015 |
Landon CD, Wilke RHT, Brumbach MT, Brennecka GL, Blea-Kirby M, Ihlefeld JF, Marinella MJ, Beechem TE. Erratum: “Thermal transport in tantalum oxide films for memristive applications” [Appl. Phys. Lett. 107, 023108 (2015)] Applied Physics Letters. 107: 59902. DOI: 10.1063/1.4928532 |
0.423 |
|
| 2015 |
Landon CD, Wilke RHT, Brumbach MT, Brennecka GL, Blea-Kirby M, Ihlefeld JF, Marinella MJ, Beechem TE. Thermal transport in tantalum oxide films for memristive applications Applied Physics Letters. 107. DOI: 10.1063/1.4926921 |
0.429 |
|
| 2015 |
Giri A, Gaskins JT, Donovan BF, Szwejkowski C, Warzoha RJ, Rodriguez MA, Ihlefeld J, Hopkins PE. Mechanisms of nonequilibrium electron-phonon coupling and thermal conductance at interfaces Journal of Applied Physics. 117. DOI: 10.1063/1.4914867 |
0.338 |
|
| 2015 |
Cheaito R, Hattar K, Gaskins JT, Yadav AK, Duda JC, Beechem TE, Ihlefeld JF, Piekos ES, Baldwin JK, Misra A, Hopkins PE. Thermal flux limited electron Kapitza conductance in copper-niobium multilayers Applied Physics Letters. 106. DOI: 10.1063/1.4913420 |
0.403 |
|
| 2015 |
Lu P, Romero E, Ihlefeld J, Pan W, Zhang W, Wang H, Jia Q. Atomic-scale EDS Mapping for Chemical Imaging and Quantification of Interdiffusion in Self-assembled Vertically Aligned Nanocomposite Thin Films Microscopy and Microanalysis. 21: 2249-2250. DOI: 10.1017/S1431927615012027 |
0.397 |
|
| 2015 |
Rodriguez MA, Griego JJM, Brown-Shaklee HJ, Blea-Kirby MA, Ihlefeld JF, Spoerke ED. X-ray powder diffraction study of La2LiTaO6 Powder Diffraction. 30: 57-62. DOI: 10.1017/S0885715614001183 |
0.732 |
|
| 2015 |
Brown-Shaklee HJ, Sharma PA, Ihlefeld JF. Instrument for stable high temperature Seebeck coefficient and resistivity measurements under controlled oxygen partial pressure Journal of Materials Science. 50: 5005-5013. DOI: 10.1007/S10853-015-9049-2 |
0.744 |
|
| 2015 |
Jones JL, LeBeau JM, Nikkel J, Oni AA, Dycus JH, Cozzan C, Lin F, Chernatynskiy A, Nino JC, Sinnott SB, Mhin S, Brennecka GL, Ihlefeld J. Thin Films: Combined Experimental and Computational Methods Reveal the Evolution of Buried Interfaces during Synthesis of Ferroelectric Thin Films (Adv. Mater. Interfaces 10/2015) Advanced Materials Interfaces. 2. DOI: 10.1002/Admi.201570048 |
0.449 |
|
| 2015 |
Jones JL, LeBeau JM, Nikkel J, Oni AA, Dycus JH, Cozzan C, Lin FY, Chernatynskiy A, Nino JC, Sinnott SB, Mhin S, Brennecka GL, Ihlefeld J. Combined Experimental and Computational Methods Reveal the Evolution of Buried Interfaces during Synthesis of Ferroelectric Thin Films Advanced Materials Interfaces. 2. DOI: 10.1002/Admi.201500181 |
0.455 |
|
| 2014 |
Meier W, Apblett C, Ingersoll D, McDaniel A, Ihlefeld JF. Preparation and Processing Temperature Effects on Ion Conductivity in Solution Derived Sodium Zirconium Phosphate (NaZr2P3O12) Thin Films Journal of the Electrochemical Society. 161. DOI: 10.1149/2.068403Jes |
0.38 |
|
| 2014 |
Foley BM, Brown-Shaklee HJ, Campion MJ, Medlin DL, Clem PG, Ihlefeld JF, Hopkins PE. Glass-like thermal conductivity of (010)-textured lanthanum-doped strontium niobate synthesized with wet chemical deposition Journal of the American Ceramic Society. 98: 624-628. DOI: 10.1111/Jace.13318 |
0.808 |
|
| 2014 |
Kirchhofer R, Diercks DR, Gorman BP, Ihlefeld JF, Kotula PG, Shelton CT, Brennecka GL. Quantifying compositional homogeneity in Pb (Zr, Ti) O 3 using atom probe tomography Journal of the American Ceramic Society. 97: 2677-2697. DOI: 10.1111/Jace.13135 |
0.379 |
|
| 2014 |
Mhin S, Nittala K, Lee J, Robinson DS, Ihlefeld JF, Brennecka GL, Sanchez LM, Polcawich RG, Jones JL. Phase and texture evolution in chemically derived PZT thin films on Pt substrates Journal of the American Ceramic Society. 97: 2973-2979. DOI: 10.1111/Jace.13007 |
0.419 |
|
| 2014 |
Gorham CS, Hattar K, Cheaito R, Duda JC, Gaskins JT, Beechem TE, Ihlefeld JF, Biedermann LB, Piekos ES, Medlin DL, Hopkins PE. Ion irradiation of the native oxide/silicon surface increases the thermal boundary conductance across aluminum/silicon interfaces Physical Review B - Condensed Matter and Materials Physics. 90. DOI: 10.1103/Physrevb.90.024301 |
0.32 |
|
| 2014 |
Jahangir S, Cheng X, Huang HH, Ihlefeld J, Nagarajan V. In-situ investigation of thermal instabilities and solid state dewetting in polycrystalline platinum thin films via confocal laser microscopy Journal of Applied Physics. 116: 163511. DOI: 10.1063/1.4898691 |
0.449 |
|
| 2014 |
Donovan BF, Foley BM, Ihlefeld JF, Maria JP, Hopkins PE. Spectral phonon scattering effects on the thermal conductivity of nano-grained barium titanate Applied Physics Letters. 105. DOI: 10.1063/1.4893920 |
0.711 |
|
| 2014 |
Ihlefeld JF, Brumbach M, Allerman AA, Wheeler DR, Atcitty S. AlGaN composition dependence of the band offsets for epitaxial Gd2O3/AlxGa12xN (0 &lex &le0.67) heterostructures Applied Physics Letters. 105. DOI: 10.1063/1.4889883 |
0.444 |
|
| 2014 |
Mily EJ, Oni A, Lebeau JM, Liu Y, Brown-Shaklee HJ, Ihlefeld JF, Maria JP. The role of terminal oxide structure and properties in nanothermite reactions Thin Solid Films. 562: 405-410. DOI: 10.1016/J.Tsf.2014.05.005 |
0.808 |
|
| 2014 |
Schaefer BT, Cheung J, Ihlefeld JF, Jones JL, Nagarajan V. Erratum to “Stability and dewetting kinetics of thin gold films on Ti, TiOx and ZnO adhesion layers” [Acta Mater. 61 (2013) 7841–7848] Acta Materialia. 70: 316-317. DOI: 10.1016/J.Actamat.2013.12.024 |
0.443 |
|
| 2013 |
Wen H, Chen P, Cosgriff MP, Walko DA, Lee JH, Adamo C, Schaller RD, Ihlefeld JF, Dufresne EM, Schlom DG, Evans PG, Freeland JW, Li Y. Electronic origin of ultrafast photoinduced strain in BiFeO3. Physical Review Letters. 110: 037601. PMID 23373952 DOI: 10.1103/Physrevlett.110.037601 |
0.579 |
|
| 2013 |
Small L, Brumbach M, Apblett C, Ihlefeld JF, Brennecka G, Duquette D. On the degradation processes of thin film PZT in 0.1 N H2SO4 Journal of the Electrochemical Society. 160: C128-C135. DOI: 10.1149/2.005304Jes |
0.401 |
|
| 2013 |
Mhin S, Cozzan C, Nittala K, Wanninkhof P, Ihlefeld JF, Brennecka GL, Jones JL. Effect of switching atmospheric conditions during crystallization on the phase evolution of solution-derived lead zirconate titanate thin films Journal of the American Ceramic Society. 96: 2706-2709. DOI: 10.1111/Jace.12522 |
0.459 |
|
| 2013 |
Campion MJ, Brown-Shaklee HJ, Rodriguez MA, Richardson JJ, Clem PG, Ihlefeld JF. Crystallization atmosphere and substrate effects on the phase and texture of chemical solution deposited strontium niobate thin films Journal of the American Ceramic Society. 96: 743-749. DOI: 10.1111/Jace.12193 |
0.794 |
|
| 2013 |
Harris DT, Burch MJ, Ihlefeld JF, Lam PG, Li J, Dickey EC, Maria JP. Realizing strain enhanced dielectric properties in BaTiO3 films by liquid phase assisted growth Applied Physics Letters. 103. DOI: 10.1063/1.4813270 |
0.835 |
|
| 2013 |
Nittala K, Mhin S, Dunnigan KM, Robinson DS, Ihlefeld JF, Kotula PG, Brennecka GL, Jones JL. Phase and texture evolution in solution deposited lead zirconate titanate thin films: Formation and role of the Pt3Pb intermetallic phase Journal of Applied Physics. 113. DOI: 10.1063/1.4811687 |
0.476 |
|
| 2013 |
Ihlefeld JF, Brumbach M, Atcitty S. Band offsets of La2O3 on (0001) GaN grown by reactive molecular-beam epitaxy Applied Physics Letters. 102. DOI: 10.1063/1.4803091 |
0.462 |
|
| 2013 |
Liu S, Ihlefeld JF, Dominguez J, Gonzales EF, Bower JE, Burckel BD, Sinclair MB, Brener I. Realization of tellurium-based all dielectric optical metamaterials using a multi-cycle deposition-etch process Cleo: Science and Innovations, Cleo_si 2013. CW3O.2. DOI: 10.1063/1.4803019 |
0.309 |
|
| 2013 |
Hopkins PE, Adamo C, Ye L, Huey BD, Lee SR, Schlom DG, Ihlefeld JF. Effects of coherent ferroelastic domain walls on the thermal conductivity and Kapitza conductance in bismuth ferrite Applied Physics Letters. 102. DOI: 10.1063/1.4798497 |
0.608 |
|
| 2013 |
Graham JT, Brennecka GL, Ferreira P, Small L, Duquette D, Apblett C, Landsberger S, Ihlefeld JF. Neutron irradiation effects on domain wall mobility and reversibility in lead zirconate titanate thin films Journal of Applied Physics. 113. DOI: 10.1063/1.4795869 |
0.448 |
|
| 2013 |
Schaefer BT, Cheung J, Ihlefeld JF, Jones JL, Nagarajan V. Stability and dewetting kinetics of thin gold films on Ti, TiOx and ZnO adhesion layers Acta Materialia. 61: 7841-7848. DOI: 10.1016/J.Actamat.2013.09.022 |
0.382 |
|
| 2013 |
Ihlefeld JF, Losego MD, Maria JP. Base metal bottom electrodes Chemical Solution Deposition of Functional Oxide Thin Films. 571-592. DOI: 10.1007/978-3-211-99311-8_23 |
0.725 |
|
| 2012 |
Cheaito R, Duda JC, Beechem TE, Hattar K, Ihlefeld JF, Medlin DL, Rodriguez MA, Campion MJ, Piekos ES, Hopkins PE. Experimental investigation of size effects on the thermal conductivity of silicon-germanium alloy thin films. Physical Review Letters. 109: 195901. PMID 23215405 DOI: 10.1103/Physrevlett.109.195901 |
0.454 |
|
| 2012 |
Small L, Apblett C, Ihlefeld JF, Brennecka G, Duquette DJ. Electrochemical Response of Ferroelectric PbZr0.52Ti0.48O3 Thin Films Journal of the Electrochemical Society. 159. DOI: 10.1149/2.031208Jes |
0.405 |
|
| 2012 |
Small L, Cook A, Apblett C, Ihlefeld JF, Brennecka G, Duquette D. An automated electrochemical probe for evaluation of thin films Journal of the Electrochemical Society. 159: F87-F90. DOI: 10.1149/2.007205Jes |
0.425 |
|
| 2012 |
Foley BM, Brown-Shaklee HJ, Duda JC, Cheaito R, Gibbons BJ, Medlin D, Ihlefeld JF, Hopkins PE. Thermal conductivity of nano-grained SrTiO3 thin films Applied Physics Letters. 101. DOI: 10.1063/1.4769448 |
0.795 |
|
| 2012 |
Nittala K, Mhin S, Jones JL, Robinson DS, Ihlefeld JF, Brennecka GL. In situ x-ray diffraction of solution-derived ferroelectric thin films for quantitative phase and texture evolution measurement Journal of Applied Physics. 112. DOI: 10.1063/1.4766387 |
0.438 |
|
| 2012 |
Dongmo P, Zhong Y, Attia P, Bomberger C, Cheaito R, Ihlefeld JF, Hopkins PE, Zide J. Enhanced room temperature electronic and thermoelectric properties of the dilute bismuthide InGaBiAs Journal of Applied Physics. 112. DOI: 10.1063/1.4761996 |
0.39 |
|
| 2012 |
Ihlefeld JF, Shelton CT. Chemical homogeneity effects on the nonlinear dielectric response of lead zirconate titanate thin films Applied Physics Letters. 101. DOI: 10.1063/1.4742171 |
0.48 |
|
| 2012 |
Shelton CT, Kotula PG, Brennecka GL, Lam PG, Meyer KE, Maria J, Gibbons BJ, Ihlefeld JF. Functional Coatings: Chemically Homogeneous Complex Oxide Thin Films Via Improved Substrate Metallization (Adv. Funct. Mater. 11/2012) Advanced Functional Materials. 22: 2214-2214. DOI: 10.1002/Adfm.201290066 |
0.807 |
|
| 2012 |
Shelton CT, Kotula PG, Brennecka GL, Lam PG, Meyer KE, Maria JP, Gibbons BJ, Ihlefeld JF. Chemically homogeneous complex oxide thin films via improved substrate metallization Advanced Functional Materials. 22: 2295-2302. DOI: 10.1002/Adfm.201103077 |
0.802 |
|
| 2011 |
Ihlefeld JF, Clem PG, Doyle BL, Kotula PG, Fenton KR, Apblett CA. Fast lithium-ion conducting thin-film electrolytes integrated directly on flexible substrates for high-power solid-state batteries. Advanced Materials (Deerfield Beach, Fla.). 23: 5663-7. PMID 22057430 DOI: 10.1002/Adma.201102980 |
0.378 |
|
| 2011 |
Hopkins PE, Beechem T, Duda JC, Hattar K, Ihlefeld JF, Rodriguez MA, Piekos ES. Influence of anisotropy on thermal boundary conductance at solid interfaces Physical Review B - Condensed Matter and Materials Physics. 84. DOI: 10.1103/Physrevb.84.125408 |
0.345 |
|
| 2011 |
Desmarais J, Ihlefeld JF, Heeg T, Schubert J, Schlom DG, Huey BD. Mapping and statistics of ferroelectric domain boundary angles and types Applied Physics Letters. 99. DOI: 10.1063/1.3643155 |
0.584 |
|
| 2011 |
Hopkins PE, Hattar K, Beechem T, Ihlefeld JF, Medlin DL, Piekos ES. Reduction in thermal boundary conductance due to proton implantation in silicon and sapphire Applied Physics Letters. 98. DOI: 10.1063/1.3592822 |
0.309 |
|
| 2011 |
Sheehan C, Jung Y, Holesinger T, Feldmann DM, Edney C, Ihlefeld JF, Clem PG, Matias V. Solution deposition planarization of long-length flexible substrates Applied Physics Letters. 98. DOI: 10.1063/1.3554754 |
0.422 |
|
| 2011 |
Aygün SM, Ihlefeld JF, Borland WJ, Maria JP. Permittivity scaling in Ba1-xSrxTiO3 thin films and ceramics Journal of Applied Physics. 109. DOI: 10.1063/1.3514127 |
0.831 |
|
| 2010 |
Ihlefeld JF, Daniels PR, Aygiin SM, Borland WJ, Maria JP. Property engineering In BaTIO3 films by stoichiometry control Journal of Materials Research. 25: 1064-1071. DOI: 10.1557/Jmr.2010.0151 |
0.72 |
|
| 2010 |
Brennecka GL, Ihlefeld JF, Maria JP, Tuttle BA, Clem PG. Processing technologies for high-permittivity thin films in capacitor applications Journal of the American Ceramic Society. 93: 3935-3954. DOI: 10.1111/J.1551-2916.2010.04211.X |
0.712 |
|
| 2010 |
Ihlefeld JF, Folkman CM, Baek SH, Brennecka GL, George MC, Carroll JF, Eom CB. Effect of domain structure on dielectric nonlinearity in epitaxial BiFeO3 films Applied Physics Letters. 97. DOI: 10.1063/1.3533017 |
0.368 |
|
| 2010 |
Ihlefeld JF, Ginn JC, Shelton DJ, Matias V, Rodriguez MA, Kotula PG, Carroll JF, Boreman GD, Clem PG, Sinclair MB. Crystal coherence length effects on the infrared optical response of MgO thin films Applied Physics Letters. 97. DOI: 10.1063/1.3515901 |
0.458 |
|
| 2010 |
Lee JH, Ke X, Misra R, Ihlefeld JF, Xu XS, Mei ZG, Heeg T, Roeckerath M, Schubert J, Liu ZK, Musfeldt JL, Schiffer P, Schlom DG. Adsorption-controlled growth of BiMnO3 films by molecular-beam epitaxy Applied Physics Letters. 96. DOI: 10.1063/1.3457786 |
0.676 |
|
| 2010 |
Xu XS, Ihlefeld JF, Lee JH, Ezekoye OK, Vlahos E, Ramesh R, Gopalan V, Pan XQ, Schlom DG, Musfeldt JL. Tunable band gap in Bi (Fe1-x Mnx) O3 films Applied Physics Letters. 96. DOI: 10.1063/1.3427499 |
0.637 |
|
| 2009 |
Zeches RJ, Rossell MD, Zhang JX, Hatt AJ, He Q, Yang CH, Kumar A, Wang CH, Melville A, Adamo C, Sheng G, Chu YH, Ihlefeld JF, Erni R, Ederer C, et al. A strain-driven morphotropic phase boundary in BiFeO3. Science (New York, N.Y.). 326: 977-80. PMID 19965507 DOI: 10.1126/Science.1177046 |
0.633 |
|
| 2009 |
Ihlefeld JF, Tian W, Liu ZK, Doolittle WA, Bernhagen M, Reiche P, Uecker R, Ramesh R, Schlom DG. Adsorption-controlled growth of BiFeO3 by MBE and integration with wide band gap semiconductors. Ieee Transactions On Ultrasonics, Ferroelectrics, and Frequency Control. 56: 1528-33. PMID 19686967 DOI: 10.1109/TUFFC.2009.1216 |
0.651 |
|
| 2009 |
Zhang J, Rutkowski M, Martin LW, Conry T, Ramesh R, Ihlefeld JF, Melville A, Schlom DG, Brillson LJ. Surface, bulk, and interface electronic states of epitaxial BiFeO 3 films Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 27: 2012-2014. DOI: 10.1116/1.3130152 |
0.626 |
|
| 2009 |
Ramirez MO, Kumar A, Denev SA, Podraza NJ, Xu XS, Rai RC, Chu YH, Seidel J, Martin LW, Yang SY, Saiz E, Ihlefeld JF, Lee S, Klug J, Cheong SW, et al. Magnon sidebands and spin-charge coupling in bismuth ferrite probed by nonlinear optical spectroscopy Physical Review B - Condensed Matter and Materials Physics. 79. DOI: 10.1103/Physrevb.79.224106 |
0.567 |
|
| 2009 |
Yang SY, Martin LW, Byrnes SJ, Conry TE, Basu SR, Paran D, Reichertz L, Ihlefeld J, Adamo C, Melville A, Chu YH, Yang CH, Musfeldt JL, Schlom DG, Ager JW, et al. Photovoltaic effects in BiFeO3 Applied Physics Letters. 95. DOI: 10.1063/1.3204695 |
0.651 |
|
| 2009 |
Ramirez MO, Kumar A, Denev SA, Chu YH, Seidel J, Martin LW, Yang SY, Rai RC, Xue XS, Ihlefeld JF, Podraza NJ, Saiz E, Lee S, Klug J, Cheong SW, et al. Spin-charge-lattice coupling through resonant multimagnon excitations in multiferroic BiFe O3 Applied Physics Letters. 94. DOI: 10.1063/1.3118576 |
0.532 |
|
| 2008 |
Daniels PR, Aygun S, Ihlefeld JF, Borland W, Maria JP. TF022 - Grain size effects of A:B site ratio in BaTiO3 thin films Ieee International Symposium On Applications of Ferroelectrics. 2. DOI: 10.1109/ISAF.2008.4693862 |
0.682 |
|
| 2008 |
Ihlefeld JF, Vodnick AM, Baker SP, Borland WJ, Maria JP. Extrinsic scaling effects on the dielectric response of ferroelectric thin films Journal of Applied Physics. 103. DOI: 10.1063/1.2903211 |
0.764 |
|
| 2008 |
Kumar A, Rai RC, Podraza NJ, Denev S, Ramirez M, Chu YH, Martin LW, Ihlefeld J, Heeg T, Schubert J, Schlom DG, Orenstein J, Ramesh R, Collins RW, Musfeldt JL, et al. Linear and nonlinear optical properties of BiFeO3 Applied Physics Letters. 92. DOI: 10.1063/1.2901168 |
0.532 |
|
| 2008 |
Ihlefeld JF, Podraza NJ, Liu ZK, Rai RC, Xu X, Heeg T, Chen YB, Li J, Collins RW, Musfeldt JL, Pan XQ, Schubert J, Ramesh R, Schlom DG. Optical band gap of BiFe O3 grown by molecular-beam epitaxy Applied Physics Letters. 92. DOI: 10.1063/1.2901160 |
0.678 |
|
| 2008 |
Losego MD, Ihlefeld JF, Maria JP. Importance of solution chemistry in preparing sol-gel PZT thin films directly on copper surfaces Chemistry of Materials. 20: 303-307. DOI: 10.1021/Cm070999Q |
0.809 |
|
| 2008 |
Ihlefeld JF, Borland WJ, Maria JP. Dielectric and microstructural properties of barium titanate hafnate thin films Thin Solid Films. 516: 3162-3166. DOI: 10.1016/J.Tsf.2007.08.096 |
0.76 |
|
| 2008 |
Laughlin B, Ihlefeld JF, Daniels P, Maria JP. Flexible and lithography-compatible copper foil substrates for ferroelectric thin films Thin Solid Films. 516: 3294-3297. DOI: 10.1016/J.Tsf.2007.08.093 |
0.801 |
|
| 2008 |
Ihlefeld JF, Borland WJ, Maria JP. Enhanced dielectric tunability in barium titanate thin films with boron additions Scripta Materialia. 58: 549-552. DOI: 10.1016/J.Scriptamat.2007.11.008 |
0.756 |
|
| 2008 |
Ihlefeld JF, Borland WJ, Maria JP. Synthesis and properties of barium titanate stannate thin films by chemical solution deposition Journal of Materials Science. 43: 4264-4270. DOI: 10.1007/S10853-008-2618-X |
0.765 |
|
| 2008 |
Ihlefeld JF, Losego MD, Collazo R, Borland WJ, Maria JP. Defect chemistry of nano-grained barium titanate films Journal of Materials Science. 43: 38-42. DOI: 10.1007/S10853-007-2135-3 |
0.814 |
|
| 2007 |
Daniels P, Ihlefeld J, Borland W, Maria JP. Smart electrodes for ultralarge-area thin film capacitors Journal of Materials Research. 22: 1763-1766. DOI: 10.1557/Jmr.2007.0272 |
0.719 |
|
| 2007 |
Ihlefeld JF, Kumar A, Gopalan V, Schlom DG, Chen YB, Pan XQ, Heeg T, Schubert J, Ke X, Schiffer P, Orenstein J, Martin LW, Chu YH, Ramesh R. Adsorption-controlled molecular-beam epitaxial growth of BiFe O3 Applied Physics Letters. 91. DOI: 10.1063/1.2767771 |
0.665 |
|
| 2007 |
Ihlefeld JF, Borland WJ, Maria JP. Enhanced dielectric and crystalline properties in ferroelectric barium titanate thin films Advanced Functional Materials. 17: 1199-1203. DOI: 10.1002/Adfm.200601159 |
0.767 |
|
| 2006 |
Craft HS, Ihlefeld JF, Losego MD, Collazo R, Sitar Z, Maria JP. MgO epitaxy on GaN (0002) surfaces by molecular beam epitaxy Applied Physics Letters. 88. DOI: 10.1063/1.2201041 |
0.818 |
|
| 2005 |
Ihlefeld J, Borland W, Maria J. Synthesis and Properties of Barium Titanate Thin Films Deposited on Copper Foil Substrates Mrs Proceedings. 902. DOI: 10.1557/Proc-0902-T02-03 |
0.734 |
|
| 2005 |
Ihlefeld JF, Maria JP, Borland W. Dielectric and microstructural properties of barium titanate zirconate thin films on copper substrates Journal of Materials Research. 20: 2838-2844. DOI: 10.1557/Jmr.2005.0342 |
0.474 |
|
| 2005 |
Laughlin B, Ihlefeld J, Maria JP. Preparation of sputtered (Ba x′Sr 1-x)TiO 3 thin films directly on copper Journal of the American Ceramic Society. 88: 2652-2654. DOI: 10.1111/J.1551-2916.2005.00488.X |
0.831 |
|
| 2005 |
Losego MD, Jimison LH, Ihlefeld JF, Maria JP. Ferroelectric response from lead zirconate titanate thin films prepared directly on low-resistivity copper substrates Applied Physics Letters. 86: 1-3. DOI: 10.1063/1.1919388 |
0.823 |
|
| 2005 |
Ihlefeld J, Laughlin B, Hunt-Lowery A, Borland W, Kingon A, Maria JP. Copper compatible barium titanate thin films for embedded passives Journal of Electroceramics. 14: 95-102. DOI: 10.1007/S10832-005-0866-6 |
0.834 |
|
| 2005 |
Ihlefeld JF, Maria JP, Borland W. Dielectric and microstructural properties of Ba(Ti 1-xZr x)O 3 thin films on copper substrates Ceramic Engineering and Science Proceedings. 26: 109-116. |
0.332 |
|
| 2005 |
Ihlefeld JF, Borland W, Maria JP. Synthesis and properties of barium titanate thin films on copper substrates Materials Research Society Symposium Proceedings. 902: 7-14. |
0.337 |
|
| 2003 |
Laughlin B, Ihlefeld J, Maria J. TEM and Electrical Analysis of Sputtered Barium Strontium Titanate (BST) Thin Films on Flexible Copper Substrates Mrs Proceedings. 784. DOI: 10.1557/Proc-784-C5.3 |
0.816 |
|
| 2003 |
Ihlefeld JF, Kingon AI, Borland W, Maria J. Cu-Compatible Ultra-High Permittivity Dielectrics for Embedded Passive Components Mrs Proceedings. 783. DOI: 10.1557/Proc-783-B3.2 |
0.77 |
|
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