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Roman Melnyk, Ph.D. - Publications

Affiliations: 
2007 Biomedical Engineering and Imaging Mississippi State University, Starkville, MS, United States 
Area:
Biomedical, Radiology, Medical
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7 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2009 Melnyk R, Dahi B, DiBianca R FA. Feasibility study of an oblique 2D variable resolution x-ray CT detector 2009 1st Annual Ornl Biomedical Science and Engineering Conference, Bsec 2009. DOI: 10.1109/BSEC.2009.5090486  0.479
2007 Melnyk R, DiBianca FA. Modeling and measurement of the detector presampling MTF of a variable resolution x-ray CT scanner. Medical Physics. 34: 1062-75. PMID 17369872 DOI: 10.1118/1.2436977  0.638
2005 DiBianca FA, Gulabani D, Jordan LM, Vangala S, Rendon D, Laughter JS, Melnyk R, Gaber MW, Keyes GS. Four-arm variable-resolution x-ray detector for CT target imaging Progress in Biomedical Optics and Imaging - Proceedings of Spie. 5745: 332-339. DOI: 10.1117/12.594102  0.618
2004 Jordan LM, Dibianca FA, Melnyk R, Choudhary A, Shukla H, Laughter J, Gaber MW. Determination of calibration parameters of a VRX CT system using an "Amoeba" algorithm. Journal of X-Ray Science and Technology. 12: 281-293. PMID 19430581  0.607
2003 Melnyk R, DiBianca FA. Monte Carlo study of x-ray cross-talk in a variable resolution x-ray detector Proceedings of Spie - the International Society For Optical Engineering. 5030: 694-701. DOI: 10.1117/12.480014  0.579
2001 DiBianca FA, Melnyk R, Duckworth C, Russ S, Jordan LM, Laughter JS. Comparison of VRX CT scanner geometries Proceedings of Spie - the International Society For Optical Engineering. 4320: 627-635. DOI: 10.1117/12.430890  0.546
2000 DiBianca FA, Melnyk R, Sambari A, Jordan LM, Laughter JS, Zou P. Solid-state VRX CT detector Proceedings of Spie - the International Society For Optical Engineering. 3977: 205-210.  0.62
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