Hoan K. Nguyen, Ph.D. - Publications
Affiliations: | 2004 | Virginia Polytechnic Institute and State University, Blacksburg, VA, United States |
Area:
MathematicsYear | Citation | Score | |||
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2008 | Banks HT, Karr AF, Nguyen HK, Samuels JR. Sensitivity to noise variance in a social network dynamics model Quarterly of Applied Mathematics. 66: 233-247. | 0.4 | |||
2007 | Banks HT, Dediu S, Nguyen HK. TIME DELAY SYSTEMS WITH DISTRIBUTION DEPENDENT DYNAMICS. Annual Reviews in Control. 31: 17-26. PMID 19865602 DOI: 10.1016/j.arcontrol.2007.02.002 | 0.4 | |||
2007 | Banks HT, Dediu S, Nguyen HK. Sensitivity of dynamical systems to parameters in a convex subset of a topological vector space. Mathematical Biosciences and Engineering : Mbe. 4: 403-30. PMID 17658933 | 0.4 | |||
2007 | Bai P, Banks HT, Dediu S, Govan AY, Last M, Lloyd AL, Nguyen HK, Olufsen MS, Rempala G, Slenning BD. Stochastic and deterministic models for agricultural production networks. Mathematical Biosciences and Engineering : Mbe. 4: 373-402. PMID 17658932 | 0.4 | |||
2007 | Kepler GM, Nguyen HK, Webster-Cyriaque J, Banks HT. A dynamic model for induced reactivation of latent virus. Journal of Theoretical Biology. 244: 451-62. PMID 17045614 DOI: 10.1016/j.jtbi.2006.08.020 | 0.4 | |||
2007 | Banks HT, Kepler GM, Nguyen HK, Webster-Cyriaque J. Inverse problems and model validation: An example from latent virus reactivation Journal of Inverse and Ill-Posed Problems. 15: 225-241. DOI: 10.1515/jiip.2007.012 | 0.4 | |||
2006 | Nguyen HK, Herdman TL. Numerical approximations for a class of volterra equations with realizable kernels Journal of Integral Equations and Applications. 18: 337-360. DOI: 10.1216/jiea/1181075394 | 0.4 | |||
2006 | Banks HT, Nguyen HK. Sensitivity of dynamical systems to Banach space parameters Journal of Mathematical Analysis and Applications. 323: 146-161. DOI: 10.1016/j.jmaa.2005.09.084 | 0.4 | |||
2005 | Nguyen HK, Herdman TL, Cliff EM. Approximations for a class of volterra integro-differential equations Mathematical and Computer Modelling. 42: 659-672. DOI: 10.1016/j.mcm.2004.03.012 | 0.4 | |||
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