Shuang Xie, Ph.D. - Publications
Affiliations: | 2014 | Electrical and Computer Engineering | University of Toronto, Toronto, ON, Canada |
Area:
Electronics and Electrical EngineeringYear | Citation | Score | |||
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2020 | Xie S, Theuwissen A. A 10 Bit 5 MS/s Column SAR ADC With Digital Error Correction for CMOS Image Sensors Ieee Transactions On Circuits and Systems Ii-Express Briefs. 67: 984-988. DOI: 10.1109/Tcsii.2019.2928204 | 0.361 | |||
2020 | Xie S, Prouza AA, Theuwissen A. A CMOS-Imager-Pixel-Based Temperature Sensor for Dark Current Compensation Ieee Transactions On Circuits and Systems Ii-Express Briefs. 67: 255-259. DOI: 10.1109/Tcsii.2019.2914588 | 0.427 | |||
2020 | Xie S, Theuwissen AJP. A CMOS Image Sensor With Thermal Sensing Capability and Column Zoom ADCs Ieee Sensors Journal. 20: 2398-2404. DOI: 10.1109/Jsen.2019.2954082 | 0.418 | |||
2020 | Xie S, Theuwissen AJP. Suppression of Spatial and Temporal Noise in a CMOS Image Sensor Ieee Sensors Journal. 20: 162-170. DOI: 10.1109/Jsen.2019.2941122 | 0.374 | |||
2020 | Xie S, Theuwissen A. A CMOS image sensor with a 10 MHz column readout speed using digitally calibrated pipelined ADCs Microelectronics Journal. 99: 104758. DOI: 10.1016/J.Mejo.2020.104758 | 0.361 | |||
2019 | Xie S, Theuwissen A. Compensation for Process and Temperature Dependency in a CMOS Image Sensor. Sensors (Basel, Switzerland). 19. PMID 30791499 DOI: 10.3390/S19040870 | 0.422 | |||
2019 | Xie S, Theuwissen AJP. On-Chip Smart Temperature Sensors for Dark Current Compensation in CMOS Image Sensors Ieee Sensors Journal. 19: 7849-7860. DOI: 10.1109/Jsen.2019.2919655 | 0.427 | |||
2019 | Xie S, Theuwissen A. All-MOS self-referenced temperature sensor Electronics Letters. 55: 1045-1047. DOI: 10.1049/El.2019.1784 | 0.401 | |||
2018 | Abarca A, Xie S, Markenhof J, Theuwissen A. Integration of 555 temperature sensors into a 64 × 192 CMOS image sensor Sensors and Actuators a-Physical. 282: 243-250. DOI: 10.1016/J.Sna.2018.09.029 | 0.408 | |||
2015 | Xie S, Ng WT. An all-digital self-calibrated delay-line based temperature sensor for VLSI thermal sensing and management Integration. 51: 107-117. DOI: 10.1016/J.Vlsi.2015.07.008 | 0.388 | |||
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