Year |
Citation |
Score |
2020 |
Hou J, Girod R, Nianias N, Shen T, Fan J, Tileli V. Lithium-Gold Reference Electrode for Potential Stability During In Situ Electron Microscopy Studies of Lithium-Ion Batteries Journal of the Electrochemical Society. 167: 110515. DOI: 10.1149/1945-7111/Ab9Eea |
0.307 |
|
2019 |
Mevenkamp N, MacArthur KE, Tileli V, Ebert P, Allen LJ, Berkels B, Duchamp M. Multi-modal and multi-scale non-local means method to analyze spectroscopic datasets. Ultramicroscopy. 209: 112877. PMID 31884381 DOI: 10.1016/J.Ultramic.2019.112877 |
0.353 |
|
2019 |
Girod R, Nianias N, Tileli V. Electrochemical Behavior of Carbon Electrodes for Redox Studies in a Transmission Electron Microscope. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 1-7. PMID 31647046 DOI: 10.1017/S1431927619015034 |
0.307 |
|
2019 |
Watts MC, Picco L, Russell-Pavier FS, Cullen PL, Miller TS, Bartuś SP, Payton OD, Skipper NT, Tileli V, Howard CA. Production of phosphorene nanoribbons. Nature. 568: 216-220. PMID 30971839 DOI: 10.1038/S41586-019-1074-X |
0.37 |
|
2019 |
Ignatans R, Mallia G, Ahmad EA, Spillane L, Stoerzinger KA, Shao-Horn Y, Harrison NM, Tileli V. The Effect of Surface Reconstruction on the Oxygen Reduction Reaction Properties of LaMnO3 Journal of Physical Chemistry C. 123: 11621-11627. DOI: 10.1021/Acs.Jpcc.9B00458 |
0.322 |
|
2016 |
Han B, Stoerzinger KA, Tileli V, Gamalski AD, Stach EA, Shao-Horn Y. Nanoscale structural oscillations in perovskite oxides induced by oxygen evolution. Nature Materials. PMID 27698352 DOI: 10.1038/Nmat4764 |
0.351 |
|
2015 |
Tileli V, Duchamp M, Axelsson AK, Valant M, Dunin-Borkowski RE, Alford NM. On stoichiometry and intermixing at the spinel/perovskite interface in CoFe2O4/BaTiO3 thin films. Nanoscale. 7: 218-24. PMID 25406863 DOI: 10.1039/C4Nr04339A |
0.329 |
|
2013 |
Isakov I, Panfilova M, Sourribes MJL, Tileli V, Porter AE, Warburton PA. InAs1- xPx nanowires grown by catalyst-free molecular-beam epitaxy Nanotechnology. 24: 85707-85707. PMID 23386103 DOI: 10.1088/0957-4484/24/8/085707 |
0.343 |
|
2013 |
Tileli V, Cooper D, Dunin-Borkowski RE. An Assessment of the Origin of Contrast in Off-Axis Electron Holographic Imaging of BaTiO3 Ferroelectric Domains Microscopy and Microanalysis. 19: 1370-1371. DOI: 10.1017/S1431927613008842 |
0.357 |
|
2012 |
Ahmad EA, Mallia G, Kramer D, Tileli V, Kucernak AR, Harrison NM. Comment on "2D atomic mapping of oxidation states in transition metal oxides by scanning transmission electron microscopy and electron energy-loss spectroscopy". Physical Review Letters. 108: 259701; discussion 2. PMID 23004674 DOI: 10.1103/Physrevlett.108.259701 |
0.316 |
|
2011 |
Kohen D, Tileli V, Cayron C, Faucherand P, Morin C, Dufourcq J, Noël S, Levis M, Brioude A, Perraud S. Al catalyzed growth of silicon nanowires and subsequent in situ dry etching of the catalyst for photovoltaic application Physica Status Solidi (a) Applications and Materials Science. 208: 2676-2680. DOI: 10.1002/Pssa.201127072 |
0.306 |
|
2010 |
Bunday B, Cordes A, Allgair J, Aguilar DB, Tileli V, Thiel B, Avitan Y, Peltinov R, Bar-Zvi M, Adan O, Chirko K. Electron-beam induced photoresist shrinkage influence on 2D profiles Proceedings of Spie - the International Society For Optical Engineering. 7638. DOI: 10.1117/12.846991 |
0.585 |
|
2009 |
Bunday B, Cordes A, Allgair J, Tileli V, Avitan Y, Peltinov R, Bar-zvi M, Adan O, Cottrell E, Hand S. Phenomenology of electron-beam induced photoresist shrinkage trends Proceedings of Spie - the International Society For Optical Engineering. 7272. DOI: 10.1117/12.816249 |
0.338 |
|
2009 |
Tileli V, Knowles WR, Toth M, Thiel BL. Noise characteristics of the gas ionization cascade used in low vacuum scanning electron microscopy Journal of Applied Physics. 106. DOI: 10.1063/1.3159883 |
0.601 |
|
2008 |
Li J, Toth M, Tileli V, Dunn KA, Lobo CJ, Thiel BL. Evolution of the nanostructure of deposits grown by electron beam induced deposition Applied Physics Letters. 93. DOI: 10.1063/1.2959112 |
0.644 |
|
2007 |
Kucheyev SO, Toth M, Baumann TF, Hamza AV, Ilavsky J, Knowles WR, Saw CK, Thiel BL, Tileli V, Buuren Tv, Wang YM, Willey TM. Structure of low-density nanoporous dielectrics revealed by low-vacuum electron microscopy and small-angle X-ray scattering. Langmuir : the Acs Journal of Surfaces and Colloids. 23: 353-6. PMID 17209574 DOI: 10.1021/La0619729 |
0.577 |
|
2007 |
Thiel BL, Tileli V. Cascade Amplification Characteristics of Off-Axis Anode/SE Detector Configurations in Low Vacuum SEM Microscopy and Microanalysis. 13: 1482-1483. DOI: 10.1017/S1431927607078427 |
0.589 |
|
2007 |
Tileli V, Toth M, Knowles R, Thiel BL. Noise Considerations in Low Vacuum Scanning Electron Microscopy Microscopy and Microanalysis. 13: 1484-1485. DOI: 10.1017/S1431927607077197 |
0.639 |
|
2006 |
Thiel B, Tileli V. Low Voltage and Low Vacuum-When worlds Collide Microscopy and Microanalysis. 12: 1436-1437. DOI: 10.1017/S1431927606069698 |
0.572 |
|
2006 |
Tileli V, Thiel B. Modeling Noise in Gas Cascade Secondary Electron Amplifiers Microscopy and Microanalysis. 12: 1482-1483. DOI: 10.1017/S1431927606068930 |
0.596 |
|
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