Charles C. Fulton, Ph.D.
Affiliations: | North Carolina State University, Raleigh, NC |
Area:
ultra-thin Si oxyitride devicesGoogle:
"Charles Fulton"Parents
Sign in to add mentor| Gerald Lucovsky | grad student | 2005 | NCSU | |
| (Spectroscopic study of the interface chemical and electronic properties of high-kappa gate stacks.) | ||||
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Publications
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| Strzhemechny YM, Bataiev M, Tumakha SP, et al. (2008) Low energy electron-excited nanoscale luminescence spectroscopy studies of intrinsic defects in HfO2 and SiO2-HfO2- SiO2-Si stacks Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 26: 232-243 |
| Fleming L, Fulton CC, Lucovsky G, et al. (2007) Local bonding analysis of the valence and conduction band features of TiO2 Journal of Applied Physics. 102 |
| Lucovsky G, Fulton CC, Ju BS, et al. (2007) Corrigendum to: "Suppression of Jahn-Teller term-split band edge states in the X-ray absorption spectra of non-crystalline Zr silicates and Si oxynitride alloys, and alloys of ZrO2 with Y2O3". [Radiat. Phys. Chem. 75 (2006) 1591-1595] (DOI:10.1016/j.radphyschem.2006.05.004) Radiation Physics and Chemistry. 76: 907 |
| Zeman MC, Fulton CC, Lucovsky G, et al. (2006) Publisher’s Note: “Thermal stability of TiO2, ZrO2, or HfO2 on Si(100) by photoelectron emission microscopy” [J. Appl. Phys. 99, 023519 (2006)] Journal of Applied Physics. 99: 109902 |
| Fulton CC, Lucovsky G, Nemanich RJ. (2006) Electronic properties of the Zr-ZrO 2-SiO 2-Si (100) gate stack structure Journal of Applied Physics. 99 |
| Zeman MC, Fulton CC, Lucovsky G, et al. (2006) Thermal stability of TiO 2, ZrO 2, or Hf O 2 on Si(100) by photoelectron emission microscopy Journal of Applied Physics. 99 |
| Lucovsky G, Fulton CC, Ju BS, et al. (2006) Suppression of Jahn-Teller term-split band edge states in the x-ray absorption spectra of non-crystalline Zr silicates and Si oxynitride alloys, and alloys of ZrO2 with Y2O3 Radiation Physics and Chemistry. 75: 1591-1595 |
| Lucovsky G, Hinkle CL, Fulton CC, et al. (2006) Intrinsic nanocrystalline grain-boundary and oxygen atom vacancy defects in ZrO2 and HfO2 Radiation Physics and Chemistry. 75: 2097-2101 |
| Fulton CC, Edge LF, Lucovsky G, et al. (2006) A study of conduction band edge states in complex oxides by X-ray absorption spectroscopy Radiation Physics and Chemistry. 75: 1934-1938 |
| Lucovsky G, Fulton CC, Zhang Y, et al. (2005) Conduction band-edge states associated with the removal of d-state degeneracies by the Jahn-Teller effect Ieee Transactions On Device and Materials Reliability. 5: 65-83 |