Ian P. Jones
Affiliations: | Metallurgy & Materials Engineering | University of Birmingham, Birmingham, England, United Kingdom |
Area:
Transmission Electron Microscopy, Intermetallic Compounds, Plastic deformationWebsite:
http://www.birmingham.ac.uk/schools/metallurgy-materials/people/profile.aspx?ReferenceId=6188&Name=professor-ian-jonesGoogle:
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Publications
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| Si S, Wu J, Jones IP, et al. (2020) Influence of precipitates on basal dislocation slip and twinning in AZ91 micro-pillars Philosophical Magazine. 1-23 |
| Prasad A, Si S, Ghori UR, et al. (2020) Effect of La addition on precipitation hardening in Mg–10Dy alloy Materialia. 14: 100898 |
| Sarvesha R, Ghori U, Chiu YL, et al. (2020) Mechanical property evaluation of second phase particles in a Mg–8Al-0.5Zn alloy using micropillar compression Materials Science and Engineering a-Structural Materials Properties Microstructure and Processing. 775: 138973 |
| Wang M, Chiu Y, Flahaut D, et al. (2020) Secondary phase area fraction determination using SEM-EDS quantitative mapping Materials Characterization. 167: 110506 |
| Jiang S, Hewett J, Jones IP, et al. (2020) Effect of misorientation angle and chromium concentration on grain boundary sensitisation in an austenitic stainless steel Materials Characterization. 164: 110343 |
| Radecka A, Coakley J, Jones IP, et al. (2016) Ordering and the micromechanics of Ti-7Al Materials Science and Engineering A. 650: 28-37 |
| Zeng R, Chiu Y, Jones IP. (2013) Characterisation of nano-sized Al-Mn-(Mg) particles in AZ91 and their effect on Mg17Al12 precipitation Journal of Alloys and Compounds. 579: 34-38 |
| Ding R, Chiu Y, Jones IP, et al. (2012) Application of a novel EBSD-FIB method to the transmission of c + a dislocations through α/β interfaces Ti-6Al-4V for producing in situ tension transmission electron microscopy specimens Journal of Electron Microscopy. 61: 31-36 |
| Dingi R, Jones IP, Gong J, et al. (2012) Transmission electron microscopy of deformed Ti-6Al-4V micro-cantilevers Ti 2011 - Proceedings of the 12th World Conference On Titanium. 1: 783-786 |
| Giusti G, Bowen J, Ramasse Q, et al. (2012) Dielectric properties of pulsed-laser deposited indium tin oxide thin films Thin Solid Films. 524: 249-256 |