Jack Washburn

Affiliations: 
Materials Science and Engineering University of California, Berkeley, Berkeley, CA, United States 
Website:
https://www.mse.berkeley.edu/news/in-memoriam-professor-emeritus-jack-washburn
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"Jack Washburn"
Bio:

(1921 - 2013)
https://books.google.com/books?id=GPRIAQAAMAAJ

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Parents

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Earl R. Parker grad student 1954 UC Berkeley
 (Effect of controlled arrays of dislocation boundaries on the strength of zinc crystals.)

Children

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James Martin Galligan grad student 1963 UC Berkeley
Jagdish Narayan grad student 1971 UC Berkeley (E-Tree)
Timothy D. Sands grad student 1984 UC Berkeley (E-Tree)
Yong Chen grad student 1996 UC Berkeley (Chemistry Tree)
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Publications

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Liliental-Weber Z, Zakharov D, Jasinski J, et al. (2002) Screw dislocations in MBE GaN layers grown on top of HVPE layers: Are they different? Materials Research Society Symposium - Proceedings. 743: 243-248
Liliental-Weber Z, Jasinski J, Washburn J. (2002) Differences and similarities between structural properties of GaN grown by different growth methods Ieee Semiconducting and Semi-Insulating Materials Conference, Simc. 70-75
Lim SH, Washburn J, Liliental-Weber Z. (2002) Transmission electron microscopy analysis of interfacial layers in Ti/Ta/Al ohmic contacts to n-AlGaN Journal of Electron Microscopy. 51
Liliental-Weber Z, Jasinski J, Washburn J, et al. (2002) Screw dislocations in GaN Microscopy and Microanalysis. 8: 1198-1199
Liliental-Weber Z, Jasinski J, Washburn J. (2002) Comparison between structural properties of bulk GaN grown in liquid Ga under high N pressure and GaN grown by other methods Journal of Crystal Growth. 246: 259-270
Lim SH, Washburn J, Liliental-Weber Z, et al. (2001) Transmission electron microscopy of threading dislocations in ZnO films grown on sapphire Journal of Vacuum Science and Technology, Part a: Vacuum, Surfaces and Films. 19: 2601-2603
Jasinski J, Yu KM, Walukiewicz W, et al. (2001) Effects of structural defects on the activation of sulfur donors in GaNxAs1-x formed by N implantation Physica B: Condensed Matter. 308: 874-876
Bourret-Courchesne ED, Yu KM, Benamara M, et al. (2001) Mechanisms of dislocation reduction in GaN using an intermediate temperature interlayer Journal of Electronic Materials. 30: 1417-1420
Liliental-Weber Z, Benamara M, Washburn J, et al. (2001) Relaxation of InGaN thin layers observed by X-ray and transmission electron microscopy studies Journal of Electronic Materials. 30: 439-444
Liliental-Weber Z, Benamara M, Swider W, et al. (2000) Mg segregation, difficulties of p-doping in gan Materials Research Society Symposium - Proceedings. 595
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