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Christopher L. Muhlstein - Publications

Affiliations: 
Materials Science and Engineering Pennsylvania State University, State College, PA, United States 
Area:
Materials Science Engineering, Mechanical Engineering
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55 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2018 Antolino N, Muhlstein C, Hayes G, Adair J, Bermejo R. Strength limits in mesoscaled 3Y-TZP ceramics for micro-surgical instruments. Journal of the Mechanical Behavior of Biomedical Materials. 91: 99-108. PMID 30553208 DOI: 10.1016/J.Jmbbm.2018.12.001  0.319
2015 Meirom RA, Clark TE, Muhlstein CL. The effects of texture and grain morphology on the fracture toughness and fatigue crack growth resistance of nanocrystalline platinum films International Journal of Fatigue. 70: 258-269. DOI: 10.1016/j.ijfatigue.2014.09.017  0.443
2014 Lanning WR, Muhlstein CL. Strengthening mechanisms in MLCCs: Residual stress versus crack tip shielding Journal of the American Ceramic Society. 97: 283-289. DOI: 10.1111/jace.12662  0.327
2013 Yashinski MS, Muhlstein CL. The role of deposited layers in the nonlinear constitutive behavior of Si nanowires Journal of Applied Physics. 114. DOI: 10.1063/1.4828714  0.71
2012 Meirom RA, Clark TE, Muhlstein CL. The role of specimen thickness in the fracture toughness and fatigue crack growth resistance of nanocrystalline platinum films Acta Materialia. 60: 1408-1417. DOI: 10.1016/J.Actamat.2011.11.015  0.536
2011 Howell JA, Muhlstein CL, Liu BZ, Zhang Q, Mohney SE. Oxidation of RuAl and NiAl thin films: Evolution of surface morphology and electrical resistance Journal of Microelectromechanical Systems. 20: 933-942. DOI: 10.1109/Jmems.2011.2148156  0.419
2011 Collins JG, Wright MC, Muhlstein CL. Cyclic stabilization of electrodeposited nickel structural films Journal of Microelectromechanical Systems. 20: 753-763. DOI: 10.1109/Jmems.2011.2140354  0.451
2011 Steighner MS, Snedeker LP, Boyce BL, Gall K, Miller DC, Muhlstein CL. Dependence on diameter and growth direction of apparent strain to failure of Si nanowires Journal of Applied Physics. 109. DOI: 10.1063/1.3537658  0.301
2011 Meirom RA, Alsem DH, Romasco AL, Clark T, Polcawich RG, Pulskamp JS, Dubey M, Ritchie RO, Muhlstein CL. Fatigue-induced grain coarsening in nanocrystalline platinum films Acta Materialia. 59: 1141-1149. DOI: 10.1016/J.Actamat.2010.10.047  0.515
2010 Romasco AL, Friedman LH, Fang L, Meirom RA, Clark TC, Polcawich R, Pulskamp J, Dubey M, Muhlstein CL. Practical implications of instrument displacement drift during force-controlled nanoindentation Journal of Testing and Evaluation. 38. DOI: 10.1520/Jte102177  0.312
2010 Kolluru PV, Green DJ, Pantano CG, Muhlstein CL. Effects of surface chemistry on the nanomechanical properties of commercial float glass Journal of the American Ceramic Society. 93: 838-847. DOI: 10.1111/J.1551-2916.2009.03497.X  0.313
2010 Romasco AL, Friedman LH, Fang L, Meirom RA, Clark TE, Polcawich RG, Pulskamp JS, Dubey M, Muhlstein CL. Deformation behavior of nanograined platinum films Thin Solid Films. 518: 3866-3874. DOI: 10.1016/J.Tsf.2010.02.007  0.433
2010 Budnitzki M, Scates MC, Ritchie RO, Stach EA, Muhlstein CL, Pierron ON. The effects of cubic stiffness on fatigue characterization resonator performance Sensors and Actuators, a: Physical. 157: 228-234. DOI: 10.1016/J.Sna.2009.11.020  0.726
2009 Antolino NE, Hayes G, Kirkpatrick R, Muhlstein CL, Frecker MI, Mockensturm EM, Adair JH. Lost Mold Rapid Infiltration Forming of Mesoscale Ceramics: Part 1, Fabrication. Journal of the American Ceramic Society. American Ceramic Society. 92: S63-S69. PMID 19809595 DOI: 10.1111/J.1551-2916.2008.02627.X  0.604
2009 Antolino NE, Hayes G, Kirkpatrick R, Muhlstein CL, Frecker MI, Mockensturm EM, Adair JH. Lost Mold-Rapid Infiltration Forming of Mesoscale Ceramics: Part 2, Geometry and Strength Improvements. Journal of the American Ceramic Society. American Ceramic Society. 92: S70-S78. PMID 19809594 DOI: 10.1111/J.1551-2916.2008.02719.X  0.562
2009 Kommepalli HKR, Yu HG, Muhlstein CL, Trolier-McKinstry S, Rahn CD, Tadigadapa SA. Design, fabrication, and performance of a piezoelectric uniflex microactuator Journal of Microelectromechanical Systems. 18: 616-625. DOI: 10.1109/Jmems.2009.2015480  0.302
2008 Meirom RA, Clark T, Polcawich R, Pulskamp J, Dubey M, Muhlstein CL. Velocity-dependent fatigue crack paths in nanograined Pt films. Physical Review Letters. 101: 085503. PMID 18764634 DOI: 10.1103/Physrevlett.101.085503  0.476
2008 Fang L, Muhlstein CL, Collins JG, Romasco AL, Friedman LH. Continuous electrical in situ contact area measurement during instrumented indentation Journal of Materials Research. 23: 2480-2485. DOI: 10.1557/Jmr.2008.0298  0.36
2008 Alsem DH, Muhlstein CL, Stach EA, Ritchie RO. Further considerations on the high-cycle fatigue of micron-scale polycrystalline silicon Scripta Materialia. 59: 931-935. DOI: 10.1016/J.Scriptamat.2008.03.043  0.596
2008 Howell JA, Hellmann JR, Muhlstein CL. Nanomechanical properties of commercial float glass Journal of Non-Crystalline Solids. 354: 1891-1899. DOI: 10.1016/J.Jnoncrysol.2007.10.021  0.345
2007 Pierron ON, Muhlstein CL. The role of debris-induced cantilever effects in cyclic fatigue of micron-scale silicon films Fatigue and Fracture of Engineering Materials and Structures. 30: 57-63. DOI: 10.1111/j.1460-2695.2006.01042.x  0.73
2007 Pierron ON, Muhlstein CL. Notch root oxide formation during fatigue of polycrystalline silicon structural films Journal of Microelectromechanical Systems. 16: 1441-1450. DOI: 10.1109/Jmems.2007.906076  0.764
2007 Kirkpatrick R, Muhlstein CL. Performance and durability of octadecyltrichlorosilane coated borosilicate glass Journal of Non-Crystalline Solids. 353: 2624-2637. DOI: 10.1016/J.Jnoncrysol.2007.05.013  0.651
2007 Muhlstein CL, Ritchie RO. 4.18 - Fatigue of Small-volume Structures: Silicon Films Comprehensive Structural Integrity. 4: 467-487. DOI: 10.1016/B0-08-043749-4/04027-1  0.395
2007 Alsem DH, Pierron ON, Stach EA, Muhlstein CL, Ritchie RO. Mechanisms for fatigue of micron-scale silicon structural films Advanced Engineering Materials. 9: 15-30. DOI: 10.1002/Adem.200600269  0.766
2006 Pierron ON, Muhlstein CL. Fatigue of polycrystalline silicon films with thin surface oxides Proceedings of Spie - the International Society For Optical Engineering. 6111. DOI: 10.1117/12.646468  0.75
2006 Pierron ON, Muhlstein CL. The critical role of environment in fatigue damage accumulation in deep-reactive ion-etched single-crystal silicon structural films Journal of Microelectromechanical Systems. 15: 111-119. DOI: 10.1109/Jmems.2005.863602  0.76
2006 Pierron ON, Abnet CC, Muhlstein CL. Methodology for low- and high-cycle fatigue characterization with kHz-frequency resonators Sensors and Actuators, a: Physical. 128: 140-150. DOI: 10.1016/J.Sna.2006.01.013  0.715
2006 Alsem DH, Timmerman R, Stach EA, Muhlstein CL, Dugger MT, Ritchie RO. Wear and fatigue in silicon structural films for MEMS applications Fracture of Nano and Engineering Materials and Structures - Proceedings of the 16th European Conference of Fracture. 671-672.  0.405
2005 Pierron ON, Muhlstein CL. Long-term reliability of single-crystal silicon thin films: The influence of environment on the fatigue damage accumulation rate Progress in Biomedical Optics and Imaging - Proceedings of Spie. 5716: 141-150. DOI: 10.1117/12.591219  0.738
2005 Muhlstein CL. Characterization of structural films using microelectromechanical resonators Fatigue and Fracture of Engineering Materials and Structures. 28: 711-721. DOI: 10.1111/j.1460-2695.2005.00921.x  0.456
2005 Pierron ON, MacDonald DD, Muhlstein CL. Galvanic effects in Si-based microelectromechanical systems: Thick oxide formation and its implications for fatigue reliability Applied Physics Letters. 86: 1-3. DOI: 10.1063/1.1939072  0.714
2005 Alsem DH, Stach EA, Muhlstein CL, Ritchie RO. Fatigue failure in thin-film polycrystalline silicon is due to subcritical cracking within the oxide layer Applied Physics Letters. 86. DOI: 10.1063/1.1856689  0.567
2005 Pierron ON, Muhlstein CL. The extended range of reaction-layer fatigue susceptibility of polycrystalline silicon thin films International Journal of Fracture. 135: 1-18. DOI: 10.1007/S10704-005-3469-Y  0.768
2005 Muhlstein CL. Fatigue damage accumulation and mitigation in silicon structural films 11th International Conference On Fracture 2005, Icf11. 5: 3848-3853.  0.408
2005 Muhlstein CL. Fatigue damage accumulation mechanisms in structural films 11th International Conference On Fracture 2005, Icf11. 4: 2740-2745.  0.501
2004 Alsem D, Stach E, Muhlstein C, Dugger M, Ritchie R. Utilizing On-Chip Testing and Electron Microscopy to Study Fatigue and Wear in Polysilicon Structural Films Mrs Proceedings. 821. DOI: 10.1557/Proc-821-P2.5  0.555
2004 Ritchie RO, Muhlstein CL, Nalla RK. Failure by fracture and fatigue in "nano" and "bio" materials Jsme International Journal, Series a: Solid Mechanics and Material Engineering. 47: 238-251. DOI: 10.1299/Jsmea.47.238  0.394
2004 Muhlstein CL, Pierron ON. Reaction-layer fatigue: Understanding the limitations of structural silicon Proceedings of Spie - the International Society For Optical Engineering. 5343: 132-144. DOI: 10.1117/12.527465  0.746
2004 Ritchie RO, Kruzic JJ, Muhlstein CL, Nalla RK, Stach EA. Characteristic dimensions and the micro-mechanisms of fracture and fatigue in 'nano' and 'bio' materials International Journal of Fracture. 128: 1-15. DOI: 10.1023/B:Frac.0000040958.04896.43  0.418
2004 Muhlstein CL, Howe RT, Ritchie RO. Fatigue of polycrystalline silicon for microelectromechanical system applications: Crack growth and stability under resonant loading conditions Mechanics of Materials. 36: 13-33. DOI: 10.1016/S0167-6636(03)00028-0  0.478
2004 Alsem DH, Stach EA, Muhlstein CL, Dugger MT, Ritchie RO. Utilizing on-chip testing and electron microscopy to study fatigue and wear in polysilicon structural films Materials Research Society Symposium Proceedings. 821: 331-336.  0.491
2003 Muhlstein CL, Ritchie RO. High-cycle fatigue of micron-scale polycrystalline silicon films: Fracture mechanics analyses of the role of the silica/silicon interface International Journal of Fracture. 120: 449-474. DOI: 10.1023/A:1024988031390  0.628
2003 Muhlstein CL, Stach EA, Ritchie RO. Fatigue degradation of nanometer-scale silicon dioxide reaction layers on silicon structural films Materials Research Society Symposium - Proceedings. 778: 215-220.  0.575
2002 Muhlstein C, Stach E, Ritchie R. Interfacial Effects on the Premature Failure of Polycrystalline Silicon Structural Films Mrs Proceedings. 741. DOI: 10.1557/Proc-741-J3.5  0.639
2002 Muhlstein CL, Ashurst WR, Stach EA, Maboudian R, Ritchie RO. Surface engineering of polycrystalline silicon microelectromechanical systems for fatigue resistance Materials Research Society Symposium - Proceedings. 729: 41-46. DOI: 10.1557/Proc-729-U2.1  0.521
2002 Muhlstein CL, Stach EA, Ritchie RO. Mechanism of fatigue in micron-scale films of polycrystalline silicon for microelectromechanical systems Applied Physics Letters. 80: 1532-1534. DOI: 10.1063/1.1455142  0.578
2002 Muhlstein CL, Stach EA, Ritchie RO. A reaction-layer mechanism for the delayed failure of micron-scale polycrystalline silicon structural films subjected to high-cycle fatigue loading Acta Materialia. 50: 3579-3595. DOI: 10.1016/S1359-6454(02)00158-1  0.573
2002 Muhlstein CL, Stach EA, Ritchie RO. On the mechanism of fatigue in micron-scale structural films of polycrystalline silicon Materials Research Society Symposium - Proceedings. 697: 227-234.  0.407
2002 Muhlstein CL, Stach EA, Ritchie RO. Interfacial effects on the premature failure of polycrystalline silicon structural films Materials Research Society Symposium - Proceedings. 741: 47-52.  0.332
2001 Muhlstein CL, Brown SB, Ritchie RO. High-cycle fatigue of single-crystal silicon thin films Journal of Microelectromechanical Systems. 10: 593-600. DOI: 10.1109/84.967383  0.438
2001 Muhlstein CL, Brown SB, Ritchie RO. High-cycle fatigue and durability of polycrystalline silicon thin films in ambient air Sensors and Actuators, a: Physical. 94: 177-188. DOI: 10.1016/S0924-4247(01)00709-9  0.535
2001 Muhlstein CL, Brown SB, Ritchie RO. High-cycle fatigue of polycrystalline silicon thin films in laboratory air Materials Research Society Symposium - Proceedings. 657.  0.418
2000 Muhlstein CL, Brown S, Ritchie R. High-Cycle Fatigue of Polycrystalline Silicon Thin Films in Laboratory Air Mrs Proceedings. 657. DOI: 10.1557/Proc-657-Ee5.8  0.417
1995 Venkateswara Rao KT, Kim YW, Muhlstein CL, Ritchie RO. Fatigue-crack growth and fracture resistance of a two-phase (γ + α2) TiAl alloy in duplex and lamellar microstructures Materials Science and Engineering A. 192: 474-482. DOI: 10.1016/0921-5093(94)03264-5  0.361
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