Year |
Citation |
Score |
2018 |
Gonzalez JF, Antartis DA, Chasiotis I, Dillon SJ, Lambros J. In situ X-ray micro-CT characterization of chemo-mechanical relaxations during Sn lithiation Journal of Power Sources. 381: 181-189. DOI: 10.1016/J.Jpowsour.2018.01.056 |
0.315 |
|
2016 |
Das D, Sanchez L, Martin J, Power B, Isaacson S, Polcawich RG, Chasiotis I. Control of mechanical response of freestanding PbZr0.52Ti0.48O3 films through texture Applied Physics Letters. 109. DOI: 10.1063/1.4963348 |
0.387 |
|
2016 |
Kolluru PV, Chasiotis I. A master curve for the size and strain rate dependent large deformation behavior of PS nanofibers at room temperature Polymer (United Kingdom). 99: 544-551. DOI: 10.1016/j.polymer.2016.07.046 |
0.314 |
|
2015 |
Yagnamurthy S, Boyce BL, Chasiotis I. Role of Microstructure and Doping on the Mechanical Strength and Toughness of Polysilicon Thin Films Journal of Microelectromechanical Systems. 24: 1436-1452. DOI: 10.1109/Jmems.2015.2410215 |
0.421 |
|
2015 |
Das D, Power B, Martin JP, Polcawich RG, Chasiotis I. Role of oxide seed layer in plastic response of epitaxially grown textured metal films Acta Materialia. DOI: 10.1016/J.Actamat.2016.04.025 |
0.377 |
|
2013 |
Karanjgaokar N, Stump F, Geubelle P, Chasiotis I. A thermally activated model for room temperature creep in nanocrystalline Au films at intermediate stresses Scripta Materialia. 68: 551-554. DOI: 10.1016/J.Scriptamat.2012.11.017 |
0.56 |
|
2012 |
Stump FV, Karanjgaokar N, Geubelle PH, Chasiotis I. A multiscale model of rate dependence of nanocrystalline thin films International Journal For Multiscale Computational Engineering. 10: 441-459. DOI: 10.1615/Intjmultcompeng.2012003059 |
0.577 |
|
2011 |
Yagnamurthy S, Chasiotis I, Lambros J, Polcawich RG, Pulskamp JS, Dubey M. Mechanical and ferroelectric behavior of PZT-based thin films Journal of Microelectromechanical Systems. 20: 1250-1258. DOI: 10.1109/Jmems.2011.2167666 |
0.331 |
|
2011 |
Yagnamurthy S, Chasiotis I. Mechanical and piezoelectric behavior of thin film PZT composites for MEMS applications Conference Proceedings of the Society For Experimental Mechanics Series. 2: 261-266. |
0.34 |
|
2010 |
Naraghi M, Ozkan T, Chasiotis I, Hazra SS, De Boer MP. MEMS platform for on-chip nanomechanical experiments with strong and highly ductile nanofibers Journal of Micromechanics and Microengineering. 20. DOI: 10.1088/0960-1317/20/12/125022 |
0.302 |
|
2010 |
Jonnalagadda KN, Chasiotis I, Yagnamurthy S, Lambros J, Pulskamp J, Polcawich R, Dubey M. Experimental investigation of strain rate dependence of nanocrystalline Pt films Experimental Mechanics. 50: 25-35. DOI: 10.1007/S11340-008-9212-7 |
0.363 |
|
2010 |
Li X, Chasiotis I, Kitamura T. In situ scanning probe microscopy nanomechanical testing Mrs Bulletin. 35: 361-367. |
0.315 |
|
2009 |
Chasiotis I, Jonnalagadda KN. Strength and fracture resistance of amorphous diamond-like carbon films for MEMS Journal of Nanomaterials. 2009. DOI: 10.1155/2009/204281 |
0.335 |
|
2009 |
Karanjgaokar N, Chasiotis I, Peroulis D, Jonnalagadda K. Strain rate and creep response of Au and Ni thin films Society For Experimental Mechanics - Sem Annual Conference and Exposition On Experimental and Applied Mechanics 2009. 4: 2373-2381. |
0.343 |
|
2008 |
Karanjgaokar N, Jonnalagadda K, Chasiotis I, Chee J, Mahmood A, Peroulis D. Mechanical behavior of nanocrystalline Au films as a function of strain rate and film thickness Society For Experimental Mechanics - 11th International Congress and Exhibition On Experimental and Applied Mechanics 2008. 4: 1860-1866. |
0.385 |
|
2008 |
Yagnamurthy S, Chasiotis I, Lambros J, Polcawich R, Pulskamp J, Dubey M. Mechanical properties of PZT films and their composites for RF-MEMS Society For Experimental Mechanics - 11th International Congress and Exhibition On Experimental and Applied Mechanics 2008. 3: 1253-1259. |
0.372 |
|
2008 |
Jonnalagadda K, Chasiotis I. Microstructural and geometrical factors influencing the mechanical failure of polysilicon for MEMS Materials Research Society Symposium Proceedings. 1052: 37-45. |
0.338 |
|
2007 |
Naraghi M, Chasiotis I, Kahn H, Wen Y, Dzenis Y. Novel method for mechanical characterization of polymeric nanofibers. The Review of Scientific Instruments. 78: 085108. PMID 17764356 DOI: 10.1063/1.2771092 |
0.314 |
|
2007 |
Cho SW, Jonnalagadda K, Chasiotis I. Mode I and mixed mode fracture of polysilicon for MEMS Fatigue and Fracture of Engineering Materials and Structures. 30: 21-31. DOI: 10.1111/j.1460-2695.2006.01086.x |
0.306 |
|
2007 |
Stanec JR, Smith CH, Chasiotis I, Barker NS. Realization of low-stress Au cantilever beams Journal of Micromechanics and Microengineering. 17. DOI: 10.1088/0960-1317/17/2/N01 |
0.302 |
|
2007 |
McCarty A, Chasiotis I. Description of brittle failure of non-uniform MEMS geometries Thin Solid Films. 515: 3267-3276. DOI: 10.1016/j.tsf.2006.01.039 |
0.354 |
|
2007 |
Chasiotis I, Knauss WG. 8.02 - Experimentation at the Micron and Submicron Scale Comprehensive Structural Integrity. 8: 41-87. DOI: 10.1016/B0-08-043749-4/08038-1 |
0.461 |
|
2007 |
Cho SW, Chasiotis I. Elastic properties and representative volume element of polycrystalline silicon for MEMS Experimental Mechanics. 47: 37-49. DOI: 10.1007/s11340-006-0405-7 |
0.343 |
|
2007 |
Tang X, Jonnalagadda K, Chasiotis I, Lambros J, Polcawich R, Pulskamp J, Dubey M. Effect of strain-rate on the mechanical behavior of Pt-films for MEMS Proceedings of the Sem Annual Conference and Exposition On Experimental and Applied Mechanics 2007. 2: 1270-1275. |
0.405 |
|
2006 |
Chasiotis I, Cho SW. Representative volume element of polycrystalline silicon for MEMS Proceedings of the 2006 Sem Annual Conference and Exposition On Experimental and Applied Mechanics 2006. 3: 1691-1697. |
0.349 |
|
2005 |
Jonnalagadda K, Chasiotis I. Effect of film thickness on the fracture toughness of amorphous diamond-like carbon American Society of Mechanical Engineers, Micro-Electro Mechanical Systems Division, (Publications) Mems. 7: 363-364. DOI: 10.1115/IMECE2005-81631 |
0.311 |
|
2005 |
Cho S, Cárdenas-García JF, Chasiotis I. Measurement of nanodisplacements and elastic properties of MEMS via the microscopic hole method Sensors and Actuators, a: Physical. 120: 163-171. DOI: 10.1016/j.sna.2004.11.028 |
0.33 |
|
2005 |
Cho S, Cárdenas-Garcia JF, Chasiotis I. Determination of elastic properties of MEMS materials using inverse solutions Proceedings of the 2005 Sem Annual Conference and Exposition On Experimental and Applied Mechanics. 1669-1673. |
0.321 |
|
2004 |
Chasiotis I. Mechanics of thin films and microdevices Ieee Transactions On Device and Materials Reliability. 4: 176-188. DOI: 10.1109/TDMR.2004.829901 |
0.483 |
|
2003 |
Knauss WG, Chasiotis I, Huang Y. Mechanical measurements at the micron and nanometer scales Mechanics of Materials. 35: 217-231. DOI: 10.1016/S0167-6636(02)00271-5 |
0.611 |
|
2003 |
Chasiotis I, Knauss WG. The mechanical strength of polysilicon films: Part 1. The influence of fabrication governed surface conditions Journal of the Mechanics and Physics of Solids. 51: 1533-1550. DOI: 10.1016/S0022-5096(03)00051-6 |
0.631 |
|
2003 |
Chasiotis I, Knauss WG. The mechanical strength of polysilicon films: Part 2. Size effects associated with elliptical and circular perforations Journal of the Mechanics and Physics of Solids. 51: 1551-1572. DOI: 10.1016/S0022-5096(03)00050-4 |
0.623 |
|
2003 |
Cárdenas-García JF, Cho S, Chasiotis I. Thin film material parameters derived from full field nanometric displacement measurements in non-uniform MEMS geometries Materials Research Society Symposium - Proceedings. 795: 527-532. |
0.365 |
|
2002 |
Chasiotis I, Knauss WG. Size effects determined from tensile tests of perforated MEMS scale specimens Materials Research Society Symposium - Proceedings. 687: 35-40. DOI: 10.1557/Proc-687-B2.4 |
0.616 |
|
2002 |
Chasiotis I, Knauss WG. A new microtensile tester for the study of MEMS materials with the aid of atomic force microscopy Experimental Mechanics. 42: 51-57. DOI: 10.1007/Bf02411051 |
0.627 |
|
2001 |
Chasiotis I, Knauss WG. The influence of fabrication governed surface conditions on the mechanical strength of thin film materials Materials Research Society Symposium - Proceedings. 657. DOI: 10.1557/Proc-657-Ee2.2 |
0.654 |
|
2001 |
LaVan DA, Tsuchiya T, Coles G, Knauss WG, Chasiotis I, Read D. Cross comparison of direct strength testing techniques on polysilicon films Astm Special Technical Publication. 16-27. |
0.586 |
|
2000 |
Chasiotis I, Knauss WG. Microtensile tests with the aid of probe microscopy for the study of MEMS materials Proceedings of Spie. 4175: 96-103. DOI: 10.1117/12.395616 |
0.657 |
|
1998 |
Chasiotis I, Knauss WG. Mechanical properties of thin polysilicon films by means of probe microscopy Proceedings of Spie. 3512: 66-75. DOI: 10.1117/12.324072 |
0.65 |
|
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