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Ioannis Chasiotis, Ph.D. - Publications

Affiliations: 
2002 California Institute of Technology, Pasadena, CA 
Area:
Aerospace Engineering, Materials Science Engineering
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39 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2018 Gonzalez JF, Antartis DA, Chasiotis I, Dillon SJ, Lambros J. In situ X-ray micro-CT characterization of chemo-mechanical relaxations during Sn lithiation Journal of Power Sources. 381: 181-189. DOI: 10.1016/J.Jpowsour.2018.01.056  0.315
2016 Das D, Sanchez L, Martin J, Power B, Isaacson S, Polcawich RG, Chasiotis I. Control of mechanical response of freestanding PbZr0.52Ti0.48O3 films through texture Applied Physics Letters. 109. DOI: 10.1063/1.4963348  0.387
2016 Kolluru PV, Chasiotis I. A master curve for the size and strain rate dependent large deformation behavior of PS nanofibers at room temperature Polymer (United Kingdom). 99: 544-551. DOI: 10.1016/j.polymer.2016.07.046  0.314
2015 Yagnamurthy S, Boyce BL, Chasiotis I. Role of Microstructure and Doping on the Mechanical Strength and Toughness of Polysilicon Thin Films Journal of Microelectromechanical Systems. 24: 1436-1452. DOI: 10.1109/Jmems.2015.2410215  0.421
2015 Das D, Power B, Martin JP, Polcawich RG, Chasiotis I. Role of oxide seed layer in plastic response of epitaxially grown textured metal films Acta Materialia. DOI: 10.1016/J.Actamat.2016.04.025  0.377
2013 Karanjgaokar N, Stump F, Geubelle P, Chasiotis I. A thermally activated model for room temperature creep in nanocrystalline Au films at intermediate stresses Scripta Materialia. 68: 551-554. DOI: 10.1016/J.Scriptamat.2012.11.017  0.56
2012 Stump FV, Karanjgaokar N, Geubelle PH, Chasiotis I. A multiscale model of rate dependence of nanocrystalline thin films International Journal For Multiscale Computational Engineering. 10: 441-459. DOI: 10.1615/Intjmultcompeng.2012003059  0.577
2011 Yagnamurthy S, Chasiotis I, Lambros J, Polcawich RG, Pulskamp JS, Dubey M. Mechanical and ferroelectric behavior of PZT-based thin films Journal of Microelectromechanical Systems. 20: 1250-1258. DOI: 10.1109/Jmems.2011.2167666  0.331
2011 Yagnamurthy S, Chasiotis I. Mechanical and piezoelectric behavior of thin film PZT composites for MEMS applications Conference Proceedings of the Society For Experimental Mechanics Series. 2: 261-266.  0.34
2010 Naraghi M, Ozkan T, Chasiotis I, Hazra SS, De Boer MP. MEMS platform for on-chip nanomechanical experiments with strong and highly ductile nanofibers Journal of Micromechanics and Microengineering. 20. DOI: 10.1088/0960-1317/20/12/125022  0.302
2010 Jonnalagadda KN, Chasiotis I, Yagnamurthy S, Lambros J, Pulskamp J, Polcawich R, Dubey M. Experimental investigation of strain rate dependence of nanocrystalline Pt films Experimental Mechanics. 50: 25-35. DOI: 10.1007/S11340-008-9212-7  0.363
2010 Li X, Chasiotis I, Kitamura T. In situ scanning probe microscopy nanomechanical testing Mrs Bulletin. 35: 361-367.  0.315
2009 Chasiotis I, Jonnalagadda KN. Strength and fracture resistance of amorphous diamond-like carbon films for MEMS Journal of Nanomaterials. 2009. DOI: 10.1155/2009/204281  0.335
2009 Karanjgaokar N, Chasiotis I, Peroulis D, Jonnalagadda K. Strain rate and creep response of Au and Ni thin films Society For Experimental Mechanics - Sem Annual Conference and Exposition On Experimental and Applied Mechanics 2009. 4: 2373-2381.  0.343
2008 Karanjgaokar N, Jonnalagadda K, Chasiotis I, Chee J, Mahmood A, Peroulis D. Mechanical behavior of nanocrystalline Au films as a function of strain rate and film thickness Society For Experimental Mechanics - 11th International Congress and Exhibition On Experimental and Applied Mechanics 2008. 4: 1860-1866.  0.385
2008 Yagnamurthy S, Chasiotis I, Lambros J, Polcawich R, Pulskamp J, Dubey M. Mechanical properties of PZT films and their composites for RF-MEMS Society For Experimental Mechanics - 11th International Congress and Exhibition On Experimental and Applied Mechanics 2008. 3: 1253-1259.  0.372
2008 Jonnalagadda K, Chasiotis I. Microstructural and geometrical factors influencing the mechanical failure of polysilicon for MEMS Materials Research Society Symposium Proceedings. 1052: 37-45.  0.338
2007 Naraghi M, Chasiotis I, Kahn H, Wen Y, Dzenis Y. Novel method for mechanical characterization of polymeric nanofibers. The Review of Scientific Instruments. 78: 085108. PMID 17764356 DOI: 10.1063/1.2771092  0.314
2007 Cho SW, Jonnalagadda K, Chasiotis I. Mode I and mixed mode fracture of polysilicon for MEMS Fatigue and Fracture of Engineering Materials and Structures. 30: 21-31. DOI: 10.1111/j.1460-2695.2006.01086.x  0.306
2007 Stanec JR, Smith CH, Chasiotis I, Barker NS. Realization of low-stress Au cantilever beams Journal of Micromechanics and Microengineering. 17. DOI: 10.1088/0960-1317/17/2/N01  0.302
2007 McCarty A, Chasiotis I. Description of brittle failure of non-uniform MEMS geometries Thin Solid Films. 515: 3267-3276. DOI: 10.1016/j.tsf.2006.01.039  0.354
2007 Chasiotis I, Knauss WG. 8.02 - Experimentation at the Micron and Submicron Scale Comprehensive Structural Integrity. 8: 41-87. DOI: 10.1016/B0-08-043749-4/08038-1  0.461
2007 Cho SW, Chasiotis I. Elastic properties and representative volume element of polycrystalline silicon for MEMS Experimental Mechanics. 47: 37-49. DOI: 10.1007/s11340-006-0405-7  0.343
2007 Tang X, Jonnalagadda K, Chasiotis I, Lambros J, Polcawich R, Pulskamp J, Dubey M. Effect of strain-rate on the mechanical behavior of Pt-films for MEMS Proceedings of the Sem Annual Conference and Exposition On Experimental and Applied Mechanics 2007. 2: 1270-1275.  0.405
2006 Chasiotis I, Cho SW. Representative volume element of polycrystalline silicon for MEMS Proceedings of the 2006 Sem Annual Conference and Exposition On Experimental and Applied Mechanics 2006. 3: 1691-1697.  0.349
2005 Jonnalagadda K, Chasiotis I. Effect of film thickness on the fracture toughness of amorphous diamond-like carbon American Society of Mechanical Engineers, Micro-Electro Mechanical Systems Division, (Publications) Mems. 7: 363-364. DOI: 10.1115/IMECE2005-81631  0.311
2005 Cho S, Cárdenas-García JF, Chasiotis I. Measurement of nanodisplacements and elastic properties of MEMS via the microscopic hole method Sensors and Actuators, a: Physical. 120: 163-171. DOI: 10.1016/j.sna.2004.11.028  0.33
2005 Cho S, Cárdenas-Garcia JF, Chasiotis I. Determination of elastic properties of MEMS materials using inverse solutions Proceedings of the 2005 Sem Annual Conference and Exposition On Experimental and Applied Mechanics. 1669-1673.  0.321
2004 Chasiotis I. Mechanics of thin films and microdevices Ieee Transactions On Device and Materials Reliability. 4: 176-188. DOI: 10.1109/TDMR.2004.829901  0.483
2003 Knauss WG, Chasiotis I, Huang Y. Mechanical measurements at the micron and nanometer scales Mechanics of Materials. 35: 217-231. DOI: 10.1016/S0167-6636(02)00271-5  0.611
2003 Chasiotis I, Knauss WG. The mechanical strength of polysilicon films: Part 1. The influence of fabrication governed surface conditions Journal of the Mechanics and Physics of Solids. 51: 1533-1550. DOI: 10.1016/S0022-5096(03)00051-6  0.631
2003 Chasiotis I, Knauss WG. The mechanical strength of polysilicon films: Part 2. Size effects associated with elliptical and circular perforations Journal of the Mechanics and Physics of Solids. 51: 1551-1572. DOI: 10.1016/S0022-5096(03)00050-4  0.623
2003 Cárdenas-García JF, Cho S, Chasiotis I. Thin film material parameters derived from full field nanometric displacement measurements in non-uniform MEMS geometries Materials Research Society Symposium - Proceedings. 795: 527-532.  0.365
2002 Chasiotis I, Knauss WG. Size effects determined from tensile tests of perforated MEMS scale specimens Materials Research Society Symposium - Proceedings. 687: 35-40. DOI: 10.1557/Proc-687-B2.4  0.616
2002 Chasiotis I, Knauss WG. A new microtensile tester for the study of MEMS materials with the aid of atomic force microscopy Experimental Mechanics. 42: 51-57. DOI: 10.1007/Bf02411051  0.627
2001 Chasiotis I, Knauss WG. The influence of fabrication governed surface conditions on the mechanical strength of thin film materials Materials Research Society Symposium - Proceedings. 657. DOI: 10.1557/Proc-657-Ee2.2  0.654
2001 LaVan DA, Tsuchiya T, Coles G, Knauss WG, Chasiotis I, Read D. Cross comparison of direct strength testing techniques on polysilicon films Astm Special Technical Publication. 16-27.  0.586
2000 Chasiotis I, Knauss WG. Microtensile tests with the aid of probe microscopy for the study of MEMS materials Proceedings of Spie. 4175: 96-103. DOI: 10.1117/12.395616  0.657
1998 Chasiotis I, Knauss WG. Mechanical properties of thin polysilicon films by means of probe microscopy Proceedings of Spie. 3512: 66-75. DOI: 10.1117/12.324072  0.65
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