Lequn Liu, Ph.D. - Publications
Affiliations: | 2002 | University of Illinois, Urbana-Champaign, Urbana-Champaign, IL |
Area:
scanning tunneling microscopy, nanofabrication, nanoelectronics, and IC chip reliabilityYear | Citation | Score | |||
---|---|---|---|---|---|
2004 | Yu J, Liu L, Lyding JW. A Scanning Tunneling Microscopy Study: Si/SiO 2 Interface Roughness Induced by Chemical Etching Mrs Proceedings. 838: 44-49. DOI: 10.1557/Proc-838-O4.9 | 0.345 | |||
2002 | Liu L, Yu J, Viernes NOL, Moore JS, Lyding JW. Adsorption of cobalt phthalocyanine on Si(1 0 0)2 × 1 and Si(1 0 0)2 × 1:H surfaces studied by scanning tunneling microscopy and spectroscopy Surface Science. 516: 118-126. DOI: 10.1016/S0039-6028(02)01958-1 | 0.591 | |||
2001 | Liu L, Yu J, Lyding JW. Scanning tunneling microscopy observation of single dangling bonds on the Si(100)2×1:H surface Mrs Proceedings. 705: 187-192. DOI: 10.1557/Proc-705-Y6.6 | 0.544 | |||
2001 | Liu L, Yu J, Lyding JW. Depth Dependence of Dopant Induced Features on The Si(100)2x1:H Surface and Its Application for Three Dimensional Dopant Profiling Mrs Proceedings. 699: 207-211. DOI: 10.1557/Proc-699-R4.5 | 0.565 | |||
2001 | Liu L, Yu J, Lyding JW. Atom-resolved three-dimensional mapping of boron dopants in Si(100) by scanning tunneling microscopy Applied Physics Letters. 78: 386-388. DOI: 10.1063/1.1339260 | 0.593 | |||
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