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Chih-Hung Chen, Ph.D. - Publications

Affiliations: 
2002 McMaster University, Hamilton, ON, Canada 
Area:
Electronics and Electrical Engineering
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20 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2018 Chen X, Chen C, Lee R. Fast Evaluation of the High-Frequency Channel Noise in Nanoscale MOSFETs Ieee Transactions On Electron Devices. 65: 1502-1509. DOI: 10.1109/Ted.2018.2808184  0.434
2017 Chen X, Chen C, Lee R, Chen DC, Wu DY. Direct Deembedding of Noise Factors for On-Wafer Noise Measurement Ieee Transactions On Microwave Theory and Techniques. 65: 916-922. DOI: 10.1109/Tmtt.2016.2627555  0.438
2015 Jeong E, Deen MJ, Chen C, Baek R, Lee J, Jeong Y. Physical DC and thermal noise models of 18 nm double-gate junctionless p-type MOSFETs for low noise RF applications Japanese Journal of Applied Physics. 54. DOI: 10.7567/Jjap.54.04Dc08  0.438
2012 Chen C, Lee R, Tan G, Chen DC, Lei P, Yeh C. Equivalent Sheet Resistance of Intrinsic Noise in Sub-100-nm MOSFETs Ieee Transactions On Electron Devices. 59: 2215-2220. DOI: 10.1109/Ted.2012.2198651  0.423
2008 Chen C. Accuracy Issues Of On-Wafer Microwave Noise Measurements Fluctuation and Noise Letters. 8. DOI: 10.1142/S0219477508005136  0.431
2008 Chen C, Wang Y, Bakr MH, Zeng Z. Novel Noise Parameter Determination for On-Wafer Microwave Noise Measurements Ieee Transactions On Instrumentation and Measurement. 57: 2462-2471. DOI: 10.1109/Tim.2008.925021  0.434
2007 Asgaran S, Deen MJ, Chen C. Design of the Input Matching Network of RF CMOS LNAs for Low-Power Operation Ieee Transactions On Circuits and Systems I: Regular Papers. 54: 544-554. DOI: 10.1109/Tcsi.2006.887622  0.38
2007 Asgaran S, Deen MJ, Chen C, Rezvani GA, Kamali Y, Kiyota Y. Analytical Determination of MOSFET's High-Frequency Noise Parameters From NF $_{50}$ Measurements and Its Application in RFIC Design Ieee Journal of Solid-State Circuits. 42: 1034-1043. DOI: 10.1109/Jssc.2007.894309  0.452
2006 Deen MJ, Chen C, Asgaran S, Rezvani GA, Tao J, Kiyota Y. High-Frequency Noise of Modern MOSFETs: Compact Modeling and Measurement Issues Ieee Transactions On Electron Devices. 53: 2062-2081. DOI: 10.1109/Ted.2006.880370  0.46
2006 Asgaran S, Deen MJ, Chen C. A 4-mW monolithic CMOS LNA at 5.7GHz with the gate resistance used for input matching Ieee Microwave and Wireless Components Letters. 16: 188-190. DOI: 10.1109/Lmwc.2006.872128  0.398
2006 Naseh S, Deen MJ, Chen C. Hot-carrier reliability of submicron NMOSFETs and integrated NMOS low noise amplifiers Microelectronics Reliability. 46: 201-212. DOI: 10.1016/J.Microrel.2005.04.009  0.405
2005 Cheng Y, Deen MJ, Chen C. MOSFET modeling for RF IC design Ieee Transactions On Electron Devices. 52: 1286-1303. DOI: 10.1109/Ted.2005.850656  0.395
2005 Naseh S, Deen MJ, Chen C. Effects of hot-carrier stress on the performance of CMOS low-noise amplifiers Ieee Transactions On Device and Materials Reliability. 5: 501-508. DOI: 10.1109/Tdmr.2005.853502  0.392
2005 Ranuarez JC, Deen MJ, Chen C. Modeling the partition of noise from the gate-tunneling current in MOSFETs Ieee Electron Device Letters. 26: 550-552. DOI: 10.1109/Led.2005.851813  0.402
2004 Asgaran S, Deen MJ, Chen C. Analytical modeling of MOSFETs channel noise and noise parameters Ieee Transactions On Electron Devices. 51: 2109-2114. DOI: 10.1109/Ted.2004.838450  0.446
2002 Chen C, Deen MJ. Channel noise modeling of deep submicron MOSFETs Ieee Transactions On Electron Devices. 49: 1484-1487. DOI: 10.1109/Ted.2002.801229  0.422
2002 Cheng Y, Chen C, Matloubian M, Deen MJ. High-frequency small signal AC and noise modeling of MOSFETs for RF IC design Ieee Transactions On Electron Devices. 49: 400-408. DOI: 10.1109/16.987109  0.442
2001 Chen C, Deen MJ, Cheng Y, Matloubian M. Extraction of the induced gate noise, channel noise, and their correlation in submicron MOSFETs from RF noise measurements Ieee Transactions On Electron Devices. 48: 2884-2892. DOI: 10.1109/16.974722  0.417
2001 Chen C, Deen MJ. Rf Cmos Noise Characterization And Modeling International Journal of High Speed Electronics and Systems. 11: 1085-1157. DOI: 10.1016/S0129-1564(01)00106-4  0.466
2000 Chen C, Deen MJ. Direct extraction of the channel thermal noise in metal-oxide-semiconductor field effect transistor from measurements of their rf noise parameters Journal of Vacuum Science and Technology. 18: 757-760. DOI: 10.1116/1.582174  0.433
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