Hai Lu, Ph.D.
Affiliations: | 2003 | Cornell University, Ithaca, NY, United States |
Area:
Compound semiconductor materials and high frequency high speed devices; molecular beam epitaxy; microwave and millimeter wave transistors and integrated circuits; semiconductor lasers and photodetectors and their integration with transistorsGoogle:
"Hai Lu"Mean distance: 16.2 | S | N | B | C | P |
Parents
Sign in to add mentorLester F. Eastman | grad student | 2003 | Cornell | |
(Electrical and optical properties of indium nitride and indium-rich nitrides prepared by molecular beam epitaxy for opto-electronics applications.) |
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Publications
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Wu Y, Liu B, Li Z, et al. (2019) Homo-epitaxial growth of high crystal quality GaN thin films by plasma assisted–molecular beam epitaxy Journal of Crystal Growth. 506: 30-35 |
Zhang Z, Li Y, Liu W, et al. (2016) Controllable lasing behavior enabled by compound dielectric waveguide grating structures. Optics Express. 24: 19458-19466 |
Jiang T, Zhang YD, Chen Q, et al. (2016) TREM2 modifies microglial phenotype and provides neuroprotection in P301S tau transgenic mice. Neuropharmacology |
Jiang T, Wan Y, Zhang YD, et al. (2016) TREM2 Overexpression has No Improvement on Neuropathology and Cognitive Impairment in Aging APPswe/PS1dE9 Mice. Molecular Neurobiology |
Wu WJ, Shi J, Hu G, et al. (2015) Wnt/β-catenin signaling inhibits FBXW7 expression by upregulation of microRNA-770 in hepatocellular carcinoma. Tumour Biology : the Journal of the International Society For Oncodevelopmental Biology and Medicine |
Inushima T, K. Maude D, Lu H, et al. (2012) Superconducting Properties of InN with Low Carrier Density near the Mott Transition Journal of the Physical Society of Japan. 81: 044704 |
Rauch C, Tuomisto F, King PDC, et al. (2012) Self-compensation in highly n-type InN Applied Physics Letters. 101: 11903 |
Davydov VY, Klochikhin AA, Smirnov AN, et al. (2010) Resonant raman scattering and dispersion of polar optical and acoustic phonons in hexagonal inn Semiconductors. 44: 161-170 |
Rauch C, Reurings F, Tuomisto F, et al. (2010) In-vacancies in Si-doped InN Physica Status Solidi (a) Applications and Materials Science. 207: 1083-1086 |
Jones RE, Li SX, Yu KM, et al. (2009) Properties of native point defects in In1-xAlxN alloys Journal of Physics D: Applied Physics. 42 |