Robert M. Westervelt
Affiliations: | Physics | Harvard University, Cambridge, MA, United States |
Area:
mesoscopic physicsWebsite:
https://www.seas.harvard.edu/directory/bmwGoogle:
"Robert Moore Westervelt"Mean distance: 11.59 | S | N | B | C | P |
Parents
Sign in to add mentorCarson Dunning Jeffries | grad student | 1977 | UC Berkeley | |
(Nucleation phenomena in the formation of electron-hole drops in Ge) |
Children
Sign in to add trainee
BETA: Related publications
See more...
Publications
You can help our author matching system! If you notice any publications incorrectly attributed to this author, please sign in and mark matches as correct or incorrect. |
Lei KM, Ha D, Song YQ, et al. (2020) Portable NMR with Parallelism. Analytical Chemistry |
Bhandari S, Lee GH, Klales A, et al. (2016) Imaging Cyclotron Orbits of Electrons in Graphene. Nano Letters |
Nemiroski A, Ryou M, Thompson CC, et al. (2015) Swallowable fluorometric capsule for wireless triage of gastrointestinal bleeding. Lab On a Chip. 15: 4479-87 |
Wang WL, Santos EJ, Jiang B, et al. (2014) Direct observation of a long-lived single-atom catalyst chiseling atomic structures in graphene. Nano Letters. 14: 450-5 |
Brown KA, Westervelt RM. (2014) Fabrication of coaxial and triaxial atomic force microscope imaging probes Materials Research Society Symposium Proceedings. 1712 |
Bhandari S, Westervelt RM. (2014) Low-temperature scanning capacitance probe for imaging electron motion Journal of Physics: Conference Series. 568 |
Koziej D, Floryan C, Sperling RA, et al. (2013) Microwave dielectric heating of non-aqueous droplets in a microfluidic device for nanoparticle synthesis. Nanoscale. 5: 5468-75 |
Satzinger KJ, Brown KA, Westervelt RM. (2012) The importance of cantilever dynamics in the interpretation of Kelvin probe force microscopy. Journal of Applied Physics. 112: 64510 |
Wang WL, Bhandari S, Yi W, et al. (2012) Direct imaging of atomic-scale ripples in few-layer graphene. Nano Letters. 12: 2278-82 |
Brown KA, Satzinger KJ, Westervelt RM. (2012) High spatial resolution Kelvin probe force microscopy with coaxial probes. Nanotechnology. 23: 115703 |