Atif Imtiaz, Ph.D.
Affiliations: | 2005 | University of Maryland, College Park, College Park, MD |
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Sign in to add mentor| Steven Anlage | grad student | 2005 | University of Maryland | |
| (Quantitative materials contrast at high spatial resolution with a novel near -field scanning microwave microscope.) | ||||
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| Coakley KJ, Imtiaz A, Wallis TM, et al. (2015) Adaptive and robust statistical methods for processing near-field scanning microwave microscopy images. Ultramicroscopy. 150: 1-9 |
| Weber JC, Blanchard PT, Sanders AW, et al. (2014) GaN nanowire coated with atomic layer deposition of tungsten: a probe for near-field scanning microwave microscopy. Nanotechnology. 25: 415502 |
| Imtiaz A, Wallis TM, Kabos P. (2014) Near-field scanning microwave microscopy: An emerging research tool for nanoscale metrology Ieee Microwave Magazine. 15: 52-64 |
| Imtiaz A, Wallis TM, Weber JC, et al. (2014) Imaging the p-n junction in a gallium nitride nanowire with a scanning microwave microscope Applied Physics Letters. 104 |
| Weber JC, Blanchard PT, Sanders AW, et al. (2014) Gallium nitride nanowire probe for near-field scanning microwave microscopy Applied Physics Letters. 104 |
| Imtiaz A, Wallis TM, Kabos P. (2013) Near-field scanning microwave microscope (NSMM) Access Science |
| Weber JC, Schlager JB, Sanford NA, et al. (2012) A near-field scanning microwave microscope for characterization of inhomogeneous photovoltaics. The Review of Scientific Instruments. 83: 083702 |
| Imtiaz A, Wallis TM, Lim SH, et al. (2012) Frequency-selective contrast on variably doped p-type silicon with a scanning microwave microscope Journal of Applied Physics. 111 |
| Huber HP, Humer I, Hochleitner M, et al. (2012) Calibrated nanoscale dopant profiling using a scanning microwave microscope Journal of Applied Physics. 111 |
| Wallis TM, Gu D, Imtiaz A, et al. (2011) Electrical characterization of photoconductive gan nanowires from 50 MHz to 33 GHz Ieee Transactions On Nanotechnology. 10: 832-838 |