Virgil Bruce Elings
Affiliations: | Physics | University of California, Santa Barbara, Santa Barbara, CA, United States |
Area:
scanning probe microscopesWebsite:
http://web.mit.edu/physics/giving/profiles/elings.htmlGoogle:
"Virgil Bruce Elings"Mean distance: 13.85 | S | N | B | C | P |
Parents
Sign in to add mentorLouis S. Osborne | grad student | 1966 | MIT | |
(Photoproduction of single [pi] and K mesons from hydrogen at incident energies near 4.0 BeV.) |
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Publications
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Ghislain LP, Elings VB, Crozier KB, et al. (1999) Near-field photolithography with a solid immersion lens Applied Physics Letters. 74: 501-503 |
Anczykowski B, Gotsmann B, Fuchs H, et al. (1999) How to measure energy dissipation in dynamic mode atomic force microscopy Applied Surface Science. 140: 376-382 |
Wilder K, Quate CF, Adderton D, et al. (1998) Noncontact nanolithography using the atomic force microscope Applied Physics Letters. 73: 2527-2529 |
Cleveland JP, Anczykowski B, Schmid AE, et al. (1998) Energy dissipation in tapping-mode atomic force microscopy Applied Physics Letters. 72: 2613-2615 |
Taylor RS, Leopold KE, Wendman M, et al. (1998) Scanning probe optical microscopy of evanescent fields Review of Scientific Instruments. 69: 2981-2987 |
Anczykowski B, Cleveland JP, Krüger D, et al. (1998) Analysis of the interactionmechanisms in dynamicmode SFM by means of experimental data and computer simulation Applied Physics a: Materials Science and Processing. 66: S885-S889 |
Magonov SN, Cleveland J, Elings V, et al. (1997) Tapping-mode atomic force microscopy study of the near-surface composition of a styrene-butadiene-styrene triblock copolymer film Surface Science. 389: 201-211 |
Magonov SN, Elings V, Whangbo MH. (1997) Phase imaging and stiffness in tapping-mode atomic force microscopy Surface Science. 375: L385-L391 |
Walters DA, Cleveland JP, Thomson NH, et al. (1996) Short cantilevers for atomic force microscopy Review of Scientific Instruments. 67: 3583-3590 |
Manalis S, Babcock K, Massie J, et al. (1995) Submicron studies of recording media using thin-film magnetic scanning probes Applied Physics Letters. 2585 |