Virgil Bruce Elings

Physics University of California, Santa Barbara, Santa Barbara, CA, United States 
scanning probe microscopes
"Virgil Bruce Elings"
Mean distance: 13.85


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Louis S. Osborne grad student 1966 MIT
 (Photoproduction of single [pi] and K mesons from hydrogen at incident energies near 4.0 BeV.)
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Wu Q, Ghislain LP, Elings VB. (2000) Imaging with solid immersion lenses, spatial resolution, and applications Proceedings of the Ieee. 88: 1491-1498
Vollmer M, Giessen H, Stolz W, et al. (1999) Ultrafast nonlinear sub-wavelength solid immersion spectroscopy at T = 8 K: An alternative to nonlinear scanning near-field optical microscopy Journal of Microscopy. 194: 523-527
Möller C, Allen M, Elings V, et al. (1999) Tapping-mode atomic force microscopy produces faithful high-resolution images of protein surfaces Biophysical Journal. 77: 1150-1158
Anczykowski B, Gotsmann B, Fuchs H, et al. (1999) How to measure energy dissipation in dynamic mode atomic force microscopy Applied Surface Science. 140: 376-382
Ghislain LP, Elings VB, Crozier KB, et al. (1999) Near-field photolithography with a solid immersion lens Applied Physics Letters. 74: 501-503
Vollmer M, Giessen H, Stolz W, et al. (1999) ltrafast nonlinear subwavelength solid immersion spectroscopy at T=8 K Applied Physics Letters. 74: 1791-1793
Czajkowsky DM, Allen MJ, Elings V, et al. (1998) Direct visualization of surface charge in aqueous solution. Ultramicroscopy. 74: 1-5
Wilder K, Quate CF, Adderton D, et al. (1998) Noncontact nanolithography using the atomic force microscope Applied Physics Letters. 73: 2527-2529
Ghislain LP, Elings VB. (1998) Near-field scanning solid immersion microscope Applied Physics Letters. 72: 2779-2781
Cleveland JP, Anczykowski B, Schmid AE, et al. (1998) Energy dissipation in tapping-mode atomic force microscopy Applied Physics Letters. 72: 2613-2615
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