Dale Larry Doering

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1981 Wesleyan University, Middletown, CT, United States 
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"Dale Larry Doering"
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J. Thomas Dickinson grad student 1981 WSU
 (Ultra high vacuum studies of the interaction of carbon monoxide with small supported metal particles)
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Publications

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Iedema MJ, Dresser MJ, Doering DL, et al. (1998) Ferroelectricity in water ice Journal of Physical Chemistry B. 102: 9203-9214
Dickinson JT, Langford SC, Shin JJ, et al. (1994) Positive ion emission from excimer laser excited MgO surfaces. Physical Review Letters. 73: 2630-2633
Siek KH, Doering DL, Sacks RN, et al. (1994) Absorption coefficient measurements of AlGaAs/GaAs heterojunction structures using transient photoluminescence spectroscopy Materials Research Society Symposium Proceedings. 326: 549-554
Doering DL, Siek KH, Xiong-Skiba P, et al. (1994) Defect engineering and characterization in oxide surfaces using electron beam irradiation Materials Research Society Symposium Proceedings. 316: 93-98
Carroll DL, Doering DL, Xiong-Skiba P. (1993) Electron Trapping Mechanisms in an Irradiated Single Crystal of Quartz Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 11: 2312-2316
Xiong-Skiba P, Carroll DL, Doering DL, et al. (1993) Defects induced by electron bombardment and substrate doping in SiO2 thin films Materials Research Society Symposium Proceedings. 284: 275-280
Carroll DL, Doering DL, Xiong-Skiba P. (1993) Defect creation and electron trapping in single crystal and sintered alumina by electron beam irradiation Materials Research Society Symposium Proceedings. 279: 445-450
Beetz CP, Lincoln B, Segall K, et al. (1991) Applications of diamond films to photocathode electron guns and accelerators Conference Record of 1991 Ieee Particle Accelerator Conference. 1981-1983
Xiora-Skiba P, Carroll DL, Doering DL. (1990) Characterization of electron beam damage in oxidized silicon using thermally stimulated exoelectron emission Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 8: 1549-1553
Doering DL, Dickinson JT, Xiong-Skiba P, et al. (1990) Fracto-emission during the interfacial failure of a metal-oxide-semiconductor system: Au SiO2-Si Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 8: 2401-2406
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