Peter Mark
Affiliations: | Electrical Engineering | Princeton University, Princeton, NJ |
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"Peter Mark"Bio:
(1931 - 1979)
http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=1063060
Mean distance: 12.55 | S | N | B | C | P |
Parents
Sign in to add mentor| Hartmut Paul Kallmann | grad student | 1958 | NYU | |
| (AC impedance measurements of specially activated ZnS and ZnCdS phosphors in powder form.) | ||||
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Publications
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| Duke CB, Meyer RJ, Mark P. (1980) TRENDS IN SURFACE ATOMIC GEOMETRIES OF COMPOUND SEMICONDUCTORS Journal of Vacuum Science & Technology. 17: 971-977 |
| Meyer RJ, Duke CB, Paton A, et al. (1980) Dynamical analysis of low-energy-electron diffraction intensities from InP (110) Physical Review B. 22: 6171-6183 |
| Meyer RJ, Duke CB, Paton A, et al. (1980) Surface structure of ZnTe (110) as determined from dynamical analysis of low-energy-electron diffraction intensities Physical Review B. 22: 2875-2886 |
| Tsang J, Kahn A, Mark P. (1980) Comparison of leed and auger data from cleaved and sputtered-annealed InP(110) surfaces Surface Science. 97: 119-127 |
| Kahn A, Kanani D, Mark P. (1980) The GaAs(110)-oxygen interaction: A LEED analysis. II Surface Science. 94: 547-554 |
| Duke CB, Meyer RJ, Paton A, et al. (1979) SURFACE ATOMIC GEOMETRY OF COVALENTLY BONDED SEMICONDUCTORS: InSb(110) AND ITS COMPARISON WITH GaAs(110) AND ZnTe(110) Journal of Vacuum Science & Technology. 17: 501-505 |
| Duke CB, Meyer RJ, Paton A, et al. (1979) STRUCTURE DETERMINATION FOR THE (110) SURFACE OF ZINCBLENDE STRUCTURE COMPOUND SEMICONDUCTORS Journal of Vacuum Science & Technology. 16: 1252-1257 |
| Duke CB, Meyer RJ, Paton A, et al. (1979) ANALYSIS OF ELEED INTENSITIES FROM ZnTe(110) J Vac Sci Technol. 16: 647-650 |
| Lee BW, Jou L, Mark P, et al. (1979) Surface composition and characteristics of oxide‐free Ga1–xAlxAs (110) Schottky barriers Journal of Vacuum Science and Technology. 16: 514-516 |
| Meyer RJ, Duke CB, Paton A, et al. (1979) Dynamical calculation of low-energy electron diffraction intensities from gaAs(110): Influence of boundary conditions, exchange potential, lattice vibrations, and multilayer reconstructions Physical Review B. 19: 5194-5205 |