Giacomo Badano, Ph.D.
Affiliations: | 2003 | University of Illinois at Chicago, Chicago, IL, United States |
Area:
Condensed Matter PhysicsGoogle:
"Giacomo Badano"Mean distance: (not calculated yet)
Parents
Sign in to add mentorSivalingam Sivananthan | grad student | 2003 | University of Illinois, Chicago | |
(Temperature-dependent adsorption of tellurium and mercury species on cadmium telluride studied by spectroscopic ellipsometry.) |
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Publications
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Boulard F, Marmonier F, Grangier C, et al. (2017) General review of multispectral cooled IR development at CEA-Leti, France Proceedings of Spie. 10177 |
Ballet P, Thomas C, Baudry X, et al. (2014) MBE growth of strained HgTe/CdTe topological insulator structures Journal of Electronic Materials. 43: 2955-2962 |
Fowler D, Boutami S, Duperron M, et al. (2013) Partially localized hybrid surface plasmon mode for thin-film semiconductor infrared photodetection. Optics Letters. 38: 254-6 |
Badano G, Robin IC, Amstatt B, et al. (2010) Reduction of the dislocation density in molecular beam epitaxial CdTe(2 1 1)B on Ge(2 1 1) Journal of Crystal Growth. 312: 1721-1725 |
Badano G, Gergaud P, Robin IC, et al. (2010) Lattice relaxation and dislocation reduction in MBE CdTe(211)B/Ge(211) Journal of Electronic Materials. 39: 908-911 |
Badano G, Baudry X, Robin IC. (2009) In situ spectroscopic ellipsometry of rough surfaces: Application to CdTe(211)B/Ge(211) grown by molecular-beam epitaxy Journal of Electronic Materials. 38: 1652-1660 |
Badano G, Baudry X, Ballet P, et al. (2008) Anisotropic surface roughness in molecular-beam epitaxy CdTe (211)B/Ge(211) Journal of Electronic Materials. 37: 1369-1375 |
Badano G, Million A, Canava B, et al. (2007) Fast detection of precipitates and oxides on CdZnTe surfaces by spectroscopic ellipsometry Journal of Electronic Materials. 36: -1084 |
Badano G, Ballet P, Zanatta JP, et al. (2006) Ellipsometry of rough CdTe(211)B-Ge(211) surfaces grown by molecular beam epitaxy Journal of the Optical Society of America B: Optical Physics. 23: 2089-2096 |
Badano G, Ballet P, Baudry X, et al. (2006) In situ real-time analysis of the MBE growth of CdTe on Ge: A comparison of ellipsometry data analysis techniques Journal of Crystal Growth. 296: 129-134 |