Jeffrey B. Fortin, Ph.D.
Affiliations: | 2001 | Rensselaer Polytechnic Institute, Troy, NY, United States | |
2014- | Pennsylvania State University, State College, PA, United States |
Area:
Materials Science Engineering, Polymer ChemistryWebsite:
https://www.research.psu.edu/node/146Google:
"Jeffrey Fortin"Mean distance: (not calculated yet)
Parents
Sign in to add mentorToh-Ming Lu | grad student | 2001 | RPI | |
(Poly -para -xylylene thin films: A study of the deposition chemistry, kinetics, film properties, and film stability.) |
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Publications
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Senkevich JJ, Wang B, Fortin JB, et al. (2003) Stability of fluorinated parylenes to oxygen reactive-ion etching under aluminum, aluminum oxide, and tantalum nitride overlayers Journal of Electronic Materials. 32: 925-931 |
Fortin JB, Lu TM. (2002) A model for the chemical vapor deposition of poly(para-xylylene) (parylene) thin films Chemistry of Materials. 14: 1945-1949 |
Li M, Fortin J, Kim JY, et al. (2001) Dielectric constant measurement of thin films using goniometric terahertz time-domain spectroscopy Ieee Journal of Selected Topics in Quantum Electronics. 7: 624-629 |
Fortin JB, Lu TM. (2001) Ultraviolet radiation induced degradation of poly-para-xylylene (parylene) thin films Thin Solid Films. 397: 223-228 |
Kumar A, Bakhru H, Fortin JB, et al. (2001) Thermal stability of xerogel films Thin Solid Films. 396: 5-8 |
Zhao YP, Fortin JB, Bonvallet G, et al. (2000) Kinetic roughening in polymer film growth by vapor deposition. Physical Review Letters. 85: 3229-32 |
Fortin JB, Lu TM. (2000) Mass spectrometry study during the vapor deposition of poly-para-xylylene thin films Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 18: 2459-2465 |