Ya Ou, Ph.D.
Affiliations: | 2009 | Rensselaer Polytechnic Institute, Troy, NY, United States |
Area:
Condensed Matter PhysicsGoogle:
"Ya Ou"Mean distance: (not calculated yet)
Parents
Sign in to add mentorToh-Ming Lu | grad student | 2009 | RPI | |
(Electrical stability study of metal/dielectric systems.) |
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Publications
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He M, Ou Y, Wang P, et al. (2010) Barrier Metal Ions Drift into Porous Low k Dielectrics under Bias-Temperature stress Mrs Proceedings. 1249 |
He M, Ou Y, Wang P, et al. (2010) Kinetics of Ta ions penetration into porous low-k dielectrics under bias-temperature stress Applied Physics Letters. 96: 222901 |
Gedelian CA, Ou Y, Li H, et al. (2010) Use of ultra-thin aluminum oxide layer to reduce photoluminescence decay in poly(p-phenylene vinylene) films Thin Solid Films. 518: 4367-4369 |
Ye D, Wang PI, Ye Z, et al. (2010) UV nanoimprint lithography of sub-100 nm nanostructures using a novel UV curable epoxy siloxane polymer Microelectronic Engineering. 87: 2411-2415 |
Ou Y, Wang P, He M, et al. (2008) Conduction Mechanisms of Ta/Porous SiCOH Films under Electrical Bias Journal of the Electrochemical Society. 155 |
Ou Y, Wang PI, Vanamurthy LH, et al. (2008) Thermal stability study of pore sealing using parylene N Journal of the Electrochemical Society. 155 |
Wang PI, Juneja JS, Ou Y, et al. (2008) Instability of metal barrier with porous methyl silsesquioxane films Journal of the Electrochemical Society. 155: H53-H58 |
Wang Z, Ou Y, Lu TM, et al. (2007) Wetting and electrowetting properties of carbon nanotube templated parylene films. The Journal of Physical Chemistry. B. 111: 4296-9 |
Lu T, Ou Y, Wang P-. (2007) Interface Stability of Metal Barrier and low K Dielectrics Mrs Proceedings. 990 |