Talal M. Al tahtamouni, Ph.D.

Affiliations: 
2007 Department of Physics Kansas State University, Manhattan, KS, United States 
Area:
Condensed Matter Physics, Materials Science Engineering
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"Talal Al tahtamouni"
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Hongxing Jiang grad student 2007 Kansas State University
 (MOCVD growth and characterization of aluminum-rich aluminum nitride/aluminum gallium nitride epilayers and quantum wells.)
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Publications

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Al Tahtamouni TM, Du X, Lin J, et al. (2015) Erbium-doped AlN epilayers synthesized by metal-organic chemical vapor deposition Optical Materials Express. 5: 648-654
Al Tahtamouni TM, Du X, Li J, et al. (2015) Erbium-doped a-plane GaN epilayers synthesized by metal-organic chemical vapor deposition Optical Materials Express. 5: 274-280
Al Tahtamouni TM, Lin JY, Jiang HX. (2013) Effects of double layer AlN buffer layers on properties of Si-doped Al xGa1-xN for improved performance of deep ultraviolet light emitting diodes Journal of Applied Physics. 113
Al Tahtamouni TM, Li J, Lin JY, et al. (2012) Surfactant effects of gallium on quality of AlN epilayers grown via metal-organic chemical-vapour deposition on SiC substrates Journal of Physics D: Applied Physics. 45
Al Tahtamouni TM, Lin JY, Jiang HX. (2012) High quality AlN grown on double layer AlN buffers on SiC substrate for deep ultraviolet photodetectors Applied Physics Letters. 101
Al Tahtamouni TM, Lin JY, Jiang HX. (2012) Optical polarization in c-plane Al-rich AlN/Al xGa 1-xN single quantum wells Applied Physics Letters. 101
Sedhain A, Nepal N, Nakarmi ML, et al. (2008) Photoluminescence properties of AlN homoepilayers with different orientations Applied Physics Letters. 93
Al Tahtamouni TM, Sedhain A, Lin JY, et al. (2008) Si-doped high Al-content AlGaN epilayers with improved quality and conductivity using indium as a surfactant Applied Physics Letters. 92
Dahal R, Li J, Fan ZY, et al. (2008) AlN MSM and Schottky photodetectors Physica Status Solidi (C) Current Topics in Solid State Physics. 5: 2148-2151
Pantha BN, Nepal N, Al Tahtamouni TM, et al. (2007) Correlation between biaxial stress and free exciton transition in AlN epilayers Applied Physics Letters. 91
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