Jon Orloff

University of Maryland, College Park, College Park, MD 
Molecular Physics, Physical Chemistry
"Jon Orloff"
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Orloff J. (2012) Gertrude Rempfer and the development of high resolution focused ion beam technology. Ultramicroscopy. 119: 5-8
Orloff J. (2010) Measuring the beam size of a focused ion beam (FIB) system Proceedings of Spie - the International Society For Optical Engineering. 7729
Hanssen JL, Hill SB, Orloff J, et al. (2008) Magneto-optical-trap-based, high brightness ion source for use as a nanoscale probe. Nano Letters. 8: 2844-50
Liu X, Orloff J. (2005) Analytical model of a gas phase field ionization source Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 23: 2816-2820
Guharay SK, Orloff J, Wada M. (2005) Ion beams and their applications in high-resolution probe formation Ieee Transactions On Plasma Science. 33: 1911-1930
Liu X, Orloff J. (2005) A study of optical properties of gas phase field ionization sources Advances in Imaging and Electron Physics. 138: 147-175
Hodzic V, Orloff J, Davis CC. (2004) Periodic structures on biconically tapered optical fibers using ion beam milling and boron implantation Journal of Lightwave Technology. 22: 1610-1614
Orloff J. (2004) Correction of Spherical Aberration in a Focused Ion Beam System by Means of Space Charge Microscopy and Microanalysis. 10: 26-27
Stanishevsky A, Edinger K, Orloff J, et al. (2003) Testing new chemistries for mask repair with focused ion beam gas assisted etching Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 21: 3067-3071
Hodzic V, Orloff J, Davis C. (2003) Focused ion beam created periodic structures on tapered optical fibers Journal of Vacuum Science & Technology B. 21: 2711-2714
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