Chanan Euaruksakul, Ph.D.

Affiliations: 
2009 University of Wisconsin, Madison, Madison, WI 
Area:
Electronics and Electrical Engineering
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Max G. Lagally grad student 2009 UW Madison
 (Strain-band structure relationship in strained silicon nanomembranes.)
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Publications

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Price R, Eralp-Erden T, Crumlin E, et al. (2016) The Partial Oxidation of Methane over Pd/Al2O3 Catalyst Nanoparticles Studied In-Situ by Near Ambient-Pressure X-ray Photoelectron Spectroscopy Topics in Catalysis. 59: 516-525
Wongpanya P, Wongpinij T, Photongkam P, et al. (2015) Effects of the thickness on the microstructure and corrosion behavior of a TiAlN film on 4140 steel Materialpruefung/Materials Testing. 57: 385-392
Wongpanya P, Tunmee S, Euaruksakul C, et al. (2014) Corrosion behaviors and mechanical properties of CrN film Advanced Materials Research. 853: 155-163
Euaruksakul C, Kelly MM, Yang B, et al. (2014) Heteroepitaxial growth on thin sheets and bulk material: Exploring differences in strain relaxation via low-energy electron microscopy Journal of Physics D: Applied Physics. 47
Kanjanachuchai S, Euaruksakul C. (2014) Directions and breakup of self-running in droplets on low-index InP surfaces Crystal Growth and Design. 14: 830-834
Kanjanachuchai S, Euaruksakul C. (2013) Self-running Ga droplets on GaAs (111)A and (111)B surfaces. Acs Applied Materials & Interfaces. 5: 7709-13
Euaruksakul C, Jearanaikoon N, Bussayaporn W, et al. (2013) Photoemission electron microscopy beamline at the Synchrotron Light Research Institute Journal of Physics: Conference Series. 425
Nakajima H, Tong-On A, Sumano N, et al. (2013) Photoemission spectroscopy and photoemission electron microscopy beamline at the Siam Photon Laboratory Journal of Physics: Conference Series. 425
Osaklung J, Euaruksakul C, Meevasana W, et al. (2012) Spatial variation of the number of graphene layers formed on the scratched 6H-SiC(0 0 0 1) surface Applied Surface Science. 258: 4672-4677
Chen F, Euaruksakul C, Liu Z, et al. (2011) Conduction band structure and electron mobility in uniaxially strained Si via externally applied strain in nanomembranes Journal of Physics D: Applied Physics. 44
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