Sarah P. Formica, Ph.D.

Affiliations: 
2006 State University of New York, Albany, Albany, NY, United States 
Area:
Optics Physics
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"Sarah Formica"
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Parents

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Susanne M. Lee grad student 2006 SUNY Albany
 (Development of x -ray instrumentation for characterizing metastable thin film semiconductors.)
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Publications

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Schmidt J, Formica SP, Lee SM. (2005) Polycapillary optic-enhanced x-ray diffraction and fluorescence for rapid materials analysis Proceedings of Spie - the International Society For Optical Engineering. 5918: 1-9
Formica SP, Lee SM. (2005) An in situ XRF system for composition mapping of thin film IR sensors Proceedings of Spie - the International Society For Optical Engineering. 5726: 1-9
Formica SP, Lee SM. (2005) X-ray fluorescence system for thin film composition analysis during deposition Thin Solid Films. 491: 71-77
Lee SM, Formica SP. (2005) Comparing X-ray optics: Performance standards Journal of X-Ray Science and Technology. 13: 37-47
Formica SP, Lee SM. (2002) Physical analysis of high intensity focusing X-ray optics: Doubly curved crystals vs. highly focusing polycapillaries Proceedings of Spie - the International Society For Optical Engineering. 4781: 77-86
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